DLA SMD-5962-88572 REV B-1991 MICROCIRCUIT DIGITAL NMOS INTERRUPT GENERATOR MONOLITHIC SILICON《硅单片沟道金属氧化物半导体中断发生器数字微电路》.pdf

《DLA SMD-5962-88572 REV B-1991 MICROCIRCUIT DIGITAL NMOS INTERRUPT GENERATOR MONOLITHIC SILICON《硅单片沟道金属氧化物半导体中断发生器数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88572 REV B-1991 MICROCIRCUIT DIGITAL NMOS INTERRUPT GENERATOR MONOLITHIC SILICON《硅单片沟道金属氧化物半导体中断发生器数字微电路》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、SND-5962-572 REV B 59 m 9999996 0007565 3 m I NOTICE OF REVISION (NOR) (See MIL-STD-480 for instructons) This revsion described below has been authorzed for the document 1 isted. DATE (YYMMDD) Form Approved OMB NO. 0704-0188 91/11/07 Defense Electronics Supply Center Dayton, Ohio 45444-5277 1, ORIGI

2、NATOR NAME AND ADDRESS 2. CAGE CODE 3. NOR NO, 1 67268 I 5962-88572 67268 4. CAGE CODE 7. REVISION LETTER 8. ECP NO. 6, TITLE OF DOCUMENT MICROCIRCUIT, DIGITAL, NMOS INTERRUPT GENERATOR, MONOLITHIC SILICON 5. DOCUMENT NO. 9, CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIES 10, DESCRIPTION OF REVI

3、SION Sheet 1: Revisions ltr column; add “8“ Revisions descriltion column; add “Changes in accordance with NOR 5962-R004-92 . Revlsions date column; add “91-11-07“. Sheet 4: Table I, Input clamp voltage, VIX, DELETE: Min limit of -1.2 V ADD: Max limit of -1.2 V *These changes were previously approved

4、 for Incorporation into the next action of drawng 5962-88572 on 28 Jan 1990. 11. THIS SECTION FOR GOVERNMENT USE ONLY bXISTING DOCUMENT SUPPLmENTED CHECK ONE c 1 REVISED DOCUMENT MUST BE cf CUSTODIAN OF MASTER DOCUMENT BY THIS NOR MAY BE USED IN RECEIVED BEFORE MANUFACTURER SHALL MAKE ABOVE REVISION

5、 AND CHANGE FOR GOVERNMENT OESC-ECC 91 / 11/ 07 -Prevous edtons diclribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 SCO e. This drawing describes device requirements for class B microcircuits in accordance riith l.

6、 e.g., 10s. DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET I DAMON, OHIO 45444 A 2 DESC FORM 19% SEP 87 t U. C. GOVERNMENT PRINTING OFFICE 18e9-745.033 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-2. APPLICABLE DOCUMENTS 2.1 Government spe

7、cification, standard, and bulletin. Unless otherwise specified, the following specification, standard, and bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified

8、herein. SPECIFICATION MIL ITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). (Copies of the specification, standard, and bulleti

9、n required by manufacturers in connection with. specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity. 1 references ci tedherein, the text of this drawing shall take precedence. 2.2 Order of recedence. In the event of a conflict be

10、tween the text of this drawing and the 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. dimensions shal 1 be as spec

11、itied In MIL-M-38Slu and nerein. 3.2 Design, construction, and hysical dimensions. The design, construction, and physical 1 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Block diagram. 3.2.3 Case outline. The case outline shall be in accordance with 1.

