DLA SMD-5962-05219 REV D-2011 MICROCIRCUIT HYBRID DUAL VOLTAGE REGULATOR POSTIVE AND NEGATIVE ADJUSTABLE.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added device type 03 and 04. Paragraph 1.4 changed the output voltage , negative voltage regulator for device type 01 from -1.2 V to -22 V dc to -1.2 V to -27 V dc. Table I; corrected the limit for the current limit test IMAX, should be specified

2、 as a min limit. -sld 07-11-28 Robert M. Heber B Sheet 5; made changes to the thermal regulation and current limit tests. Sheet 6; made changes to the thermal regulation, adjustment pin current change, and the minimum load current tests. Sheet 7; made changes to the current limit and long term stabi

3、lity tests. -sld 08-08-11 Robert M. Heber C Corrected Figure 1 to show the pin configuration without the ceramic seal accross all pins but only to show the seal on each pin individually. Figure 1 corrected the dimensions R and S1, removed the dimension D2 for case outline X. -sld 08-10-23 Robert M.

4、Heber D Added radiation hardness assurance requirements. -sld 11-12-06 Charles F. Saffle REV SHEET REV D D D D D SHEET 15 16 17 18 19 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 432

5、18-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Robert M. Heber MICROCIRCUIT, HYBRID, DUAL VOLTAGE REGULATOR, POSTIVE AND NEGATIVE, ADJUSTABLE DRA

6、WING APPROVAL DATE 07-04-25 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-05219 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E040-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05219 DLA LAND AND MARI

7、TIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Id

8、entifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 R 05219 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.

9、2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

10、 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 8601, 8602 Dual voltage regulator, positive and negative, adjustable 02 8603, 8604 Dual voltage regulator, positive and negative, adjustable 03 8607, 8608 Dual voltage r

11、egulator, positive, adjustable 04 8609, 8610 Dual voltage regulator, negative, adjustable 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certific

12、ation as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class

13、 level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer spe

14、cified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be s

15、pecified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. T

16、his product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Cas

17、e outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 6 Dual-in-line Y See figure 1 6 Surface Mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maxim

18、um ratings. 1/ Input-Output differential voltage: Positive regulator Device types 01, 02 and 03 40 V Negative regulator: Device types 01 and 04 -30 V Device type 02 -40 V Operating junction temperature range . -55C to +150C Thermal resistance, junction-to-case (JC) each regulator . 5C/W Lead tempera

19、ture (soldering, 10 seconds) 300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Output voltage range: Postive voltage regulator Device types 01, 02, and 03 . +1.2 V to +37 V dc Negative voltage regulator: Device type 01 and 04 -1.2 V to -27 V dc Device type 02 -1.2 V

20、to -37 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radiation features. Device types 01, 03, and 04: 2/ Maximum total dose available (dose rate = 50 - 300 rads(Si)/s) 100 krad (Si) 3/ Maximum total dose available (dose rate 10 mrad(Si)/s) 50 krad (Si) 4/ 2. APPLICABLE DOCUMENTS 2.1 G

21、overnment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. _ 1/ Stresses above the abso

22、lute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characte

23、rized for displacement damage. 3/ The active elements that make up the devices on this drawing have been tested for Total Ionizing Dose (TID) in accordance with MIL-STD-883 test method 1019 condition A. The active element will be re-tested after design or process changes that can affect RHA response

24、 of these devices. RHA testing of the active elements covered on this SMD were done in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4. 4/ The active elements that make up the devices on this drawing have been tested for Enhanced Low Dose Rate Sensitivity (ELDRS

25、) in accordance with MIL-STD-883, Method 1019 condition D for initial qualification. No ELDRS effect was observed. The devices will be re-tested after design or process changes that can affect RHA response of these devices. RHA testing of the active elements covered on this SMD were done in alternat

26、e packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DS

27、CC FORM 2234 APR 97 DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HAND

28、BOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19

29、111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3.

