DLA SMD-5962-84053 REV B-1989 MICROCIRCUITS DIGITAL N-CHANNEL SIGNAL PROCESSOR MONOLITHIC SILICON《硅单片 信号处理器N沟道数字微型电路》.pdf
《DLA SMD-5962-84053 REV B-1989 MICROCIRCUITS DIGITAL N-CHANNEL SIGNAL PROCESSOR MONOLITHIC SILICON《硅单片 信号处理器N沟道数字微型电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-84053 REV B-1989 MICROCIRCUITS DIGITAL N-CHANNEL SIGNAL PROCESSOR MONOLITHIC SILICON《硅单片 信号处理器N沟道数字微型电路》.pdf(22页珍藏版)》请在麦多课文档分享上搜索。
1、9979996 0122341 430 m B - LTR A - Convert to standardized military drawing format. Add source of supply, CAGE code 60991. Upgrade operating temperature range, alter electrical test requirements. Add switching test waveforms. Editorial changes throughout. REVISIONS DESCRIPTION Add LCC package (outlin
2、e letter Z). DATE (ni-MO-DA 85 OCT 17 89 JUN O9 APPROVED DEFENSE ELECTRONICS SUPPLY CENTER STANDARDIZED 6 SEPTEMBER 1984 DEPAFiTMENT OF DEFENSE REVISION LEVEL AMSC NIA B SHEET 1 OF 22 DESC FORM 193-1 t V.S. GOVERNMENT PIIINTING OFFICI: 1987 - 748.12916Opl SEP a7 5962-El067 DISTRIBUTION STATEMENT A.
3、Approved for public release; dlslrlbullon is unllmiied. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9999996 OL223Y2 377 M STANDARD12 Eb MILITARY DRAWING DEFENSE ELE-ICS SUPPLY CEMER MYlON,oHKl45444 1. SCOPE 1.1 SGO e. This drawing describes devic
4、e requirements for class B mlcrocikuits ih accordance with l.; AB=PC=O AB= PC+ I 11 NOTES : 1. RS forces DEN, E, and MEN high and three-states data bus DO through 015. AB outputs (and program counter) are synchronously cleared to zero after the next complete CLK cycle from +K. 2. R3 must be maintain
5、ed active low for a minimum of five clock cycles to be recognized. 3. ReSUmDtiOn of normal program will connnence after one complete CLK cycle for 4E. - 4. 5. Due to the synchronizing action on K, time to execute the function can vary dependent upon when +R3 or +R3 occur in the CLKxcle. Diagram show
6、n is for definition purpose only. DEN, E, and MEN are mutually excl usive. 6. Timing measurements are referenced to and from a low voltage of 0.8 volt and a high voltage of 2.0 volts, unless otherwise noted. 7. During a write cycle, may produce an invalid write address. FIGURE 3. AC loading circuits
7、 and switching waveforms - Continued. SIZE 84053 STANDARDIZED MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER MWN, OHIO 45444 REVISION LEVU t U S GOVERNMENT PRINTING OFFICE 1888-55C-547 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
8、om IHS-,-,-9999996 O322360 392 STANDARDIZED MILITARY DRAWING 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method ?il05 of MIL-STD-883 including groups A, B, C, and O inspections. The following additional criterid shall apply. 4.3.1 Group A inspection
9、. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STb-883 shall be omitted. c. Subgroup 4 (CIN/C(JUT/CI/O/C/C measurements) shall be measured only for the initial test and after process or design changes Which may affect capacitance. A minimum o
10、f 5 devices shall be required with zero rejects. d. Subgroups 7 and 8 shall verify the instruction set. The instruction set forms a part of the vendors test tape and shall be maintained and available fro3 the approved sources of supply. 4.3.2 Groups C and D inspections. a. End-point electrical param
11、eters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A or 0 using the circuit subniitted with the certificate of compliance (see 3.5 herei n) . (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted
12、 by method 1005 of MIL-STO-883. TABLE II. Electrical test requirements. I I I I MIL-STD-883 test requivements I Subgroups 1 I I (per method I I I 5005, table I) I SIZE A 84053 I I l (method 5004) I I 1 I IFinal electrical test parameters I 1*,2,3,7*,8 I I (method 5004) I 9,10,11 I I I Group A test r
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