DLA SMD-5962-77053 REV M-2005 MICROCIRCUIT CMOS QUAD ANALOG SWITCH MONOLITHIC SILICON《硅单片四重虚拟开关 氧化物半导体微型电路》.pdf

《DLA SMD-5962-77053 REV M-2005 MICROCIRCUIT CMOS QUAD ANALOG SWITCH MONOLITHIC SILICON《硅单片四重虚拟开关 氧化物半导体微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-77053 REV M-2005 MICROCIRCUIT CMOS QUAD ANALOG SWITCH MONOLITHIC SILICON《硅单片四重虚拟开关 氧化物半导体微型电路》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED G Add two packages, F-5 and C-2. Change to military drawing format. Made changes to 1.3, table I, 6.4, figure 1, and editorial changes throughout. Add one vendor CAGE 34371. 89-09-13 M. Frye H Add new device type 02. Editorial changes throughout. A

2、dd vendor CAGE 1ES66. Change PDA from 10 percent to 5 percent. Make changes to 1.3 and table I. Remove vendor CAGE 32293. 92-11-13 M. Frye J Changes in accordance with NOR 5962-R134-95. 95-05-09 M. Frye K Drawing updated to reflect current requirements. Incorporate NOR revision J. Editorial changes

3、throughout. - drw 00-09-15 R. Monnin L Drawing updated to current requirements. Editorial changes throughout. - drw 03-02-12 R. Monnin M Make correction to Marking paragraph 3.5. - ro 05-04-08 R. Monnin CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV

4、SHET REV STATUS REV M M M M M M M M M OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY A. J. Foley DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY C. R. Jackson COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVE

5、D BY N. A. Hauck AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 77-11-04 MICROCIRCUIT, CMOS, QUAD ANALOG SWITCH, MONOLITHIC SILICON AMSC N/A REVISION LEVEL M SIZE A CAGE CODE 14933 77053 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E222-05 Provided by IHSNot for ResaleNo reproduction or

6、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class

7、 level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 77053 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s)

8、 identify the circuit function as follows: Device type Generic number Circuit function 01 DG201A Quad SPST analog switch 02 HI-201 Quad SPST analog switch, with dielectric isolation 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptiv

9、e designator Terminals Package style 2 CQCC1-N20 20 Square leadless chip carrier package E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package F GDFP2-F16 or CDFP3-F16 16 Flat pack X CDFP4-F16 16 Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maxim

10、um ratings. Supply voltage (between V+ and V-): Device type 01 . 44 V dc Device type 02 . 40 V dc Digital input voltage (VIN): Device type 01 . V- -0.3 V dc to V+ Device type 02 . V- -4 V dc to V+ +4 V dc Analog input voltage (VS) V- -2 V dc to V+ +2 V dc Current (any terminal except S or D): Device

11、 type 01 . 30 mA Device type 02 . 25 mA Continuous current, S or D: Device type 01 . 20 mA Device type 02 . 25 mA Peak current, S or D (pulsed at 1 ms, 10 percent duty cycle maximum): Device type 01 . 70 mA Device type 02 . 40 mA Storage temperature range -65C to +150C Provided by IHSNot for ResaleN

12、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings continued. Power dissipation (PD). 750 mW 1/ Lead temper

13、ature (soldering, 10 seconds) +275C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ): Device type 01 . +150C Device type 02 . +175C V+ to ground: Device type 01 . +25 V Device type 02 . +20 V V- to ground: Device type 01 . -25 V Device type 02 . -20 V 1.4 Recommen

14、ded operating conditions. Positive supply voltage (V+) +15 V dc Negative supply voltage (V-) -15 V dc Minimum digital high level input voltage (VIH) +2.4 V dc Maximum digital low level input voltage (VIL). +0.8 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 G

15、overnment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIF

16、ICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standa

17、rd Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-509

18、4.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ For c

19、ase E, derate at 12 mW/C above TA= +75C. For case 2, F and X, derate at 10 mW/C above TA= +75C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISI

20、ON LEVEL M SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer

21、 Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QM

22、L flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance wit

23、h MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance

24、with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient opera

25、ting temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be mark

26、ed with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a

27、“Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The

28、certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL

29、-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity reta

30、in the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW

31、ING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min MaxAnalog sign

32、al range VS3/ 1, 2, 3 All 15 V Drain-source ON resistance RDS(ON)VD= 10 V, VIN= 0.8 V, 1, 3 01 175 ID= 1 mA 2 250 VS= 10 V, VIN= 0.8 V, ID= m1 mA, 1 02 70 all unused channels, VA= 2.4 V 2, 3 100 Off input leakage current IS(OFF)VIN= 2.4 V, VS= 14 V, 1 All 2 nA VD= m14 V 2, 3 100 Off output leakage c

33、urrent ID(OFF)VIN= 2.4 V, VS= 14 V 1 01 1 nA 02 2 2, 3 All 100 On leakage current ID(ON)VIN= 0.8 V, 1 01 1 nA VD= VS= 14 V 02 2 2, 3 All 200 Low level input voltage VIL1, 2, 3 All 0.8 V High level input voltage VIH1, 2, 3 All 2.4 V Low level input leakage IILVIN= 0 V 1 01 1 A current 2 10 VIN= 0.8 V

34、 1 02 0.5 2, 3 1 High level input leakage IIHVIN= 2.4 V, 15 V 1 01 1 A current 2 10 1 02 0.5 2, 3 1 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMB

35、US COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min MaxSwitch ON time tONRL= 1 k, CL= 35 pF, VIH= +

36、3 V, VIL= 0 V 9, 10, 11 01 1000 ns RL= 1 k, CL= 100 pF, 9 02 600 VIH= +4 V, VIL= 0 V 10, 11 800 Switch OFF time tOFFRL= 1 k, CL= 35 pF, 9 01 500 ns VIH= +3 V, VIL= 0 V 10, 11 650 RL= 1 k, CL= 100 pF, 9 02 500 VIH= +4 V, VIL= 0 V 10, 11 650 Positive supply current I+ VIN= 0 V 1, 2 01 4 mA 3 6.5 VIN=

37、5 V 1, 2 3 3 4.5 VIN= 0.8 V 1, 2 02 1.5 3 2 VIN= 2.4 V 1, 2 1.5 3 2 Negative supply current I- VIN= 0 V 1, 2 01 -4 mA 3 -6.5 VIN= 5 V 1, 2 -3 3 -4.5 VIN= 0.8 V 1, 2 02 -1.5 3 -2 VIN= 2.4 V 1, 2 -1.5 3 -2 1/ Unless otherwise specified, V+ = +15 V dc and V- = -15 V dc. 2/ The limiting terms “min” (min

38、imum) and “max” (maximum) shall be considered to apply to magnitudes only. Negative current shall be defined as conventional current flow out of a device terminal. 3/ Guaranteed, if not tested, to the limits specified. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

39、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 7 DSCC FORM 2234 APR 97 Device type 01 02 Case outlines E, F, and X 2 E 2 Terminal number Terminal symbols 1 IN1NC IN1NC 2 D1IN1D1IN13 S1D1S1D14 V- S1V- S15 GND

40、 V- GND V- 6 S4NC S4NC 7 D4GND D4GND 8 IN4S4IN4S49 IN3D4IN3D410 D3IN4D3IN411 S3NC S3NC 12 NC IN3VREF1/ IN313 V+ D3V+ D314 S2S3S2S315 D2NC D2VREF1/ 16 IN2NC IN2NC 17 - V+ - V+ 18 - S2- S219 - D2- D220 - IN2- IN21/ VREFis normally floating, but voltage up to 10 V can be applied to raise the threshold

41、voltage. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATIO

42、N 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following addit

43、ional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, D, or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circu

44、it shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical param

45、eter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1

46、Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test cond

47、itions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, D, or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs,

48、 biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77053 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Su