DLA SMD-5962-87522 REV D-2011 MICROCIRCUIT LINEAR DUAL LINE RECEIVER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R111-92. 92-01-15 M. A. Frye B Incorporate rev. A NOR. Drawing updated to reflect current requirements. Editorial changes throughout. drw 00-12-06 Raymond Monnin C Redraw. Update drawing to current requirements

2、. - drw 11-02-14 Charles F. Saffle D Add case outline X. Make changes to 1.2.2, 1.3, and figure 1. -rrp 11-07-25 Charles F. Saffle CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7

3、8 9 10 PMIC N/A PREPARED BY Charles D. Phillips DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY N. A. Ha

4、uck MICROCIRCUIT, LINEAR, DUAL LINE RECEIVER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-05-04 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 14933 5962-87522 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E335-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

5、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-3

6、8535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87522 01 C A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identifies the circuit function as follows: Devi

7、ce type Generic number Circuit function 01 9622 Dual line receiver 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style A GDFP5-F14 or CDFP6-F14 14 Flat pack C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1

8、-N20 20 Square leadless chip carrier X CDFP3-F14 14 Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage range -0.5 V dc to +7.0 V dc Negative supply voltage range -0.5 V dc to -12 V dc Input voltage range 15

9、 V dc Voltage applied to outputs for high state -0.5 V dc to +13.2 V dc Enable voltage range . -0.5 V dc to +15 V dc Internal power dissipation (PD): 1/ Cases A and X 350 mW Cases C and 2 . 400 mW Storage temperature range -65C to +175C Lead temperature (soldering, 60 seconds) 300C Thermal resistanc

10、e, junction-to-case (JC): Cases A, C, and X . See MIL-STD-1835 Case 2 60C/W Junction temperature (TJ) 175C 1.4 Recommended operating conditions. Positive supply voltage (+VCC) . +5.0 V dc Negative supply voltage (-VCC) -10 V dc Ambient operating temperature range (TA) -55C to +125C _ 1/ Rating appli

11、es to ambient temperature up to 125C. Above 125C ambient, derate linearly at 140C/W for cases A and X, and 120C/W for case C and 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME

12、COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the i

13、ssues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Stan

14、dard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Docume

15、nt Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws

16、 and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a

17、 Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with

18、 MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification

19、 mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines

20、shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Switching times test circuit and waveforms. The switching times test circuit and waveforms shall be as specified on figure 2. 3.3 Electrical performance characteris

21、tics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The elec

22、trical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TA

23、BLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage low VOLV+ = S3 = 4.5 V, V- = -11 V, VDIFF= 2.0 V, IOL= 12.4 mA, EN = open 2/ 1, 2, 3 All 0.4 V Output voltage high VOHV+

24、= 4.5 V, V- = -9.0 V, S3 = 0 V, VDIFF= 1.0 V, IOH= -0.2 mA, EN = open 2/ 1 All 3.0 V 2 2.9 3 2.8 Output leakage current ICEXV+ = 4.5 V, V- = -11 V, S3 = 0 V, VDIFF= 1.0 V, VO= -12 V, EN = open 1 All 100 A 2 200 3 50 Output short circuit current IOSV+ = 5.0 V, V- = -10 V, VDIFF= 1.0 V, VO= S3 = 0 V,

25、EN = open 1 All -3.1 -1.4 mA 2, 3 -3.1 -1.3 Enable input leakage current IR(EN) V+ = S3 = 4.5 V, V- = -11 V, IN= open, EN = 4.0 V 1 All 2.0 A 2 5.0 Enable input forward current IF(EN) V+ = 5.5 V, V- = -9.0 V, VI= open, EN = S3 = 0 V 1, 2, 3 All -1.5 mA +Input forward current IF(+IN) V+ = 5.0 V, V- =

26、 -10 V, VI+ = 0 V, VI- = GND, EN = S3 = open 1/ 1 All -2.1 mA 2 -2.0 3 -2.3 -Input forward current IF(-IN) V+ = S3 = 5.0 V, V- = -10 V, VI+ = GND, VI- = 0 V, EN = open 1/ 1 All -2.4 mA 2 -2.3 3 -2.6 Input voltage low VIL(EN) V+ = 5.0 V, V- = -10 V, S3 = 0 V 1/ 1 All 1.0 V 2 0.7 3 1.3 See footnotes a

27、t end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteris

28、tics - continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Differential input threshold voltage VTH4.5 V V+ 5.5 V, -11 V V- -9.0 V, EN = open 1, 2, 3 All 0.7 2.0 V Common mode voltage VCM V+ = 5.0 V, V- = -10 V, 1.0 V VDIFF

29、2.0 V, TA= 25C 1 All -10 +10 V Terminating resistance RTV+ = 5.5 V, V- = -11 V, TA= 25C 1 All 91 215 Positive supply current I+ V+ = S3 = VI+ = 5.5 V, TA= 25C 1/ 1 All 22.9 mA Negative supply current I- V- = 11 V, VI- = 0 V, TA= 25C 1 All -11.1 mA Propagation delay to high level tPLHV+ = 5.0 V, V- =

30、 -10 V, 0 V VI 3.0 V, CL= 30 pF, TA= 25C, see figure 2 RL= 3.9k 9 All 50 ns Propagation delay to low level tPHLRL= 390k 9 All 50 ns 1/ Reference: S3 see equivalent circuit figure 3. 2/ This device allows the choice of output states with the input open, without affecting circuit performance by use of

31、 S3. - When S3 is connected to V-, open inputs cause output to be high. - When V+ = 5.0 V, V- = -10 V and S3 is connected to ground, open inputs cause output to be low 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 here

32、in. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall

33、 be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of com

34、pliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meet

35、s the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of c

36、hange to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. O

37、ffshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEE

38、T 6 DSCC FORM 2234 APR 97 Device type All Case outline A, C, X 2 Terminal number Terminal symbol 1 S3 NC 2 OUT A S3 3 EN A OUT A 4 +IN A EN A 5 RA NC 6 -IN A +IN A 7 V+ NC 8 V- RA 9 -IN B -IN A 10 RB V+ 11 +IN B NC 12 EN B V- 13 OUT B -IN B 14 GND RB 15 - - - NC 16 - - - +IN B 17 - - - NC 18 - - - E

39、N B 19 - - - OUT B 20 - - - GND FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 AP

40、R 97 FIGURE 2. Switching times test circuit and waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97

41、FIGURE 3. Equivalent circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling

42、and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria

43、shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify t

44、he inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior t

45、o burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3 G

46、roup A test requirements (method 5005) 1, 2, 3, 9 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D insp

47、ections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 10 and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted wit

48、hout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87522 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The