DLA SMD-5962-87780 REV A-2011 MICROCIRCUIT LINEAR INSTRUMENTATION AMPLIFIER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 11-01-20 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMI

2、C N/A PREPARED BY RICK C. OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT,

3、 LINEAR, INSTRUMENTATION AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 89-08-25 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-87780 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E077-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR

4、D MICROCIRCUIT DRAWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appe

5、ndix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87780 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type G

6、eneric number Circuit function 01 INA101 Instrumentation amplifier with gain sense 02 INA101 Instrumentation amplifier1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14

7、 Dual-in-line I MACY1-X10 10 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage (+V) +20 V dc Negative supply voltage (-V) . -20 V dc Internal power dissipation (PD) . 600 mW Input voltage range . V Output short

8、circuit duration Continuous to ground Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) : Case C . +125C/W Case I . +220C/W 1.4 Recommended operating condi

9、tions. Positive supply voltage range (+V) +11 V dc to +20 V dc Negative supply voltage range (-V) . -11 V dc to -20 V dc Ambient operating temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR

10、AWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent speci

11、fied herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standar

12、d Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/q

13、uicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this

14、 document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Produ

15、ct built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and q

16、ualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as

17、described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and h

18、erein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagrams. The block diagrams shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unle

19、ss otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tes

20、ts for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not

21、 feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3

22、990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Range of gain AVAV= 1 + ( 40 k / RG) 2/ 1,2,3 01,02 1 1000 V/V Gain equation error EA

23、VAV= 1, TA= +25C 4 01,02 0.05 %FS AV= 10, TA= +25C 0.10 AV= 100, TA= +25C 0.10 AV= 1000, TA= +25C 0.40 DC nonlinearity 3/ NL AV= 1, TA= +25C 4 01,02 0.005 % AV= 10, TA= +25C 0.005 AV= 100, TA= +25C 0.007 AV= 1000, TA= +25C 0.025 Gain temperature coefficient TCAVAV= 1 5,6 01,02 2 ppm / AV= 10 25 C AV

24、= 100 30 AV= 1000 50 Output voltage VOPRL= 2 k 4,5,6 01,02 10 V Output current IORL= 2 k 4,5,6 01,02 5 mA Input offset voltage 4/ VIOAV= 10, TA= +25C 1 01,02 75 V AV= 1000, TA= +25C 50 Input offset voltage temperature coefficient VIO/ AV= 10, TA= +125C 2 01,02 2.5 V / T AV= 1000, TA= +125C 1.75 C AV

25、= 10, TA= -55C 3 2.5 AV= 1000, TA= -55C 1.75 Input offset voltage supply coefficient PSRR AV= 10, +V = +5 V, -V = -5 V 1 01,02 35 V / AV= 1000, +V = +5 V, -V = -5 V 2 V AV= 10, +V = +5 V, -V = -5 V 2,3 40 AV= 1000, +V = +5 V, -V = -5 V 5 See footnotes at end of table. Provided by IHSNot for ResaleNo

26、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55

27、C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Initial input bias current IIB1,2,3 01,02 30 nA Initial input offset current IIO1,2,3 01,02 30 nA Input voltage linear response range VIN1,2,3 01,02 10 V Input voltage common mode rejection CMRR AV= 1, DC to 60 Hz

28、5/ 1,2,3 01,02 80 dB AV= 10, DC to 60 Hz 5/ 96 AV= 100 to 1000, 5/ DC to 60 Hz 106 Power supply rated voltage V 1,2,3 01,02 5 20 V Power supply quiescent current IQ1,2,3 01,02 8.5 mA Dynamic response slew rate SR AV= 1 to 100, R1= 2 k 4 01,02 0.2 V/s 5,6 0.1 Dynamic response settling time tSAV= 1, 1

29、0 V to 0.01% of final value 9,10,11 01,02 30 s AV= 100, 10 V to 0.01% of final value 50 AV= 1000, 10 V to 0.01% of final value 500 1/ Unless otherwise specified, V+ = +15 V, V- = -15 V, and RL= 2 k. 2/ Normally, the tolerance of RGwill be the major source of gain error. 3/ -Input = 0 V, +input is va

30、ried to enable nonlinearity error to be measured between -10 V output +10 V and determining worst case deviation from straight line connecting these end points at each gain settling. 4/ Adjustable to zero at any one gain. 5/ 1 k source imbalance applies only to TA= +25C. Provided by IHSNot for Resal

31、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device type 01 02 Case outline C I Terminal number Terminal symbol 1 OUTPUT GAIN SET 1

32、2 V+ OFFSET ADJ 3 -INPUT OFFSET ADJ 4 GAIN SENSE 1 GAIN SET 2 5 GAIN SET 1 +INPUT 6 OFFSET ADJ V- 7 OFFSET ADJ COMMON 8 A1 OUTPUT OUTPUT 9 A2 OUTPUT V+ 10 GAIN SET 2 -INPUT 11 GAIN SENSE 2 - 12 +INPUT - 13 V- - 14 COMMON - FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction

33、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without li

34、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-3853

35、5, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed a

36、s an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements

37、herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change t

38、hat affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option o

39、f the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance i

40、nspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity u

41、pon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, exce

42、pt interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional c

43、riteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW

44、ING SIZE A 5962-87780 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Fi

45、nal electrical test parameters (method 5004) 1*, 2, 3, 4 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. * Subgroups 10 and 11 shall be guaranteed if not tested. 4.3.2 Groups C and D ins

46、pections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made

47、available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as pe

48、rmitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specific