DLA SMD-5962-80041 REV E-2005 MICROCIRCUITS LINEAR LINE DRIVERS AND RECEIVERS MONOLITHIC SILICON《硅单片线驱动器及接收器 线性微型电路》.pdf
《DLA SMD-5962-80041 REV E-2005 MICROCIRCUITS LINEAR LINE DRIVERS AND RECEIVERS MONOLITHIC SILICON《硅单片线驱动器及接收器 线性微型电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-80041 REV E-2005 MICROCIRCUITS LINEAR LINE DRIVERS AND RECEIVERS MONOLITHIC SILICON《硅单片线驱动器及接收器 线性微型电路》.pdf(10页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Pg. 4, TABLE I. Change IIH2, IOS, and IO1e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80041 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3
2、990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documen
3、ts are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Compon
4、ent Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization
5、Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicabl
6、e laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produce
7、d by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordanc
8、e with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certifi
9、cation mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case out
10、lines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical
11、performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I.
12、 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built
13、 in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
14、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80041 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Li
15、mits Unit Min Max High level output voltage VOHVCC= 4.5 V, VIL= 0.8 V, IOH= -2 mA 1, 2, 3 All 2.4 V VIH = 2.0 V IOH= -40 mA 1.8 Input clamp voltage VICVCC= 4.5 V, IIC= -12 mA, TA= +25C 1 All -1.5 V Low level output voltage VOLVCC= 4.5 V, VIL= 0.8 V, VIH= 2.0 V, IOL= 40 mA 1, 2, 3 All 0.5 V Output cl
16、amp voltage VICVCC= 4.5 V, IIC= -12 mA, TA= +25C 1 01 -1.5 V Low level input current IILVCC= 5.5 V, VIN= 0.4 V 1, 2, 3 All -1.6 mA High level input current IIH1VCC= 5.5 V, VIH= 2.4 V 1, 2, 3 All 40 A VCC= 5.5 V, VIH= 5.5 V 1.0 mA Output short circuit current IOSVCC= 5.5 V, TA= +125C 1/ 2 All -40 -15
17、0 mA Supply current ICCVCC= 5.5 V 1, 2, 3 All 90 mA Inhibited-state output leakage current IO1VCC= 5.5 V, VOUT= 0.4 V TA= +25C 1 All -40 A IO2VCC= 5.5 V, VOUT= 2.4 V TA= +25C +40 Propagation delay time, (low to high) tPLHVCC= 5.0 V, 2/, 3/ CL= 50 pF 9, 10, 11 All 2 42 ns Propagation delay time, (hig
18、h to low) tPHLVCC= 5.0 V, 2/, 3/ CL= 50 pF 9, 10, 11 All 2 42 ns Propagation delay time, (disable to high) tPZHVCC= 5.0 V, 2/ CL= 50 pF 9, 10, 11 All 2 38 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
19、OCIRCUIT DRAWING SIZE A 80041 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit
20、 Min Max Propagation delay time, (high to disable) tPHZVCC= 5.0 V, CL= 5 pF 2/, 4/ 9, 10, 11 All 2 21 ns Propagation delay time, (disable to low) tPZLVCC= 5.0 V, CL= 50 pF 2/ 9, 10, 11 All 2 47 ns Propagation delay time, (low to disable) tPLZVCC= 5.0 V, CL= 5 pF 2/, 4/ 9, 10, 11 All 2 38 ns Function
21、al testing See 4.3.1c 7 All 1/ Not more than one output should be shorted at a time. 2/ For subgroups 10 and 11 these limits shall be guaranteed, if not tested. 3/ For differential and single ended mode control. 4/ Testing can be done at 15 pF. 3.6 Certificate of compliance. A certificate of complia
22、nce shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of
23、MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall
24、 be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
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