DLA MIL-PRF-19978 K-2009 CAPACITORS FIXED PLASTIC (OR PAPER-PLASTIC) DIELECTRIC (HERMETICALLY SEALED IN METAL CERAMIC OR GLASS CASES) ESTABLISHED AND NON-ESTABLISHED RELIABILITY GE.pdf

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1、AMSC N/A FSC 5910 MIL-PRF-19978K 26 March 2009 SUPERSEDING MIL-PRF-19978J 25 March 2003 PERFORMANCE SPECIFICATION CAPACITORS, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC (HERMETICALLY SEALED IN METAL, CERAMIC OR GLASS CASES), ESTABLISHED AND NON-ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR Thi

2、s specification is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the general requirements for established reliability (ER) and non-established reliability (non-ER), direct current (dc), plastic or paper-plastic dielectric

3、, fixed capacitors, hermetically sealed in metal or ceramic or glass cases. Capacitors meeting the established reliability requirements specified herein have failure rate (FR) levels ranging from 1.0 percent to 0.001 percent per 1,000 hours (see 1.2.1.9). These FRLs are established at a 90-percent c

4、onfidence level and maintained at a 10-percent producers risk and are based on life tests performed at maximum rated voltage and maximum rated temperature. An acceleration factor of 5:1 has been used to relate the life test data obtained at 140 percent of rated dc voltage at the applicable high test

5、 temperature to the rated voltage at the applicable high test temperature. This specification also covers removable mounting retainers for use with applicable capacitors (see 3.1). A parts per million (ppm) quality system is used for documenting and reporting the average outgoing quality of ER capac

6、itors supplied to this specification. Statistical process control (SPC) techniques are required in the manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification. 1.2 Classification. 1.2.1 Part or Identifying Number (PIN). The PIN is

7、 in the following form and as specified (see 3.1). ER CQR09 A 1 M C 152 K 1 M ER Terminal Circuit Charac- Voltage Capacitance Capacitance Vibration Product Style (1.2.1.2) (1.2.1.3) teristic (1.2.1.5) (1.2.1.6) tolerance grade level (1.2.1.1) (1.2.1.4) (1.2.1.7) (1.2.1.8) designator (1.2.1.9) NON-ER

8、 CQ09 A 1 M C 152 K 1 Style Terminal Circuit Charac- Voltage Capacitance Capacitance Vibration (1.2.1.1) (1.2.1.2) (1.2.1.3) teristic (1.2.1.5) (1.2.1.6) tolerance grade (1.2.1.4) (1.2.1.7) (1.2.1.8) Comments, suggestions or questions on this document should be addressed to Defense Supply Center Col

9、umbus, ATTN: VAT, Post Office Box 3990, Columbus, OH 43218-3990, or emailed to capacitorfilterdla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at assist.daps.dla.mil. INCH-POUNDProvided by IHSNot for Resal

10、eNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19978K 2 1.2.1.1 Style The style is identified by either the three-letter symbol “CQR“ or the two-letter symbol “CQ“ followed by a two-digit number. The letters identify plastic (or paper-plastic) dielectric, fixed capacit

11、or, hermetically sealed in metal, ceramic or glass cases. The symbol “CQR“ identifies established reliability (ER) capacitors; the symbol “CQ“ identifies capacitors for which no specific reliability requirements are specified (non-ER). The first digit following the letter symbols identifies the gene

12、ral shape of the case, and the second digit identifies specific details other than case size. Each style designation may include a family of case sizes. 1.2.1.2 Terminal. The terminal is identified by a single letter in accordance with table I. TABLE I. Terminal. Symbol Type of terminal A Axial wire

13、 lead B Solder lug (nonremovable) C Threaded stud and nuts D and H Pillar insulator for use at altitudes up to 7,500 feet (22.8 inches of mercury) E Pillar insulator for use at altitudes up to 50,000 feet (3.4 inches of mercury) 1.2.1.3 Circuit. The circuit diagram and the number of terminals are id

14、entified by a single digit in accordance with table II. TABLE II. Circuit diagram and number of terminals. Symbol Circuit diagram Number of terminals 1 2 3 2 1.2.1.4 Characteristic. The characteristic is identified by a single letter in accordance with table III. TABLE III. Characteristic. Values of

