DLA SMD-5962-02505 REV C-2012 MICROCIRCUIT LINEAR HIGH SPEED PULSE WIDTH MODULATOR CONTROLLER MONOLITHIC SILICON.pdf

《DLA SMD-5962-02505 REV C-2012 MICROCIRCUIT LINEAR HIGH SPEED PULSE WIDTH MODULATOR CONTROLLER MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-02505 REV C-2012 MICROCIRCUIT LINEAR HIGH SPEED PULSE WIDTH MODULATOR CONTROLLER MONOLITHIC SILICON.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, correct VCC from 30 V to 20 V for VOM2, VOM4, fOM2, and PSRR. 03-11-07 Raymond Monnin B Updated drawing to the latest requirements. -sld 07-04-12 Robert M. Heber C Updated drawing paragraphs. -sld 12-12-10 Charles F. Saffle REV SHEET REV

2、 SHEET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE

3、BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, HIGH SPEED PULSE WIDTH MODULATOR CONTROLLER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 02-01-31 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-02505 SHEET 1 OF 13 DSCC FORM 2233 APR 97

4、 5962-E119-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents fi

5、ve product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN.

6、The PIN shall be as shown in the following example: 5962 - 02505 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA)

7、 designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 1/ Generic number Circuit f

8、unction 02 52445 High speed PWM controller 03 52446 High speed PWM controller 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as wel

9、l as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This

10、 level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incom

11、ing flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in

12、the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product

13、may have a limited temperature range. 1/ Device types may be similar to the device types on Standard Microcircuit Drawing (SMD) 5962-87681. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND M

14、ARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X CQCC1-N28B 28 Square leadless chip carrier with thermal pads 1

15、.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) . 22 V dc DC output current, source or sink 0.5 A Pulse output current, source or sink (0.5 s) 2.0 A Analog input voltage: NONINVERTING, INVERTING, and RAMP pins -0.3 V dc

16、to 7.0 V dc SOFT START and CURRENT LIMIT / SD pins . -0.3 V dc to 6.0 V dc Clock output current -5.0 mA Error amplifier output current 5.0 mA Soft start sink current 20 mA Oscillator charging current -5.0 mA Power dissipation (PD) . 1.0 W 2/ 3/ Storage temperature range . -65C to +150C Lead temperat

17、ure (soldering, 10 seconds) +300C Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC). 12 V dc to 22 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Govern

18、ment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATI

19、ONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. 1/ Stresses above the absolute maximum rating may cause permanent damage to the

20、 device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ For case outline X, derate linearly above TA= 40C at 9 mW/C. 3/ Must withstand the added PDdue to short circuit test, e.g., ISC. Provided by IHSNot for ResaleNo reproduction or networking permitted w

21、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawi

22、ngs. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the refe

23、rences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G,

24、 H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or o

25、ptimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design,

26、 construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified

27、 on figure 1. 3.2.3 Block diagram(s). The block diagram(s) shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temper

28、ature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be a

29、s specified in MIL-PRF-38534 and herein. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for

30、each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land an

31、d Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets th

32、e performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without l

33、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Devi

34、ce type Limits Unit Min Max Reference section Output voltage VREF TJ = +25C, IO = 1.0 mA 1 All 5.05 5.15 V Line regulation VRLINE 12 V VCC 20 V 1,2,3 All 15 mV Load regulation VRLOAD 1.0 mA IO 10 mA 1,2,3 All 20 mV Long term stability 2/ VREF/T TJ = +125C, t = 1000 hrs. 2 All 25 mV Total output vari

35、ation VOM1 IO = -1.0 mA, VCC = 10 V 1,2,3 All 5.00 5.20 mV VOM2 IO = -1.0 mA, VCC = 20 V VOM3 IO = -10 mA, VCC = 10 V VOM4 IO = -10 mA, VCC = 10 V Short circuit current ISC VREF = 0 V 1,2,3 All 30 90 mA Oscillator section Initial accuracy fO TJ = +25C 4 All 375 425 kHz Voltage stability fO/V 12 V VC

