DLA MIL-PRF-1 952 H-2008 ELECTRON TUBE RECEIVING TYPE 6AU6WC.pdf

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1、AMSC N/A FSC 5960 INCH-POUND MIL-PRF-1/952H18 June 2008 SUPERSEDING MIL-E-1/952G 17 February 1981 PERFORMANCE SPECIFICATION SHEET ELECTRON TUBE, RECEIVING TYPE 6AU6WC 1/ This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. The requirements for acquir

2、ing the electron tube described herein shall consist of this document and MIL-PRF-1. DESCRIPTION: Pentode, miniature, RF sharp cutoff. Outline - 5-2 (EIA). Base - E7-1. Envelope - T5-1/2. Cathode - Coated unipotential. Base connections: Pin No. - 1 2 3 4 5 6 7 Element - g1 g3 h h a g2 k int ed ABSOL

3、UTE- RATINGS: Parameter: Ef Eb Ec1 Ec2 Ec3 Ehk Rk Unit: V Vdc Vdc Vdc Vdc v OhmsMaximum: 6.9 330 0,-50 165 0 100 - Minimum: 5.7 - - - - - - Test conditions: 6.3 250 0 150 (see note 2) - 68 ABSOLUTE- RATINGS: Parameter: Rg1 Icl Pp Pg2 TE Alt Unit: Neg mAdc W W C ft Maximum: 0.5 1.0 3.3 0.72 165 (See

4、note 1)Minimum: - - - - - - Test conditions: - - - - - - GENERAL: Qualification: Not Required Reliable tube 1/ Formerly tube type 6AU6WB Inactive for new design after 30 April 1997 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-1/952H 2TABLE

5、 I. Testing and Inspection Limits Requirement or Test Method MIL-STD-1311 Conditions Acceptancelevel note 9Symbol Min Max Unit Conformance inspection, part 1 Heater current 1301 0.4 If 275 325 mA Heater-cathode leakage 1334 0.4 Ihk - 10 uA dc Total grid current 1266 Ec1 = 1.0 V dc; Rg1 = 0.25 Meg (s

6、ee note 3) 0.4 Ic1 0 -1.0 uA dc Electrode current (1) (anode) 1256 See note 3 0.4 Ib 8.0 13.5 mA dc Electrode current (2) (anode) 1256 Ec1 = -9 V dc; Ep = 0.1 Meg 0.4 Ib - 35 uA dcElectrode current (screen-grid) 1256 0.4 Ic2 2.6 6.0 mA dc Transconductance (1) 1304 0.4 Sm 4,150 6,250 umhos Short and

7、discontinuity detection 1201 0.4 - - - - Conformance inspection, part 2 Insulation of electrodes 1211 2.5 R - - Meg Electrode current (3) (anode) 1256 Ec1 = -6 V dc Rp = 0.5 Meg 2.5 Ib 5 - uA dc Transconductance (2) 1306 Ef = 5.7 V 2.5 *Sm Ef - 15 % Grid emission 1266 Et = 7.5 V; Ec1 = -10 V dc; Rg1

8、 = 0.25 Meg (See note 4) 2.5 Ic1 0 -2.0 uA dc Noise and microphonics 2201 Ef = 6.3 V dc; Ebb = 300 V dc; Ecc2 = 300 V dc; Ecal = 500 mV ac; Rk = 1,000 ohms; Rp = 0.22 Meg; Rg2 = 0.5 Meg; Cg2 = 2 F 2.5 - - - - Direct-interelectrode capacitance 1331 No shield 6.5 Cgip Cin Cout - 4.8 3.9 0.0035 7.2 5.9

9、 pF pF pF High-frequency vibration 1031 Rp = 2,000 ohms 6.5 Ep - 300 mV ac Shock 1041 450 G; Ehk = +100 V dc (see note 5) - - - - - Vibration-fatigue 1031 6.5 - - - - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-1/952H 3TABLE I. Testing an

10、d Inspection - Continued Limits Requirement or Test Method MIL-STD-1311 Conditions Acceptancelevel note 9 Symbol Min Max Unit Conformance inspection, part 2 Continued Post-shock and vibration fatigue test end points: - Low-frequency vibration 1031 - Ep - 450 mV acMaster-cathode leakage 1336 - Ihk -

11、30 uA dc Transconductance (1) 1306 - Sm 3,600 - umhosTotal grid current 1266 - Ic1 0 -2.0 uA dc Base strain 1121 See note 7 - - - - - Envelope strain 2126 2.5 - - - - Permanence of marking 1105 - - - - - Conformance inspection Part 3 Heater-cycling life Ef = 7.5 V; Ehk = +135 V dc; Ec1 = Ec2 = Eb =