15、 characteristics Characteristic E F and G K 2/ M P Q T V High ambient test temperature, degrees Celsius 3C 1/ +85 +85 +125 +85 +65 +125 +170 +125Low ambient test temperature, degrees Celsius +0C, -5C -65 -55 -65 -65 -65 -55 -65 -55 Life-test dc voltage, percent of the dc voltage rating (see 4.7.20):

16、 Watt-second group (see 6.5.3): I (0.5 watt-second and less) 140 140 140 140 140 150 140 150 II (0.5+ to 5 watt-seconds) 140 130 140 3/ - - - - - - - - - - - - - - - III (5+ to 50 watt-seconds) 140 110 140 - - - - - - - - - - - - - - - IV (greater than 50 watt-seconds) 140 90 140 - - - - - - - - - -

17、 - - - - - Flashpoint of impregnant of filling compound, degrees Celsius +142 +135 +142 +142 +142 +142 +217 +1421/ For characteristic K, voltage derating may be necessary at the high ambient test temperature (see 3.1). 2/ For tubular units of characteristic K rated at 1,000 volts dc, life test volta

18、ge is 1,200 volts. 3/ For tubular units of characteristic K in watt-seconds group II, use 130 percent of the dc voltage at +40C for the life-test dc voltage. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19978K 3 1.2.1.5 Voltage. The dc vol

19、tage rating for continuous operation at the high ambient test temperature specified in table III (except for characteristic K which is for +85C operation), is identified by a single letter in accordance with table IV. TABLE IV. DC voltage rating. Symbol DC voltage rating 1/ (Volts) Symbol DC voltage

20、 rating 1/ (Volts) Z 30 K 2,500 A 50 L 3,000 B 100 M 4,000 C 200 N 5,000 D 300 P 6,000 E 400 R 7,500 F 600 S 10,000 G 1,000 T 12,500 H 1,500 U 15,000 J 2,000 1/ For characteristic K, voltage derating may be necessary at the high ambient test temperature (see 3.1). 1.2.1.6 Capacitance. The nominal ca

21、pacitance value expressed in picofarads (pF) is identified by a three-digit number; the first two digits represent significant figures and the last digit specifies the number of zeros to follow. 1.2.1.7 Capacitance tolerance. The capacitance tolerance in percent is identified by a single letter in a

22、ccordance with table V. TABLE V. Capacitance tolerance. Symbol Capacitance tolerance percent () F 1 G 2 J 5 K 10 1.2.1.8 Vibration grade. The vibration grade is identified by a single digit in accordance with table VI. TABLE VI. Vibration grade. Symbol Frequency range (Hz) Acceleration (G) 1 10 to 5

23、5 inclusive - - - 3 10 to 2,000 inclusive 15 1.2.1.9 Product level designator. The product level designation in percent per 1,000 hours is identified by a single letter in accordance with table VII, and is based on rated voltage at the high test temperature, as applicable. TABLE VII. Product level d

24、esignator. Symbol Product level (percent per 1,000 hours) M P R S 1.0 0.1 0.01 0.001 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19978K 4 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections

25、3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet al

26、l specified requirements documents cited in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications. standards. and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified he

27、rein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. FEDERAL STANDARDS FED-STD-H28 - Screw Thread Standards for Federal Services. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-83421/6 - Capacitors, Fixed, Metallized Plastic Film Dielectric,

28、DC and AC, Hermetically Sealed In Metal Cases, Established Reliability. (See Supplement 1 for list of associated specification sheets.) DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Method Standard Electronic and Electrical Component Parts. MIL-STD-690 - Failure Rate Sampling Plans and Procedur

29、es. MIL-STD-790 - Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications. MIL-STD-810 - Environmental Engineering Considerations and Laboratory Tests. MIL-STD-1285 - Marking of Electrical and Electronic Part

30、s. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications. The following documents form a part of this document to the ext

31、ent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM) ASTM D92 - Flash and Fire Points by Cleveland Open Cup. (DoD adopted). (Copies of these documents are available from http

