DLA SMD-5962-05202 REV A-2012 MICROCIRCUIT HYBRID FOUR-QUADRANT MULTIPLIER.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Updated drawing paragraphs. -sld 12-01-19 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-39

2、90 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, FOUR- QUADRANT MULTIPLIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 05-08-17 AMSC N/A

3、REVISION LEVEL A SIZE A CAGE CODE 67268 5962-05202 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E060-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISI

4、ON LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When availabl

5、e, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 05202 01 H C X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.

6、4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device typ

7、e(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AS1595C014 Four-quadrant multiplier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements o

8、f MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applica

9、tions. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible lim

10、ited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of

11、that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manuf

12、acturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

13、 SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C CDIP2-T14 14 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolut

14、e maximum ratings. 1/ Applied voltage (Pins 2-1, 1-4, 1-9, 1-12, 14-1, (1-8, 12-7, 9-7, 8-7, and 4-7) 30 V dc Differential X input voltage (Pins 4-8). (6 + I13RX) V dc Differential Y input voltage (Pins 12-9). (6 + I3RY) V dc Bias current (Pin 3 or 13) . 10 mA Power dissipation PD (package limitatio

15、n) . 750 mW 2/ Thermal resistance, junction-to-case (JC) 30C/W Junction temperature (TJ) +175C Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS

16、 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE

17、SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard M

18、icrocircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In

19、the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum r

20、atings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate at 5.0 mW/C above TA = +25C.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW

21、ING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL

22、-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requir

23、ements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and ph

24、ysical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Input and output current measurement diagram. The in

25、put and output current measurement diagram shall be as specified on figure 2. 3.2.4 Common mode input voltage and gain measurement diagram. The common mode input voltage and gain measurement diagram shall be as specified on figure 3. 3.2.5 Test circuit for linearity and accuracy measurement using X

26、Y plotter. The test circuit for linearity and accuracy measurement using X Y plotter shall be as specified on figure 4. 3.2.6 Application test circuit. The application test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the e

27、lectrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined i

28、n table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MI

29、L-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, a

30、nd for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required f

31、rom a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of con

32、formance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (Q

33、M) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990

34、REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input Bias current IBX (I9 + I12)/2, See figure 2 1,2 01 8.0 A IBY (I4 + I8)/2, See

35、figure 2 8.0 Input offset current IIOX | I9 - I12 |, See figure 2 1,2 01 1.0 A 3 3.0 IIOY | I4 - I8 |, See figure 2 1,2 1.0 3 3.0 Output offset current IOO | I14 - I2 |, See figure 2 1,2,3 01 50 A Power supply drain -ID 1,2 01 7.0 mA DC power dissipation 3/ PD 1,2 01 170 mW Common mode gain (either

36、input) ACM See figure 3 4,5,6 01 -50 dB Input common mode voltage swing VICR See figure 3 4,5,6 01 11.5 Vpk Linearity 4/ ERY -10 VX +10, (VY = 2.5), See figure 4 4,5,6 01 1.5 % -10 VX +10, (VY = 3.1), See figure 4 7 ERX -2.5 VY +2.5, (VX = 10), See figure 4 4,5,6 01 1.5 -3.1 VY +3.1, (VX = 10), See

37、figure 4 7 Differential mode gain (Y input) 5/ ADM1 -3.1 VY +3.1, VEE = -15 V, VCC = +5 V, ICONTRAST = 1.0 mA, VOUT = +6.5 V, See figure 5 4,6 01 1.070 1.113 V/V 5 1.058 1.079 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS

38、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Dev

39、ice type Limits Unit Differential mode gain (Contrast current) 6/ ADM2 0 ICONTRAST 3.5 mA, VEE = -15 V, VCC = +5 V, VOUT = +6.5V,VIN = +1.0 V, See figure 5 4 01 .943 1.030 V/mA 5 .847 .896 6 .904 1.032 1/ Unless otherwise specified, VCC = +15 V, VEE = -15 V, I13 = 1.0 mA, RX, RY = 15k , and RL = 11k

40、 . 2/ The algebriac convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in table I. Negative current shall be defined as conventional current flow out of a device terminal. 3/ Test guaranteed by -ID test. 4/ Guaranteed by design, but not tested. 5/ Ga

41、in is defined as the measurement at +3.1 minus the measurement -3.1 divided by 6.2. 6/ Gain is defined as the measurement at +3.5 mA minus the measurement at 0 mA divided by 3.5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D

42、RAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline C Terminal numbers Terminal connections 1 VCC 2 OUT+ 3 YBIAS 4 YIN+ 5 RY+ 6 RY- 7 VEE 8 YIN- 9 XIN+ 10 RX+ 11 RX- 12 XIN- 13 XBIAS 14 OUT- FIGURE 1. Ter

43、minal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 NOTE: All resistors tolerance 1%, 81 W.

44、FIGURE 2. Input and output current measurement diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOT

45、E: All resistors tolerance 1%, 81 W. FIGURE 3. Common mode input voltage and gain measurements diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 RE

46、VISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 NOTE: All resistors tolerance 1%, 81 W. FIGURE 4. Test circuit for linearity and accuracy measurement using X Y plotter. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

47、A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 11 DSCC FORM 2234 APR 97 NOTE: All resistors tolerance 1%, 81 W. FIGURE 5. Application test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05202 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 12 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Fin