12、0 - - - - - Heater-cycling life-test end point: - Heater-cathode leakage 1336 - IhK - 20 mA dcStability life 1516 Eb = 300 V dc; Ehk = +135 V dc; Rg1 = 0.5 Meg; Rk = 80 ohms; TA = room - - - - - Stability life-test end point (2 and 20 hours): - Change in transcon- ductance (1) of individual tubes 13

13、06 - sm - 10 % Intermittent life 1501 Eb = 300 V dc; Ehk = +135 V dc; Rg1 = 0.5 Meg; Rk = 80 ohms; TE = 165 C (min) See notes 8 and 10 - - - - - Intermittent life-test end points (1,000 hours): - Inoperatives - - - - - - Provided by IHSNot for ResaleNo reproduction or networking permitted without li

14、cense from IHS-,-,-MIL-PRF-1/952H 4TABLE I. Testing and Inspection - Continued Limits Requirement or Test Method Conditions Acceptancelevel note 9 Symbol Min Max Unit Conformance inspection, part 3 Continued Total grid current 1266 - Ic1 0 -1.0 uA dc Heater current 1301 - If 275 333 mA Change in tra

15、nscon- ductance (1) of individual tubes 1306 - %Sm t - 25 % Transconductance (2) 1306 - %Sm Ef - 20 % Heater-cathode leakage - Ihk - 20 uA dc Insulation of electrodes - R 50 - MegCathode interface life 1511 Ef = 6.9 V See note 10 - Ri - 50 ohms NOTES: 1. See “Reduced pressure (altitude) rating” and

16、altitude, maximum peak voltage. 2. Tie grid 3 co negative terminal of cathode resistor. 3. This test shall be performed at the conclusion of the holding period. 4. Prior to this test, tubes shall be preheated for a minimum of 5 minutes at the conditions indicated below. The 3-minute test shall not b

17、e permitted. Test at specified conditions within 3 seconds after preheating. Grid emission shall be the last test performed on the sample selected for the grid-emission test. Ef Ec1 Ec2 Ec3 Eb Rh Rg1 V V dc V dc V dc V dc Ohms Meg 7.5 0 150 0 300 80 0.5 5. A grid resistor of 0.1 Meg shall be added;

18、however, this resistor shall not be used when a thyatron-type short indicator is employed. 6. This test shall be performed yearly. An accept on zero defect sampling plan be used with sample of three tubes with an acceptance number of zero. In the event of failure, the test will be made as a part of

19、conformance inspection, part 2, acceptance level 6.5 (see 10/). The yearly sampling plan may be reinstated after three consecutive samples have been accepted. 7. Acceptance sampling procedure shall be in accordance with “base-strain test, miniature sampling” (method 1121), except that data covered i

20、n “Acceptance and rejection criteria” shall be modified as follows: (a) Accepted if no defectives for class A, B, or C defects, respectively (see method 1121), or if no defectives are found in the sample. (b) Rejected if any defectives for class A, B, or Cdefects, respectively, or if any defectives

21、are found in the sample 8. Envelope temperature (TE) requirements, when measured in accordance with the temperature by conduction-band measurement (method 1226), will be satisfied if a tube having bogey Ib (5 percent) under normal test conditions, is determined to operate at or above minimum specifi

22、ed temperature at any position in the life-test rack. 9. This specification sheet utilizes an accept on zero defect sampling plan in accordance with MIL-PRF-1, table III. 10. The life-test sample shall consist of the lesser of 20 tubes or 10% of lot size and no failures shall be permitted. In the ev

23、ent of failure of the first sample, a second sample of the lesser of 20 tubes or 10% of lot size shall be selected from the lot. Acceptance shall then be based on the second samples, and no failures shall be permitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

24、nse from IHS-,-,-MIL-PRF-1/952H 5Referenced documents: In addition to MIL-PRF-1, this specification sheet references the following: MIL-STD-1311. The margins of this specification are marked with vertical lines to indicate where changes from the previous issue were made. This was done as a convenien

25、ce only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespective of the marginal notations and relationship to the last previous issue. Cust

26、odians: Preparing activity: Army CR DLA CC Navy EC Air Force 85 (Project 5960-2008-058) DLA - CC Review activities: Navy AS, CG, MC Air Force 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http:/assist.daps.dla.mil/ Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-