36、C 20 V 4,5,6 All 1.0 % Total variation fOM1 VCC = 10 V 4,5,6 All 340 460 kHz fOM2 VCC = 20 V Clock out high VCLK(H) 1,2,3 All 3.7 V Clock out low VCLK(L) 1,2,3 All 0.2 V Ramp voltage, peak 2/ VIM 1,2,3 All 2.6 3.0 V Ramp voltage, valley 2/ VIV 1,2,3 All 0.6 1.25 V Ramp voltage, valley to peak 2/ VIV

37、P 1,2,3 All 1.6 2.1 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE

38、I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Functional tests Functional tests See 4.3.1b 7,8 All Pass/Fail Error amplifier section Input offset voltage VOS VCM = 3.0 V, VO =

39、 3.0 V 1,2,3 All -15 15 mV Input bias current IIB VCM = 3.0 V, VO = 3.0 V 1,2,3 All 3.0 A Input offset current IOS VCM = 3.0 V, VO = 3.0 V 1,2,3 All 1.0 A Open loop gain AVOL 1.0 V VO 4.0 V 4,5,6 All 60 dB Common mode rejection ratio CMRR 1.5 V VCM 5.5 V, VOUT = 3.0 V 4,5,6 All 75 dB Power supply re

40、jection ratio PSRR 10 V VCC 20 V, VOUT = 3.0 V 4,5,6 All 85 dB Output sink current IO(SINK) E/A OUT voltage = 1.0 V 1,2,3 All 1.0 mA Output source current IO(SOURCE) E/A OUT voltage = 4.0 V 1,2,3 All -0.5 mA Output high voltage VOH1 E/A OUT current = -0.5 mA 1,2,3 All 4.0 5.0 V Output low voltage VO

41、L1 E/A OUT current = 1.0 mA 1,2,3 All 0 1.0 V Gain bandwidth product 2/ GBWP F = 200 kHz 4,5,6 All 6.0 MHz Slew rate 2/ SR 4,5,6 All 6.0 V/s PWM comparator section. RAMP bias current IBRAMP RAMP voltage = 0 V 1,2,3 All -8.0 A Duty cycle range DC(range) 1,2,3 All 0 80 % See footnotes at end of table.

42、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continue

43、d. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max RAMP comparator section - Continued. E/A OUT zero dc threshold voltage VTH RAMP voltage = 0 V 1,2,3 All 1.1 V Delay to output 2/ tD1 9,10,11 All 80 ns Soft-start/duty cycle clamp se

44、ction Charge current ICHG SOFT START voltage = 2.5 V 1,2,3 All 8 20 A Discharge current IDCHG SOFT START voltage = 2.5 V 1,2,3 All 0.10 0.35 mA Current limit/ start sequence/ fault section Restart threshold VRS 1,2,3 All 0.5 V I LIM bias current IBLIM 0 V V I LIM 2 V 1,2,3 All 15 A Current limit thr

45、eshold VLIMIT 1,2,3 All 0.95 1.05 V Over current threshold VOVER 1,2,3 All 1.14 1.26 V I LIM delay to output tD3 1,2,3 All 80 ns Output section Output low level VOL2 IOUT = 20 mA 1,2,3 All 0.4 V IOUT = 200 mA 2.2 Output high level V OH2 IOUT = -20 mA 1,2,3 All 13.0 V IOUT = -200 mA 12.0 UVLO output

46、low saturation VOLS IO = 20 mA 1,2,3 All 1.2 V Rise / fall times 2/ tr CL = 1.0 nF 9,10,11 All 45 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02505 DLA LAND AND MARITIME

47、COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Under-voltage lockout section Start threshold VSTA

48、RT 1,2,3 02 8.4 9.6 V 03 17.0 Stop threshold VStop 1,2,3 03 9 V UVLO hysteresis VHYS 02 0.4 1.2 V 03 5.0 7.0 Supply current Start up current ISTART VC = VCC = VTH (start) - 0.5 V 1,2,3 All 0.3 mA Supply current ICC Voltage = 0 V, NONINVERTING INPUT voltage = 1.0 V 1,2,3 All 36 mA 1/ Unless otherwise specified, characteristics apply at RT = 3.65 k, CT = 1.0 nF, and VCC = 12 V. 2/ Guaranteed, if not tested, to the specified