12、2.2 herein. 3.3 El ectrical performance characteristics. The block diagram shall be as specified on figure 2. Un1 ess otherwise specified, the electrical performance characteristics are as specified in table I and apply over the full case operating temperature range. 3.4 Electrical test requirements

13、. The electrical test requirements shal 1 be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Harking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall bi marked with the part number listed in 1.2 herein. also b

14、e marked as listed in MIL-BUL-103 (see 6.7 herein). In addition, the manufacturers part number may MIILiARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 rt U. S. GOVERNMENT PRINIINO OFFICE 1989-749-033 DESC FOIN 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking p

15、ermitted without license from IHS-,-,-n TABLE I. Electrical performance characteristics. See footnotes at end of table. SIZE A 5962-88572 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET b DAYTON, OHIO 45444 A 4 Test Supply vol tage Input low vol tage Input high v

16、oltage Input low current Input high current Maximum high input current Input cl amp vol tage Out ut low voltage dm7x Output low vol tage all other outputs Output high voltage (except open collector) Open collector leakage current lTKCK Short circuit output current - 2/ High-Z low output current BD1-

17、BD7 High-Z high Supply current output current BDl-BD7 Symbol vcc VIL VIH IIL IIH II vIK VOL VOL VOH IOH 10s 1 OZL IOZH 1 cc I I I Conditions I Group A I Limits I Unit -55C r O u a I I- O z II c Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-._II - _

18、 - _I- - -ID_- SMD-5962-88572 REV B 59 m 999999b 0007579 3 m C1 ock timing CLOCK I- - CKPD FIGURE 3. Timing waveforms - Continued. SIZE A 5962-88572 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 14 t U S GOVEHNhiENT PHIWTING OFFICE 1969-74.)

19、113 DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-5962-BB572 REV B 59 = 9999996 0007580 T 1 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 6 SIZE 5962-88572 A REVISION LEVEL SHEET 15 IA

20、CK IACKIN - DC AI -A3 BDI - BD7 BUFEN DTACK - IRQn TACKOUT -7 WI . II 7 ._c -JDOUT = THREE- STATE wd = NOT VALID = DONT CARE FIGURE 3. Timing waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3.6 Certificate of compliance, A cert

21、ificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7 herein). certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall affirm that the manufacturers product meets the re

22、quirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. The SIZE A STANDARDIZED 3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 5962-88572 3.8 Notifica

23、tion of change. Notification of change to DESC-ECC shall be required in accordance with MIL-STD-883 (see 3.1 herein). 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facil i ty and applicable required documentation, shall be ma

24、de available onshore at the option of the reviewer. Offshore documentation 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screening. Scre

25、ening shall be in accordance with method 5004 of MIL-STD-883, conducted on all devices prior to quality conformance inspection. The following add shall apply: and shall be tional criteria a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A using the circuit submitted with the certifica

26、te of compliance (see 3.6 herein). (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Qua

27、lity conformance inspection shall be in accordance with nethod 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005

28、 of MIL-STD-883 shall.be omitted. c. Subgroups 7 and 8 shall consist of verifying the functionality of the device. part of the vendors test tape and shall be maintained and available from the approved source of supply. It forms a ii U. S. GOVERNMENT PRINTING OFFICE 1889-749.033 DESC FORM 193A SEP 87

29、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-88572 REV B 59 m 9999996 0007582 3 m STANDARDIZED MILITARY DRAWING TABLE II. Electrical test requirements, SIZE A 5962-88572 I I I Subgroups I MIL-STD-883 test requirements I (per method I I 5

30、005, table I) I I Interim electrical parameters i (method 5004) Il I I Final electrical test parameters I 1*,2,3,7,8,9, I I I I Group A test requirements I 1,2,3,7,8,9, I I I I I 3roups C and D end-point I I (method 5004) (method 5005) electrical parameters I 1,2,3 I I I (method 5005) * PDA ap lies

31、to subgroup 1. Any supgroup at the same temperature may be combined using a mu1 tifunction tester. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state 1 ife test conditions, method 1005 of MIL-STD-883. (1) Test condition A us

32、ing the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125“C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with YIL-M-3%10.

