DLA SMD-5962-88542 REV E-2006 MICROCIRCUIT HYBRID LINEAR 12-BIT ANALOG TO DIGITAL CONVERTER《类比数位转换器12位混合微电路》.pdf

《DLA SMD-5962-88542 REV E-2006 MICROCIRCUIT HYBRID LINEAR 12-BIT ANALOG TO DIGITAL CONVERTER《类比数位转换器12位混合微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88542 REV E-2006 MICROCIRCUIT HYBRID LINEAR 12-BIT ANALOG TO DIGITAL CONVERTER《类比数位转换器12位混合微电路》.pdf（15页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added end-point limit to table I, SNR test. Update document to current requirements of MIL-H-38534. Editorial changes throughout. 93-01-25 K. A. Cottongim B Table I; deleted tests Aperture jitter (tAJ), Aperture delay (tAD), and track/hold acquis

2、ition tA (T/H). Table I; For the VOLtest changed IOL= 4.8 mA to 3.2 mA. For the VOLtest changed the max limit from 0.4 V to 0.5 V. 95-06-16 K. A. Cottongim C Table I; For the enable data input loading current (ILED) changed the min/max limits from -100/+100 A to -150/+150 A. 97-04-03 K. A. Cottongim

3、 D Figure 1; corrected the width of case outline Y. Changed from .120 inches maximum to 1.20 inches maximum. Redrew entire document. -sld 99-09-29 Raymond Monnin E Update drawing. 06-04-11 Raymond Monnin REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9

4、 10 11 12 13 14 PMIC N/A PREPARED BY Robert M. Heber DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Donald R. Osborne POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MIC

5、ROCIRCUIT, HYBRID, LINEAR, 12-BIT, ANALOG TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-05-31 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-88542 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E382-06 Provided by IHSNot for ResaleNo reproduction or network

6、ing permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to be pro

7、cessed in accordance with MIL-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 5962-88542 01 X X Drawing number Device type Case outline Lead finish (see 1.2

8、.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 ADC00300II A/D converter, track/hold, 12-bit 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows

9、: Outline letter Descriptive designator Terminals Package style X See figure 1 40 Dual-in-line Y See figure 1 40 Flat package 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC) . -0.3 V dc to +18 V dc Negati

10、ve supply voltage range (VEE) +0.3 V dc to -18 V dc Logic supply voltage range (VDD) . -0.3 V dc to +7.0 V dc Analog input voltage 20 V dc Logic input voltage range. -0.3 V dc to VDDPower dissipation (TC= +125C) . 4.5 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds)

11、 +300C Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC). 5.7C/W Thermal resistance, case-to-ambient (CA) 15C/W 1.4 Recommended operating conditions. Positive supply voltage range (VCC) . +14.25 V dc to +15.75 V dc Negative supply voltage range (VEE) -14.25 V dc to -15.75 V d

12、c Logic supply voltage range (VDD) . +4.75 V dc to +5.25 V dc Logic input voltage range. 0 V dc to +5.0 V dc Analog input voltage 10 V dc Case operating temperature range (TC). -55C to +125C 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation a

13、t the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSC

14、C FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solici

15、tation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE H

16、ANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, B

17、uilding 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific e

18、xemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Qua

19、lity Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modificatio

20、n in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(

21、s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figure 4

22、. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the

23、 subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN m

24、ay also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3.6 Data. In addition to the ge

25、neral performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary

26、of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance s

27、hall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of con

28、formance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (Q

29、M) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D.

30、The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance w

31、ith the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at th

32、e discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electri

33、cal performance characteristics. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Positive supply current ICC+14.25 V VCC +15.75 V 1, 2, 3 01 +100 mA Negative supply current IEE-14.25 V VEE -15.75 V 1, 2, 3 01 -120 mA Logic supply c

34、urrent IDD+4.5 V VDD +5.5 V 1, 2, 3 01 +250 mA 4 -.025 +.025 5 -.045 +.045 Linearity error LE Best straight line of readings +FS, +1/2 FS, 0, -1/2 FS, and -FS, (Max deviation) / (V range in) x 100 6 01 -.041 +.041 %FSR 4 -0.3 +0.3 5 -0.6 +0.6 Gain error AE (V+FS- V-FS) / (V range in) - 1 x 100 6 01

35、-0.52 +0.52 %FSR 4 -0.5 +0.5 5 -0.7 +0.7 Offset error OE (V for zero code reading) / (V range in) x 100 6 -0.66 +0.66 %FSR 4 -1 +1 Differential linearity error DLE 6 Vp-p 5%, 100 kHz 10% sine wave to 5 V range in 400 k point histogram corrected for the sine wave probability density function 5, 6 01

36、-3 +3 LSB Conversion rate fCEncode command rate 2 MHz 4, 5, 6 01 0 2 MHz 4 68 In - band harmonics IBH rms signal - rms harmonic, VIN= 4.8 Vp-p 2% at 97656 Hz 1000 ppm 5, 6 01 66 dB below FSR See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without l

37、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise spe

38、cified Group A subgroups Device type Min Max Unit Signal to noise ratio SNR rms signal - rms noise 4, 5, 6 01 65 dB End-point, TC= +25C, rms signal - rms noise 4 01 63.5 Input bandwidth, large signal LSBW VIN= 1 dB below full scale 2/ 4, 5, 6 01 10 MHz 4 +9.935 +10.065 5 +9.895 +10.105 Positive outp

39、ut reference voltage +VREF+IREF= +2 mA 6 01 +9.919 +10.081 V 4 -9.950 -10.050 5 -9.930 -10.070 Negative output reference voltage -VREF-IREF= -2 mA 6 01 -9.934 -10.066 V Encode command input pulse width tPW2/ 9, 10, 11 01 50 3/ ns Encode command input current IIN(EC)VIN= VDDor GND 1, 2, 3 01 -100 +10

40、0 A Output data invert input loading current ILODVIN= VDDor GND 1, 2, 3 01 -150 +150 A Enable data input loading current ILEDVIN= VDDor GND 1, 2, 3 01 -150 +150 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

41、 MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Dev

42、ice type Min Max Unit Logic “0“ output voltage (data ready and MUX enable outputs) VOLIOL= 3.2 mA 1, 2, 3 01 0.5 V Logic “1“ output voltage (data ready and MUX enable outputs) VOHIOH= -80 A 1, 2, 3 01 3.7 V IOZHVOZH= 2.4 V +50 Output high - impedance current (parallel data) IOZLVOZL= 0.7 V 1, 2, 3 0

43、1 -50 A 1/ All tests of table I shall be performed with tPWset at 50 ns minimum, trand tfat 10 to 90 percent set to 25 ns minimum, and an encode command rate of 2 MHz maximum. 2/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shal

44、l be guaranteed to the limits specified in table I for all lots not specifically tested. 3/ Maximum encode command pulse width = (1/fc) - 50. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPP

45、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Inches mm .002 0.05 .018 0.46 .100 2.54 .200 5.08 .250 6.35 .900 22.86 1.300 33.02 1.900 48.26 2.210 56.13 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general infor

46、mation only. 3. Unless otherwise specified, tolerance is .005 (0.13 mm). FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-39

47、90 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 Case outline Y. Inches mm .002 0.05 .010 0.25 .015 0.38 .07 1.8 .200 5.08 .400 10.16 1.20 30.5 1.900 48.26 2.21 56.10 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Unless otherwise specified, tol

48、erance is .005 (0.13 mm). FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88542 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 10 DSCC FORM 2234 APR 97 Device types All Device types All Case outlines X and Y Case outlines X and Y Terminal number Terminal symbol T