DLA SMD-5962-80022 REV E-2005 MICROCIRCUIT DIGITAL TTL SCHOTTKY DATA SELECTORS MULTIPLEXERS WITH THREE-STATE OUTPUT MONOLITHIC SILICON《硅单片三态输出的数据选择器 多路复用器 肖脱基小功率TTL数字微型电路》.pdf

《DLA SMD-5962-80022 REV E-2005 MICROCIRCUIT DIGITAL TTL SCHOTTKY DATA SELECTORS MULTIPLEXERS WITH THREE-STATE OUTPUT MONOLITHIC SILICON《硅单片三态输出的数据选择器 多路复用器 肖脱基小功率TTL数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-80022 REV E-2005 MICROCIRCUIT DIGITAL TTL SCHOTTKY DATA SELECTORS MULTIPLEXERS WITH THREE-STATE OUTPUT MONOLITHIC SILICON《硅单片三态输出的数据选择器 多路复用器 肖脱基小功率TTL数字微型电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED B Change VIL, generic notation and VINin table I. Add logic diagram. Change to military drawing format. 87-05-13 N. A. Hauck C Change drawing CAGE number to 67268. Change input voltage range. Change tPLHin table I. Change note 2/ to table I. Change

2、 IOSmax. rating. 87-11-06 R. P. Evans D Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 02-09-30 Raymond Monnin E Update to reflect latest changes in format and requirements. Correction to marking paragraph 3.5. Editorial changes throughout. les 05-03-

3、28 Raymond Monnin CURRENT CAGE CODE 67268 THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Joe A. Kerby DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D.

4、A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL, TTL, SCHOTTKY, DATA SELECTORS/MULTIPLEXERS WITH AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 81-01-12 THREE-STATE OUTPUT,

5、 MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 14933 80022 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E229-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLU

6、MBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is a

7、s shown in the following example: 80022 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 54S251 8-input, data selector/multiplexer

8、with three-state outputs 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead fini

9、sh. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range . -1.2 V dc at -18 mA to 5.5 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) 1/ 468 mW Lead temperature (soldering,

10、10 seconds) . +300C Thermal resistance, junction-to-case (JC): Cases E, F, and 2 See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) . 2.0 V dc Maximum low leve

11、l input voltage (VIL) 0.7 V dc Case operating temperature range (TC) -55C to +125C _ 1/ Maximum power dissipation is defined as VCCX ICC, and must withstand the added PDdue to short circuit test e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-

12、,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of

13、this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS M

14、IL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online

15、 at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herei

16、n, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for

17、 non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in

18、accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of

19、 the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimens

20、ions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on fig

21、ure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 E

22、lectrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2

23、 herein. In addition, the manufacturers PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 223

24、4 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when th

25、e QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved sourc

26、e of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to

27、 this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documenta

28、tion. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION L

29、EVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, IOH= -2 mA VIN= 0.7 V or 2.0 V 1, 2, 3 All 2.4 V Low leve

30、l output voltage VOL VCC= 4.5 V, IOL= 20 mA VIN= 0.7 V or 2.0 V 1, 2, 3 All 0.5 V Input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA, TC= +25C 1, 2, 3 All -1.2 V High level input current, All inputs IIH1 VCC= 5.5 V, VIN= 2.7 V 1, 2, 3 All 50 A IIH2 VIN= 5.5 V 1, 2, 3 All 1.0 mA Low level input current

31、IIL VCC= 5.5 V VIN= 0.5 V 1, 2, 3 All -2.0 mA Short circuit output current 1/ IOSVCC= 5.5 V VOUT= 0.0 V 1, 2, 3 All -40 -110 mA Supply current All outputs OPEN ICCO VCC= 5.5 V 1, 2, 3 All 85 mA Off-state output current IOFF1 VCC= 5.5 V VOUT= 2.4 V 1, 2, 3 All 50 A IOFF2 VCC= 5.5 V VOUT= 0.5 V 1, 2,

32、3 All -50 A Functional tests See 4.3.1c 7 All tPLH19, 10, 11 All 28 ns Propagation delay time, from A, B, or C to Y tPHL1 VCC= 5.0 V, CL= 50 pF 10%, RL= 280 5% 2/ 9, 10, 11 All 30 ns tPLH29, 10, 11 All 24 ns Propagation delay time, from A, B, or C to W tPHL2 9, 10, 11 All 22 ns tPLH39, 10, 11 All 20

33、 ns Propagation delay time, from any D to Y tPHL3 9, 10, 11 All 20 ns tPLH49, 10, 11 All 14 ns Propagation delay time, from any D to W tPHL4 9, 10, 11 All 14 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD M

34、ICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TC +125C 1/ unless otherwise specified Group A subgroupsDevice type Limits U

35、nit Min MaxtPZH1 9, 10, 11 All 25.5 ns Output enable time, from strobe to Y tPZL1 VCC= 5.0 V CL= 50 pF 10% RL= 2 k 5% 9, 10, 11 All 27.5 ns tPHZ1 9, 10, 11 All 24 ns Output disable time, from strobe to Y tPLZ1 9, 10, 11 All 24 ns tPZH2 9, 10, 11 All 25.5 ns Output enable time, from strobe to W tPZL2

36、 9, 10, 11 All 27.5 ns tPHZ2 9, 10, 11 All 24 ns Output disable time, from strobe to W tPLZ2 9, 10, 11 All 24 ns 1/ Not more than one output should be shorted at a time and the duration of the short circuit condition should not exceed one second. 2/ Propagation delay time testing may be performed us

37、ing either CL= 15 pF or CL= 50 pF. CL= 5 pF may be used for disable time only. However, the manufacturer must certify and guarantee that the microcircuits meet the switching test limits specified for a 50 pF load. . Provided by IHSNot for ResaleNo reproduction or networking permitted without license

38、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Device types 01 01 Case outlines E, F 2 Terminal number Terminal symbols Terminal symbols 1 (Input) D3 N/C 2 (Input) D2 (Input) D3 3 (Input

39、) D1 (Input) D2 4 (Input) D0 (Input) D1 5 (Output) Y (Input) D0 6 (Output) W N/C 7 (Enable) G (Output) Y 8 GND (Output) W 9 (Select) C (Enable) G 10 (Select) B GND 11 (Select) A N/C 12 (Input) D7 (Select) C 13 (Input) D6 (Select) B 14 (Input) D5 (Select) A 15 (Input) D4 (Input) D7 16 VCC N/C 17 - -

40、- (Input) D6 18 - - - (Input) D5 19 - - - (Input) D4 20 - - - VCCFIGURE 1. Terminal connections. INPUTS OUTPUTS Select Enable C B A G Y W X X X H Z Z L L L L D0 D0 L L H L D1 D1 L H L L D2 D2 L H H L D3 D3 H L L L D4 D4 H L H L D5 D5 H H L L D6 6D H H H L D7 D7 FIGURE 2. Truth table. Provided by IHS

41、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram Provided by IHSNot for ResaleNo reproduction o

42、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordanc

43、e with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condi

44、tion A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in acc

45、ordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II.

46、Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 9, 10*, 11* Gr

47、oups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of

48、MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 7 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80022 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 10