30、REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Manage

31、ment (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM

32、 plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be

33、 in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Radiation exposure circuits. The radiation exposure circuits shall be as specified on

34、 figure 4. 3.2.5 Maximum power dissipation verses case temperature table. The maximum power dissipation verses case temperature is specified in table IA. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in tabl

35、e I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shal

36、l be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein s

37、hall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be

38、 maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-

39、05219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C VIN-VOUT= 5 V, IOUT= 0.5 A, P PMAX unless otherwise specified Group A subgroups Device types Limits Unit Min Max P

40、OSITIVE REGULATOR Reference voltage 1/ VREF3 V (VIN- VOUT) VDIFFMax, 10 mA IOUT IMAX 1,2,3 01-03 1.20 1.30 V Line regulation 1/ 2/ VOUT VIN 3 V (VIN- VOUT) VDIFFMax, IOUT= 10 mA 1,2,3 01,03 0.03 %/V 02 0.05 Load regulation 1/ 2/ VOUT IOUT 10 mA IOUT IMAX, VOUT 5 V 1,2,3 01-03 60 mV 10 mA IOUT IMAX,

41、VOUT 5 V 1.2 % Thermal regulation 3/ IOUT= 1.5 A, (VIN- VOUT) = 13.3 V, 20 ms pulse, 20 W, TC= +25C 1 01-03 0.07 %/W Ripple rejection ratio 3/ VOUT= 10 V, f = 120 Hz, CADJ= 10 f 1,2,3 01-03 66 dB Adjustment pin current 1/ IADJ1,2,3 01-03 100 A Adjustment pin current change 1/ IADJ10 mA IOUT IMAX 1,2

42、,3 01-03 5 A 3.0 V (VIN- VOUT) 40 V, IOUT= 10 mA Minimum load current 1/ 3/ IMIN(VIN- VOUT) = 40 V 1,2,3 01-03 5 mA Current limit 1/ IMAX(VIN- VOUT) 15 V 1,2,3 01-03 1.5 A (VIN- VOUT) = 40 V, TC= +25C 1 0.30 Long term stability 3/ VOUT TIME TA= +125C 2 01-03 1 % Thermal resistance, each regulator, 3

43、/ junction-to-case JC1,2,3 01-03 5 C/W See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2

44、234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC+125C VIN-VOUT= 5 V, IOUT= 0.5 A, P PMAX unless otherwise specified Group A subgroups Device types Limits Unit Min Max NEGATIVE REGULATOR Reference voltage 1/ VREF3 V (VIN- VOUT) VDIFFMax, 10 mA IOU

45、T IMAX 1,2,3 01,02,04 -1.200 -1.300 V Line regulation 1/ 2/ VOUT VIN 3 V (VIN- VOUT) 30 V 1,2,3 01,04 0.02 %/V 3 V (VIN- VOUT) 40 V 02 0.05 Load regulation 1/ 2/ VOUT IOUT 10 mA IOUT IMAX, VOUT 5 V 1,2,3 01,02,04 25 mV 10 mA IOUT IMAX, VOUT 5 V 01,04 0.5 % 02 1 Thermal regulation 3/ IOUT= 1.5 A, (VI

46、N- VOUT) = 13.3 V, 20 ms pulse, 20 W, TC= +25C 1 01,02,04 0.02 %/W Ripple rejection ratio 3/ VOUT= -10 V, f = 120 Hz, CADJ= 10 f 1,2,3 01,02,04 66 dB Adjustment pin current 1/ IADJ1,2,3 01,02,04 100 A Adjustment pin current change 1/ IADJ10 mA IOUT IMAX1,2,3 01, 02, 04 5 A 3.0 V (VIN- VOUT) 30 V 01,

47、 04 5 3.0 V (VIN- VOUT) 40 V 1,2,3 02 5 Minimum load current 1/ 3/ IMIN(VIN- VOUT) = 30 V 1,2,3 01, 04 5 mA (VIN- VOUT) 10 V 01,02,04 3 (VIN- VOUT) = 40 V 02 5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI

48、CROCIRCUIT DRAWING SIZE A 5962-05219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC+125C VIN-VOUT= 5 V, IOUT= 0.5 A, P PMAXunless otherwise specified Group A subgroups Device types Limits Unit Min Max NEGATIVE REGULATOR -