DLA MIL-PRF-1 779 K-2008 ELECTRON TUBE RECEIVING TYPE 5687WB.pdf

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1、AMSC N/A FSC 5960 MIL-PRF-1/779K 17 October 2008 SUPERSEDING MIL-E-1/779J 28 January 1981 PERFORMANCE SPECIFICATION SHEET ELECTRON TUBE, RECEIVING TYPE 5687WB This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. The requirements for acquiring the ele

2、ctron tube described herein shall consist of this document and MIL-PRF-1. DESCRIPTION: Double triode, miniature, low Mu. Outline - 6-2 (EIA). Base - E9-1. Envelope - T6-1/2. Cathode - Coated unipotential. Base connections: ABSOLUTE-MAXIMUM RATINGS: Normal Parameter: Ef Eb Ec Ehk Rg/g Ic/g Ik/k Pp/p

3、TE Alt Unit: V V dc V dc v Meg mA dc mA dc W C ft Maximum: 6.6 330 0, -200135 0.1 6.0 65 3.75 225 (see note 3) 13.2 - - - (see note 1) - - (see note 2) - - Minimum: 6.0 - - - - - - - - - 12.0 TEST CONDITION (1): 12.6 120 -2 0 - - - - - - Pulse service Parameter: Ef Eb Ec eb egk ehk Pg/g Pp/p ik/k Du

4、 tp Prr Unit: V V dc V dc v v v W W mA % s Maximum: 6.6 330 - 660 50,-100 100 0.1 4.0 13.2 - - - - - - - Minimum: 6.0 - - - - - - - 12.0 - - - - - - - See figure 1 TEST CONDITIONS (2): 12.6 300 -40 - 40 - - - - 1.0 10 1,000 GENERAL: Qualification Not Required. Reliable tube. INCH-POUND Pin no. - 1 2

5、 3 4 5 6 7 8 9 Element - 2a 2g 2k h h 1k 1g hct la Inactive for new design after 7 March 1997. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-1/779K 2 TABLE I. Testing and inspection. Limits MIL-STD- 1311 method Requirement or test Condition

6、s Acceptance Level 16/ Symbol Min Max Unit 1256 1266 1301 1306 1336 1201 Conformance inspection, part 1 Electrode current (1) (anode) Total grid current Heater current Transconductance (1) Heater-cathode leakage Short and discontinuity detection Test condition (1) (see notes 4 and 5) Test condition

7、(1) (see notes 4 and 5) Test condition (1) (see note 4) See note 4 0.4 0.4 0.4 0.4 0.4 0.4 Ib Ic If Sm Ihk - 27 0 410 8,500 - - 45 -1.5 470 14,500 30 - mAdcAdc mA mhosAdc - 1211 1031 2201 1256 1256 Quality conformance inspection, part 2 Insulation of electrodes Low-frequency vibration Noise and micr

8、ophonics Electrode current (2) (anode) Electrode current (3) (anode) E(g to all) = -300 V E(a to all) = -500 V (see note 4) Test condition (1); F=40 Hz; 10 G; Rp = 2,000 ohms (see note 4) Ebb = 300 Vdc; Ec = 0; Esig = 70 mVac Rk = -680 ohms; Rg = 1.9 Meg; Rp = 2,000 ohms (see note 6) Test condition

9、(1); Eb = 300 V dc; Ec = -20 V dc (see note 4) Test condition (1); Eb = 300 Vdc; Ec = -25 Vdc (see note 4) 2.5 6.5 2.5 2.5 2.5 - Ep - Ib Ib - - - - - - 100 - 6.0 1.0 - mVac- mAdcmAdcSee notes at end of table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

10、 IHS-,-,-MIL-PRF-1/779K 3 TABLE I. Testing and inspection - Continued. Limits MIL-STD-1311 method Requirement or test Conditions Acceptance Level 16/ Symbol Min Max Unit 1266 1296 1296 1306 1316 1331 1231 1121 2126 1041 1031 - 1031 1336 1306 1266 1105 Conformance inspection, part 2 -Continued Grid e