32、:/ or Global Engineering Documents, Attn: Customer Service Department, 15 Inverness Way East, Englewood, CO 80112-5776.) ELECTRONIC INDUSTRIES ALLIANCE (EIA) EIA-554-1 - Assessment of Average Outgoing Quality Levels in Parts Per Million (ppm). (DoD adopted). EIA-557 - Statistical Process Control Sys

33、tems. (DoD adopted). (Copies of these documents are available from http:/ or Global Engineering Documents, Attn: Customer Service Department, 15 Inverness Way East, Englewood, CO 80112-5776.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19

34、978K 5 INTERNATIONAL ORGANIZATION FOR STANDARDS (ISO) ISO 10012-1 - Quality Assurance Requirements for Measuring Equipment, Part 1: Meteorological Confirmation System for Measuring Equipment. (Copies of these documents are available from http:/ or Global Engineering Documents, Attn: Customer Service

35、 Department, 15 Inverness Way East, Englewood, CO 80112-5776.) AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI) ANSI/NCSL Z540-1 - General Requirements for Calibration Laboratories and Measuring and Test Equipment (DoD adopted). (Copies of these documents are available from http:/ or Global Engineering

36、Documents, Attn: Customer Service Department, 15 Inverness Way East, Englewood, CO 80112-5776.) 2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein (except for related specification sh

37、eets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance wi

38、th the applicable specification sheets. In the event of any conflict between requirements of this specification and the specification sheet, the latter shall govern. 3.2 Qualification. Capacitors furnished under this specification shall be products which are authorized by the qualifying activity for

39、 listing on the applicable qualified products list (QPL) before contract award. In addition, the manufacturer shall obtain certification from the qualifying activity that the QPL system requirements of 3.3 and 4.2 have been met and are being maintained for the ER styles. Authorized distributors that

40、 are approved to MIL-STD-790 distributor requirements by the QPL manufacturers are listed in the QPL. 3.3 Qualified Products List (QPL) system. The manufacturer shall establish and maintain a QPL system for parts covered by this specification. Requirements for this system are specified in MIL-STD-69

41、0 and MIL-STD-790. In addition, the manufacturer shall establish a SPC and PPM system which meets the requirements of 3.3.1 and 3.3.2, respectively. 3.3.1 SPC system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a SPC system which meets the requirements of EIA-557.

42、 Typical manufacturing processes for application of a SPC include pre-assembly, assembly, encapsulation, and packaging. 3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a PPM system for assessing the average outgoing quality of lots in accordance with

43、 EIA-554-1. Data exclusion, in accordance with EIA-554-1, may be used with approval of the qualifying activity. The PPM system shall identify the PPM rate at the end of each month and shall be based on a six month moving average. 3.4 Material. The material shall be as specified herein. However, when

44、 a definite material is not specified, a material shall be used which will enable the capacitors to meet the performance requirements of this specification. Acceptance or approval of any constituent material shall not be construed as a guarantee of the acceptance of the finished product. 3.4.1 Impre

45、gnant and filling compounds. Compounds used in the impregnation and filling of capacitors shall be chemically inactive with respect to the capacitor element and the case (see 3.5.1). The compound, either in the state of original application or as a result of having aged, shall have no adverse effect

46、 on the performance of the capacitor. For liquid-filled capacitors, the same material shall be used for impregnating as is used for filling (see 6.3). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19978K 6 3.5 Interface and physical dimensi

47、on requirements. Capacitors and retainers shall meet the interface and physical dimensions specified (see 3.1). 3.5.1 Case. Each capacitor shall be enclosed in a hermetically-sealed case (see 3.1) which will protect the capacitor element from moisture, impregnant or filling compound leakage, and mec

48、hanical damage under all test conditions specified herein. 3.5.2 Sleeving (when applicable, see 3.1). The sleeving material shall not soften, creep, or shrink to a point where any part of the cylindrical portion of the case is left uncovered at any test temperature specified herein. The sleeving sha

49、ll not obscure the part marking. 3.5.3 Terminals. 3.5.3.1 Case as terminal. When the case is used as a terminal, any protective coating applied to the mounting surfaces shall be such as to provide a direct conducting path for an electric current from the case to the surface on which it is mounted. 3.5.3.2 Solder lugs and solder-lug terminal