DLA SMD-5962-88581 REV A-2006 MICROCIRCUIT LINEAR BIPOLAR HEX NTDS DRIVER MONOLITHIC SILICON《硅单片双极十六进制NTDS驱动器线性微电路》.pdf

《DLA SMD-5962-88581 REV A-2006 MICROCIRCUIT LINEAR BIPOLAR HEX NTDS DRIVER MONOLITHIC SILICON《硅单片双极十六进制NTDS驱动器线性微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88581 REV A-2006 MICROCIRCUIT LINEAR BIPOLAR HEX NTDS DRIVER MONOLITHIC SILICON《硅单片双极十六进制NTDS驱动器线性微电路》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - drw 06-12-05 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 P

2、MIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. H. Johnson COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, BIPOLAR HEX NTDS AND AGENCIES OF

3、 THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-02-21 DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-88581 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E053-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

4、MICROCIRCUIT DRAWING SIZE A 5962-88581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-3853

5、5, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88581 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device typ

6、e Generic number Circuit function 01 MOH0268D Hex NTDS driver 1/ 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N

7、20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range . V+ = +7 V: V- = -7 V (NTDS fast) V- = -16 V (NTDS) slow Input voltage range -0.5 V to +5.5 V Storage temperature range -65C to +150

8、C Power dissipation (PD) . 500 mW 2/ Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 Junction temperature (TJ) +175C Output current +15 mA 1.4 Recommended operating conditions. Supply voltage (V+). +4.5 V to +5.5 V (V-) -16.0 V to -13.5 V (s

9、low) (V-) -5.5 V to -4.5 V (fast) Ambient operating temperature range (TA) -55C to +125C Minimum high level input voltage (VIH). 2.4 V Maximum low level input voltage (VIL). 0.8 V _ 1/ This circuit was designed to be compatible with Naval Tactical Data Systems (NTDS) of MIL-STD-1397 “Standard Digita

10、l Navy Systems, Input-Output Interfaces”, interfacing between TTL logic levels and those employed in Navy computers. The applicable specifications are designed in this drawing. 2/ Derate above TA= +90C, 8.33 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

11、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks fo

12、rm a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENS

13、E STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are ava

14、ilable online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references

15、 cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, ap

16、pendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML

17、 product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or

18、 function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and phy

19、sical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless

20、otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

21、for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not fe

22、asible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be re

23、placed with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88581 DEFENSE SUPPLY CENTER COLUMBU

24、S COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C V+ = 4.5 V to 5.5 V Group A subgroups Device type Limits Unit V- = -16.0 V to -13.5 V (slow) V- = -5.5 V to -4.5 V (fast) Min Max Power sup

25、ply current ICC+ No load, no input 1, 2, 3 01 6.0 mA Power supply current ICC- No load, no input 1, 2, 3 01 -10.0 mA Low level output voltage (NTDS slow) VOLVIN= 0.8 V, IOL= 13.0 mA 1, 2, 3 01 -11.5 V Low level output voltage (NTDS fast) VOLVIN= 0.8 V, IOL= 3.5 mA 1, 2, 3 01 -3.0 V High level output

26、 voltage (NTDS slow) VOHVIN= 2.4 V, IOL= -13.5 mA 1, 2, 3 01 -1.5 V High level output voltage (NTDS fast) VOHVIN= 2.4 V, IOL= -4.0 mA 1, 2, 3 01 -0.5 V High level input current IIHVIH= 2.4 V 1, 2, 3 01 2.0 mA Low level input current IILVIL= 0.8 V 1, 2, 3 01 -0.5 mA Propagation delay time, low to hig

27、h (NTDS slow) tPLHSee figures 2 and 3 9, 10, 11 1/ 01 1.5 s Propagation delay time, high to low (NTDS slow) tPHLSee figures 2 and 3 9, 10, 11 1/ 01 1.5 s Propagation delay time, low to high (NTDS fast) tPLHSee figures 2 and 3 9, 10, 11 1/ 01 1.0 s Propagation delay time, high to low (NTDS fast) tPHL

28、See figures 2 and 3 9, 10, 11 1/ 01 0.75 s Off state output impedance ZOSee figure 4 1, 2, 3 1/ 01 100 k 1/ Guaranteed to the limits specified, if not tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8

29、8581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 Device type 01 Case outlines E and F 2 Terminal number Terminal symbol 1 NC NC 2 IN 1 NC 3 OUT 1 IN 1 4 IN 2 OUT 1 5 OUT 2 IN 2 6 IN 3 NC 7 OUT 3 OUT 2 8 GND IN 3 9 V- OUT 3 10 OUT 4 GND 11 I

30、N 4 NC 12 OUT 5 V- 13 IN 5 OUT 4 14 OUT 6 IN 4 15 IN 6 OUT 5 16 V+ NC 17 - - - IN 5 18 - - - OUT 6 19 - - - IN 6 20 - - - V+ FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-885

31、81 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 FIGURE 2. Test circuit. NOTES: 1. For NTDS slow, VT= -6.0 V For NTDS fast, VT= -1.5 V 2. Input is 100 KHz square wave From a TTL source. FIGURE 3. AC waveforms. Provided by IHSNot for ResaleNo

32、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 NOTE: A diode in series with the V- line is necessary to guarantee the NTDS high Z

33、Ospecification when both supplies are 0 V. FIGURE 4. ZOtest circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSC

34、C FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of sup

35、ply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this dr

36、awing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Of

37、fshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883,

38、and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be

39、 made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test p

40、arameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) In

41、terim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not test

42、ed, shall be guaranteed to the limits specified in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 22

43、34 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein.

44、 b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C. The test cir

45、cuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifie

46、d in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microc

47、ircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specific

48、ation or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of cha