33、6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function Ire not available for OEM application. When a military specification exists and the product covere

34、d )y this drawing has been qualified for listing on QPL-38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be the preferred item For all applications. :overed by a Contractor-prepared specification or drawing. 6.2 Replaceability. M

35、icrocircuits covered by this drawing will replace the same generic device I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I REVISION LEVEL I SHEET A 17 I I n 1 .AI t U S GOVERNMENT PRINTING OFFICE: 1W-749.033 DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking per

36、mitted without license from IHS-,-,- _- - .- - SMD-5962-B8572 REV 8 59 999999b 0007583 5 W I i. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. accordance with MIL-STD-481 using DD Form 1693, Engineer

37、ing Change Proposal (Short Form). Center when a system application requires configuration control and-the appl !cable SMD. DESC will naintain a record, of users and this list will be used for coordination and distribution of changes ta the drawings. DESC-ECC, telephone (513) 296-6022. This coordinat

38、ion will be accomplished in 6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Users of drawings covering microelectronics devices (FSC 5962) should contact 6.5 Comments. Comments on this drawing should be directed to DESC-ECC, Dayton, Ohio 45444, or teTephoKT

39、“T 296-5375. 6.6 Pin descriptions. Mnemonic kc Al-A3 - CSDC - DS - IACK Burns - IRQ1- m GND CLK IACKIN RS RESET LDl-LD7 BD1-BD7 Pin number 1 16,3,2 4 5 6 7 899 11-15 10,21 31 17 8 19 20 22-28 29,30 32-36 Type I I I I I O O z r I I I I /o O Name and function Supply voltage: +5 i! power supply. Addres

40、s lines: Address inputs from system bus. The internal level being acknowledged is encoded on these inputs. Al is LSB (least significant bit). Chip select: Active low chip select input for register I/O. This input must be qualified by the local masters data strobe prior to input. Data strobe: Active

41、low data strobe input from the system used to enable interrupt vector output. Interrupt acknowledge: Active low interrupt acknawledge input from the system bus. Buffer enable: Active low totem pole output to enable the data buffer required to drive the outputs of the bus data pins (BD1 - BD7). Inter

42、rupI: request: request output. Ground Active low totem pole system interrupt Clock: Clock input (typically CPU clock). Interrupt acknowledge in: daisy-chain input. Register select: Register select input. Active low input resets all internal registers, IACKOUT, and Local data: Three-state local data

43、bus. Bus data: Three-state data pins used for vector output. Active low hterrupt acknowledge TRgn. STAN DARDI ZED MILITARY DRAWING I Al I 5962-88572 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET I DAYTON, OHIO 45444 A I8 )ESC FORM 193A SEP 87 i, U. S. GOVERNMENT PRINTING OFFICE 1989-749-033

44、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-88572 REV B 59 9999996 0007584 7 i1 I Mnemonic Pin number Type Name and function rn 37 O Interrupt acknowledge out: Active low totem pole interrupt mAcR 38 O Data transfer acknowledge: Active

45、low totem pole output. acknowledge daisy-chain output. This signal indicates that valid data is available on the bus during interrupt acknowledge cycle. specifies the data transfer cycle in process is to be either read or write. lsmux 40 O Local data transfer acknowledge: Active low, open collector,

46、 data transfer acknowledge output to the local bus. 6.7 Approved sources of supply, Approved sources of supply are listed in MIL-BUL-103. R/GI 39 I Read/write: Register read/write input. This signal ,dditional sourees will be added to MIL-BUL-103 as they become available. The vendors listed in IIL-B

47、UL-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been ubmitted to and accepted by DESC-ECC. The approved sources of supply listed below are for nformation purposes only and are current only to the date of the last action of this document. I I I I I Military dra

48、wing I Vendor I Vendor I I part number I CAGE I similar part I I I number I number L/ I I I I I l I I I I 5962-8857201QX I 18324 I 681541RQX I I I I I - I/ Caution. Do not use this number for item mtion. may not satisfy the performance requirements of this drawing. Items acquired to this number Vend

49、or CAGE number 18324 Vendor name and address Si gnetics Corporati on 1275 S. 800 East Street Orem, UT 84058 Point of contact: 811 E. Arques Avenue Sunnyvale, CA 94088-3409 STANQARQIZED SIZE A 5962-88572 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET I DAYTON, OHIO 45444 A 19 h U. C GOVERNMENT PRINTING OFFICE 1889-