DLA SMD-5962-81021 REV E-2005 MICROCIRCUIT DIGITAL LOW POWER SCHOTTKY TTL VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《硅单片电控振荡器 肖脱基小功率TTL数字微型电路》.pdf

《DLA SMD-5962-81021 REV E-2005 MICROCIRCUIT DIGITAL LOW POWER SCHOTTKY TTL VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《硅单片电控振荡器 肖脱基小功率TTL数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-81021 REV E-2005 MICROCIRCUIT DIGITAL LOW POWER SCHOTTKY TTL VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《硅单片电控振荡器 肖脱基小功率TTL数字微型电路》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED B Page 1, paragraph 1.3; minimum ratings given to supply and input voltage ranges. Table I: Change VOHconditions and add footnote to table I. Change drawing CAGE number to 67268. Change to military drawing format. 88-01-26 M. A. Frye C Changes in a

2、ccordance with NOR 5962-R182-92. -tvn 92-04-29 Monica L. Poelking D Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 02-09-30 Raymond Monnin E Update to reflect latest changes in format and requirements. Correct paragraph in 3.5. Editorial changes throu

3、ghout. les 05-04-05 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Christopher A. Rauch DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DR

4、AWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, VOLTAGE CONTROLLED AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 81-06-02

5、OSCILLATOR, MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 14933 81021 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E232-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COL

6、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complet

7、e PIN is as shown in the following example: 81021 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 54LS629 Dual voltage controlled os

8、cillator 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead

9、 finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range: Enable input . -1.5 V dc to +7.0 V dc Frequency control or range input . VCCStorage temperature range -65C to +150C Maximum power dissipation (PD) 1/ 303 m

10、W Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) 2/ . 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) 2.0 V dc M

11、aximum low level input voltage (VIL) . 0.7 V dc Input voltage at frequency control or range input, (V1(freq)or V1(rng)3/ 0.0 V dc minimum to 5.0 V dc maximum Output frequency (fO) 1 Hz to 20 MHz Case operating temperature range (TC) . -55C to +125C _ 1/ Maximum power dissipation is defined as VCCx I

12、CC, and must withstand the added PDdue to short-circuit test; e.g., IOS. 2/ Symbol VCC, is used for the voltage applied to both the VCCand VCCterminals unless otherwise noted. 3/ Voltage values are with respect to the appropriate ground terminal.Provided by IHSNot for ResaleNo reproduction or networ

13、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification,

14、standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specificatio

15、n for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies

16、 of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this

17、 drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accord

18、ance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38

19、535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications sha

20、ll not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The de

21、sign, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The

22、truth tables shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagrams shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the fu

23、ll case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part

24、shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3

25、990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accorda

26、nce with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSC

27、C-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided w

28、ith each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers

29、facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COL

30、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOH VCC= 4.5 V, IOH= -1.2 mA V

31、IH= 2.0 V, VIL= 0.7 1, 2, 3 All 2.5 V Low level output voltage VOL VCC= 4.5 V, IOL= 12 mA VIH= 2.0 V, VIL= 0.7 V 1, 2, 3 All 0.4 V Input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA, TC= +25C 1 All -1.5 V High level input current IIH1 VCC= 5.5 V, VIH= 2.7 V 1, 2, 3 All 40 A IIH2 VCC= 5.5 V, VIH= 7.0 V

32、All 200 A Low level input current IIL VCC= 5.5 V, VIL= 0.4 V 1, 2, 3 All -0.8 mA Short circuit output current IOS VCC= 5.5 V, VOUT= GND 1/ 1, 2, 3 All -40 -225 mA Supply current ICC VCC= 5.5 V, Enable = 4.5 V 1, 2, 3 All 55 mA Functional tests See 4.3.1c 7 9 15 25 fo V1(freq)= 5 V, V1(rng)= 0 V 10,

33、11 All 10 30 MHz 9 1.1 2.1 Output frequency 2/ 3/ VCC= 5.0 V, RL= 667 5%, CL= 45 pF 10%, Cext= 50 pF V1(freq)= 1 V, V1(rng)= 5 V 10, 11 All 0.8 2.5 MHz 1/ Not more than one output should be shorted at a time, and the duration of the short circuit condition should not exceede one second. 2/ Frequency

34、 testing may be performed using either CL= 45 pF or CL= 50 pF. However, the manufacturer must certify and guarantee that the microcircuits meet the switching test limits specified for a 50 pF load. 3/ Sample testing of output frequency may be performed. Provided by IHSNot for ResaleNo reproduction o

35、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 Device type 01 01 Case outlines E, F 2 Terminal number Terminal symbols Terminal symbols 1 2FC NC 2 1

36、FC 2FC 3 1RNG 1F4 1CX1 1RNG 5 1CX2 1CX1 6 1 EN NC 7 1Y 1CX2 8 OSC GND 1 EN 9 GND 1Y 10 2Y OSC GND 11 2 EN NC 12 2CX2 GND 13 2CX1 2Y 14 2RNG 2 EN 15 OSC VCC2CX2 16 VCCNC 17 - - - 2CX1 18 - - - 2RNG 19 - - - OSC VCC20 - - - VCCFIGURE 1. Terminal connections. Enable Y L Enabled H H Caution: Crosstalk m

37、ay occur in this device if both VCOs are operated simultaneously. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE

38、L E SHEET 7 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR

39、 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. T

40、he following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request.

41、 The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim e

42、lectrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical tes

43、t parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Q

44、uality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4

45、, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 7 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 81021 DEFENSE SUPPLY CENTER COLUM

46、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test cir

47、cuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifie

48、d in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contract