11、mission Pulse current (1) (cathode) Pulse current (2) (cathode) Transconductance (2) Amplification factor Direct-interelectrode capacitance Emission current (anode) Base strain Glass strain Shock Vibration fatigue Post-shock and vibration- fatigue test end points Low-frequency vibration Heater-catho

12、de leakage Transconductance (1) Total grid current Permanence of marking Ef = 14.0 V; Eb = 120 Vdc; Ec = -25 Vdc (see notes 4 and 8) Test condition (2); Rk/k = 1.0 ohm (see notes 4 and 9) Test condition (2); Ef = 12.0 V; Rk/k = 1.0 ohm (see notes 4 and 9) Test condition (1); Ef = 11.4 V (see note 4)

13、 Test condition (1) (see note 4) No shield (see note 4) No shield (see note 4) No shield (triode No. 1) No shield (triode No. 2) No shield (see note 4) Epp = 195 Vac; Ec = 0; Rk/Ib = 10.5 mAdc (see note 10) See note 11 Test condition (1); 450 G; Ehk = 100 Vdc (see note 12) 2.5 G; F = 25 (min) ,60 (m

14、ax);fixed frequency 2.5 2.5 6.5 2.5 2.5 6.5 2.5 - 2.5 6.5 6.5 - - - - - Is ik ik Sm Ef Mu Cgp Cin Cout Cout Chk Is - - - - Ep Ihk Sm Ic - 0 900 800 - 16 2.8 2.8 0.42 0.34 - - - - - - - - - - - -5.0 - - 15 21 5.2 5.2 0.78 0.66 9.7 25 - - - - 150 50 - -3.0 - Adc ma ma % - pF pF pF pF pF Adc - - - - mA

15、dc Adc mhos Adc - See notes at end of table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-1/779K 4 TABLE I. Testing and inspection - Continued. Limits MIL-STD-1311 method Requirement or test Conditions Symbol Min Max Unit 1506 - 1336 151

16、6 0078 - 1306 1501 - - 1266 1301 1306 1306 1336 1211 1501 - 1296 Conformance inspection, part 3 Heater-cycling life Heater-cycling life-test end point Heater-cathode leakage Stability life Stability life-test end point Change in transconductance (1) of individual tubes Intermittent life Intermittent

17、 life-test end points (1,000 hours) Inoperatives Total grid current Heater current Change in transconductance (1) of individual tubes Transconductance (2) Heater-cathode leakage Insulation of electrodes E (g to all) = -300 V E (a to all) = -500 V Intermittent life (pulse) Intermittent pulse life-tes

18、t end points Inoperative Pulse cathode current (1) Ef = 7.5 V; 1 min “on”, 4 min “off”; Ehk = 135 Vdc; Eb = Ec = 0 (see note 7) Test condition (1); Ec = 0; Rk/k = 68 ohms; Enk = 135 Vdc; Rg/g = 1.0 Meg; TA = room Stability life-test conditions; TE = 225C (min) (see notes 14 and 16) Test condition (2

19、); Rb/p = 50 ohms (see note 15) - Ihk - Sm t - - Ic If Sm t Sm Ef Ihk R - - ik - - - - - - 0 400 - - - 25 - - 750 - 30 - 10 - - -2.5 480 25 30 50 - - - - - Adc - % - - Adc mA % % Adc Meg - - ma See notes at top of next page. Provided by IHSNot for ResaleNo reproduction or networking permitted withou

20、t license from IHS-,-,-MIL-PRF-1/779K 5 NOTES: 1. This value is for operation under fixed-bias conditions. With cathode bias, Rg/g may be 1.0 megohm maximum. 2. Pp/p on one section may be as great as 4.2 watts maximum providing that the total for both sections does not exceed 7.5 watts. 3. See “Redu

21、ced pressure (altitude) rating”, and altitude, maximum peak voltage. 4. Test each section separately. 5. This test shall be performed at the conclusion of the holding period. 6. Tie 1k to 2k; 1g to 2g; and 1a to 2a. 7. Operate heaters in parallel. 8. Prior to this test, tubes shall be preheated a mi

22、nimum of 5 minutes with all sections operating at the conditions specified below. Test at specified conditions within 3 seconds after preheating. The 3-minute test shall not be permitted. Grid emission shall be the last test performed on the sample selected for the grid-emission test. Ef Eb Ec1 Rk/k

