DLA SMD-5962-80023 REV C-2005 MICROCIRCUIT DIGITAL TTL SCHOTTKY MULTIPLEXERS MONOLITHIC SILICON《硅单片三态输出的多路复用器 肖脱基小功率TTL数字微型电路》.pdf

《DLA SMD-5962-80023 REV C-2005 MICROCIRCUIT DIGITAL TTL SCHOTTKY MULTIPLEXERS MONOLITHIC SILICON《硅单片三态输出的多路复用器 肖脱基小功率TTL数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-80023 REV C-2005 MICROCIRCUIT DIGITAL TTL SCHOTTKY MULTIPLEXERS MONOLITHIC SILICON《硅单片三态输出的多路复用器 肖脱基小功率TTL数字微型电路》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete min limits from IILand propagation delays. Change IOFFtest conditions. Editorial changes throughout. 86-04-01 N. A. Hauck B Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 02-09-30 Raymond Mo

2、nnin C Update to reflect latest changes in format and requirements. Correction to marking paragraph 3.5. Editorial changes throughout. les 05-03-30 Raymond Monnin CURRENT CAGE CODE 67268 THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C OF

3、SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Joan M Fisher DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY C. R. Johnson COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL,

4、 TTL, SCHOTTKY, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 81-01-12 MULTIPLEXERS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 14933 80023 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E230-05 Provided by IHSNot for ResaleNo reproduction or networking permitted withou

5、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in a

6、ccordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 80023 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device types. The device types identify the circuit function

7、as follows: Device type Generic number Circuit function 01 54S258 Quad 2-input, data selector/multiplexer with three-state inverted outputs 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T

8、16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range . -1.2 V dc at -18 mA to 5.5 V dc Storage temperature range -65C

9、 to +150C Maximum power dissipation (PD) 1/ 479 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): Cases E and F . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc minimum to 5.5 V

10、 dc maximum Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Case operating temperature range (TC) -55C to +125C _ 1/ Maximum power dissipation is defined as VCCX ICC, and must withstand the added PDdue to short circuit test e.g., IOS. Provided by IHSN

11、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and ha

12、ndbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuit

13、s, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - S

14、tandard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event

15、 of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individu

16、al item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted t

17、ransitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requi

18、rements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, constr

19、uction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specifie

20、d on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3

21、.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in

22、 1.2 herein. In addition, the manufacturers PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM

23、 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify whe

24、n the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved s

25、ource of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivere

26、d to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required docum

27、entation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISI

28、ON LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, IOH= -1 mA VIN= 0.8 V or 2.0 V 1, 2, 3 All 2.4 V Low

29、level output voltage VOL VCC= 4.5 V, IOL= 20 mA VIN= 0.8 V or 2.0 V 1, 2, 3 All 0.5 V Input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA, TC= +25C 1 All -1.2 V High level input current IIH1 VCC= 5.5 V, Select input 1, 2, 3 All 100 A IN= 2.7 V Any other input 1, 2, 3 All 50 A IIH2 VCC= 5.5 V, VIN= 5.5 V

30、 1, 2, 3 All 1.0 mA Low level input current IIL VCC= 5.5 V, Select input 1, 2, 3 All -4.0 mA IN= 0.5 V Any other input 1, 2, 3 All -2.0 A Short circuit output current 1/ IOSVCC= 5.5 V 1, 2, 3 All -40 -100 mA Supply current, outputs OPEN ICCO VCC= 5.5 V 1, 2, 3 All 87 mA Off-state output current IOFF

31、1 VCC= 5.5 V VOUT= 2.4 V 1, 2, 3 All 50 A IOFF2 VCC= 5.5 V VOUT= 0.5 V 1, 2, 3 All -50 A Low-level supply current ICCL VCC= 5.5 V 1, 2, 3 All 81 mA High-level supply current ICCH VCC= 5.5 V 1, 2, 3 All 56 mA Functional tests See 4.3.1c 7 All tPLH19, 10, 11 All 18.5 ns Propagation delay time, from se

32、lect to Y tPHL1 VCC= 5.0 V, CL= 50 pF 10%, RL= 280 5% 9, 10, 11 All 18.5 ns tPLH29, 10, 11 All 10 ns Propagation delay time, from data to Y tPHL2 9, 10, 11 All 10 ns tPZH9, 10, 11 All 28 ns Output enable time, from output control to Y tPZL 9, 10, 11 All 30 ns See footnotes at end of table. Provided

33、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test

34、Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroupsDevice type Limits Unit Min MaxtPHZ 9, 10, 11 All 24 ns Output disable time, from output control to Y tPLZ VCC= 5.0 V, CL= 50 pF 10%, RL= 280 5% 9, 10, 11 All 22 ns 1/ Not more than one output should be shorted at a time

35、and the duration of the short circuit condition should not exceed one second. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7

36、 DSCC FORM 2234 APR 97 Device type 01 Case outlines E, F Terminal number Terminal symbols 1 SELECT2 (Input) 1A 3 (Input) 1B 4 (Output) 1Y 5 (Input) 2A 6 (Input) 2B 7 (Output) 2Y 8 GND 9 (Output) 3Y 10 (Input) 3B 11 (Input) 3A 12 (Output) 4Y 13 (Input) 4B 14 (Input) 4A 15 OUTPUT CONTROL 16 VCCPOSITIV

37、E LOGIC: SEE TRUTH TABLE FIGURE 1. Terminal connections. INPUTS OUTPUT OUTPUT CONTROL SELECT A B Y H X X X Z L L L H H X L L H X L H H L H = High Level L = Low level X = Irelevant Z = High impedance (off) FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted wit

38、hout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appe

39、ndix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The te

40、st circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent sp

41、ecified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requiremen

42、ts. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 9 Group C end-point electrical parameter

43、s (method 5005) 1, 2, 3, 10*, 11* Group D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in ac

44、cordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Su

45、bgroup 7 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80023 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97

46、 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level c

47、ontrol and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration:

48、1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of S