23、 Rg/g V V dc V dc Ohms Meg 14.0 120 -2 0 1.0 9. The positive portion of the grid pulse shall be a square wave meeting pulse shape requirement of method 1296 and, in addition, the maximum amplitude shall occur within the first 20 percent of tp. The pulse shall be applied to the grid by means of a dri

24、ving circuit which produces the specified peak pulse voltage directly at the grid terminal with respect to cathode. Grid resistance, not exceeding 50 ohms may be inserted to prevent oscillation, provided readjustment of grid drive is made to maintain the specified pulse amplitude directly at the gri

25、d terminal. Peak currents shall be measured by means of a high impedance oscilloscope, or equivalent device, connected across a cathode resistor of 1.0 0.1 ohm. The specified limit refers to the maximum of pulse amplitude. 10. Test each unit separately with test voltages applied to opposite section.

26、 Tie grids to negative end of individual Rk through individual 100-ohm resistors. Adjust individual Rk for specified forward anode current 5 percent as measured on the forward half cycles of anode voltage. After a minimum of 5 minutes operation as above, measure reverse anode current on the reverse

27、half cycles of anode voltage. See figure 2. 11. Acceptance sampling procedure shall be in accordance with “Base-strain test, miniature, sampling ( method 1121), except that data covered in “Acceptance and rejection criteria” shall be modified as follows: (a) Accepted if no defects for class “A”, “B”

28、, or “C”, respectively (see method 1121), or if no defectives are found in the sample. (b) Rejected if any defectives for class “A”, “B”, or “C”, respectively, or if any defectives are found in the sample. 12. A grid resistor of 0.1 Meg shall be added. 13. This test shall be conducted on the initial

29、 lot and thereafter on a lot approximately every 12 months. When one lot has passed, the 12-month rule shall apply. In the event of lot failure, the lot shall be rejected and the succeeding lots shall be subjected to this test until a lot passes. 14. Envelope temperature (TE) requirements, when meas

30、ured in accordance with the temperature by conduction-band measurement (method 1226), will be satisfied if a tube having bogey Ib (5 percent) under normal test conditions, is determined to operate at or above minimum specified temperature at any position in the life-test rack. 15. The positive porti

31、on of the grid pulse shall be a rectangular wave meeting pulse shape requirement of method 1296. The pulse shall be applied to the grid by means of a driving circuit which produces the specified peak pulse voltage directly at the grid terminal with respect to the cathode. Grid resistance not exceedi

32、ng 50 ohms may be inserted to prevent oscillation, provided readjustment of grid drive is made to maintain the specified pulse amplitude directly at the grid terminal. The pulse width, tp, shall be 10 2 s, and the duty factor, 0.9 percent to 1.1 percent. Self-excited life-test circuitry is permissib

33、le, provided any additional anode voltage drops during the time of the pulse are compensated for by increasing Ebb. No fixed Ec1 need be applied under self-excited conditions. 16. This specification sheet utilizes accept on zero defect sampling plan in accordance with MIL-PRF-1, table III. 17. The l

34、ife-test sample shall consist of the lesser of 20 tubes or 10 percent of lot size and no tube failures shall be permitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-1/779K 6 The area below and to the left of the line is the area of perm

35、issible operation. Nine hundred milliamperes is the maximum peak current at any duty factor less than 1 percent. For any tube operating under the worst possible conditions, the point indicating peak cathode current and percent duty factor and the point indicating peak-cathode current and pulse width

36、 should both be in the area of permissible operation. Duty factor is defined as the ratio of the average current to the maximum peak current occurring in any 1,000-microsecond period. FIGURE 1. Pulse rating chart. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

37、rom IHS-,-,-MIL-PRF-1/779K 7 FIGURE 2. Anode emission test circuit. Referenced documents. In addition to MIL-PRF-1, this document references MIL-STD-1311. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extent of the changes. Custodi

38、ans: Preparing activity: Army - CR DLA - CC Navy - EC Air Force - 85 (Project 5960-2008-066) DLA - CC Review activities: Army - AR, CR4, MI Navy - AS, OS, SH Air Force - 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http:/assist.daps.dla.mil/. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-