DLA MIL-PRF-1 1570D-1999 ELECTRON TUBE MAGNETRON TYPE 7156A.pdf

《DLA MIL-PRF-1 1570D-1999 ELECTRON TUBE MAGNETRON TYPE 7156A.pdf》由会员分享，可在线阅读，更多相关《DLA MIL-PRF-1 1570D-1999 ELECTRON TUBE MAGNETRON TYPE 7156A.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、I INCH-POUND I MI L-PRF-1 I1 570D Parameter: Unit: Maxim um : Minimum: 16 July 1999 SUPERSEDING Ef Ib ib Pi Pi tPC ePY tk Du V mA dc _ P kv sec a W kw 6.5 30 30 750 750 2.5 28 _ 0.001 2 _ _ _ _ _ _ 180 _ _ 2/ 3/ - MI L-E-1 I1 570Cf NAVY) Parameter: Unit: Maxim um : Minimum: 30 September 1974 distrib

2、ution is unlimited FSC 5960 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 I1 570D TABLE I. Testinci and inspection. Inspection Qualification inspection Mechanical tuning High-frequency vibration Shock, specified pulse Direct interelectro

3、de capacitances Time jitter Temperature coefficient Frequencychange (warmup) RF bandwidth Minor lobe ratio Rough handling test Conformance inspection, part 1 Pressurizing Heater current, nonoperating Mechanical tuning range Warmup time Pulse voltage Power output RF bandwidth Stability Output power w

4、armup time Method 4223 1031 1042 4266 431 8 4027 4302 4308 4308 1136 4003 4289 4223 4303 4306 4250 4308 431 5 4303 Conditions FI through F5 No voltages 15G; 11 ms F2 and F4 FI and F5; T(anode) = 5OoC to 1 2OoC F4 F2 and F4 F2 and F4 30 psia (min) Ef = 5 V; tk = 180 sec (min) Ef=5V FI FI and F5 F2 th

5、rough F4 FI and F5 F2 and F4 Symbol _ _ _ C At AFIC AF BW SL _ _ If F _ ePY Po Po BW MP MP Po _ 4.5 FI _ 23 225 157 _ _ _ 157 tc Max 14 _ _ 30 0.007 0.20 3 2.Oltpc _ _ _ 5.4 F5 _ 26 _ 233 2.Oltpc 1 .o 0.25 _ Unit Turns _ _ PF P MHzIOC MHz MHz dB _ _ A MHz _ kv W W MHz Yo Yo W See footnotes at end of

6、 table. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 I1 570D TABLE I. Testinci and inspection - Continued Method 1031 4302 1261 4310 4223 _ _ 4250 4308 4315 Inspection on formance inspection, .ow-frequency vibration Irequency change (

7、warmup) ilectrode voltage (anode) Irequency pulling figure -mer torque Notes - 5/61 BI 181 - - I o1 - _ 161 SBl - 1 91 El on formance inspection, w .fe test .fe test end points: Power output RF bandwidth Stability Conditions No voltages F5 F5 FI through F5; T = 25OC roup D; Eathode horizontal FI and

8、 F5 F2 and F4 Symbol _ AF Akv AF _ t Po Po BW MP MP Max _ 10 -0, +2 15 80 _ _ _ 2.2ltpc 2 0.25 Unit _ MHz kv MHz inch-ounce cycles W W MHz Yo Yo - 11 The characteristics of the applied voltage pulse which will result in proper starting and oscillation of the magnetron, as measured into any tube, sha

9、ll be as follows: Lona pulse (test condition (1 ) (a) tpv = 2.25 ps f 1 O percent (b) tsrv = 0.1 ps (min) to 0.3 ps (max) (c) tfv = 0.65 ps nominal (d) Ripple 3.5 percent (max) (e) Pulse droop 5 percent (max) Triple pulse (test condition (2) (a) tpv = 0.35 ps f 20 percent (b) tsrv = 0.05 ps (min) to

10、 0.15 ps (max) For long pulse test purposes, modulator unit in accordance with Naval Ordnance System Command (Ord) No. 1857536, or equivalent shall be used. For triple pulse test purposes, the following modulator units shall be used, Ord. Nos I847960 and 21 30769, or equivalents. Pulse spacing betwe

11、en each of the 0.23 ps detected rf pulses will be 1 .O f 0.2 ps, measured from leading edge to leading edge at the 70 percent amplitude point. The rise and fall time shall be measured in accordance with method 4304. On the triple pulse group, this is applicable to the first leading edge (rise) and l

12、ast trailing edge (fall). The maximum value specified herein is for a nonoscillating condition. Heater surge current shall not exceed 12 amperes. The heater voltage shall be reduced during operation after the application of high voltage. The following conditions shall be observed : - 21 31 Condition

13、s - Ef Alternate operation Test 1 Test 2 2 V (for Ib = 21.5 mA) 3.5 V f 5 percent Ef = OV (for Ib = 24 mA and Du = 0.001) 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 /I 570D TABLE I. Testinci and inspection - Continued Frequency skip

14、ping or unstable operation may be encountered at some phase positions when the mismatch occurs at the end of a “long“ line. The temperature shall be measured at the point shown on figure I. The gas used in pressurization shall provide insulating properties at least equal to that of clean, dry air at

15、 the pressures specified herein. The minimum torque needed to override the tuner stop is 200 inch-ounces. With the tube operating under test condition (I), the frequency shall be allowed to reach thermal equilibrium at F5, or under test condition (2), the frequency shall be allowed to reach thermal

16、equilibrium at F4. The tube shall then be allowed to cool at room ambient temperature for a minimum of 1 hour. Following the cooling period, the filament shall be preheated for 3 minutes, then high voltage applied to full value in 30 seconds maximum. Frequency measurements shall be made every 30 sec

17、onds for 2 minutes, then at 1 minute intervals until frequency stability is reached. The maximum frequency drift from high voltage application to stabilization shall be less than the value specified herein. Frequency stability shall occur within 15 minutes maximum. Stability is defined as the operat

18、ing condition where the frequency does not vary more than 0.5 MHz within 15 minutes. Unless otherwise specified, the acceptance level for all tests listed under conformance inspection, part 1, shall be 1 .O, inspection level II. The VSWR shall be 1.5. The interpretation of the value of the VSWR shal

19、l be as specified in method 4310. The standing-wave introducer shall be cycled continuously through a line length approximately a half wavelength long at an approximate rate of 4 cycles per hour. The application of operating voltages shall be in accordance with the following cycles: (a) Cathode preh

20、eat: 3 minutes. (b) Pulse voltage: 7 hours (c) Off: 57 minutes Cooling requirements, where the ambient temperature does not exceed 5OoC, shall be as follows. In no case shall the temperature of the anode exceed 12OOC. Average anode power input (watts) O 1 O0 200 300 400 500 600 Air flow (cfm) 2.5 7.

21、5 10.0 15.0 19.5 24.0 29.0 Back pressure linches of H-D .O6 .I6 .28 .44 .63 .87 1.13 This test may be conducted only under one set of conditions within the limits for the test conditions specified herein The rise time of the detected rf pulse (trrf) and the fall time of the detected rf pulse (tfrf)

22、shall be measured between the 20 and 85 percent points. Pulse width shall be measured at the 50 percent level. The three detected rf pulses within each group shall be equal in height within 10 percent The change in pulse voltage shall be measured as the frequency is increased from FI to F5. The rf b

23、andwidth shall be within the limits specified herein when a VSWR of 1.5 is introduced in the load at a distance not greater than 0.5 meter from the magnetron coupling flange, the phase being adjusted for maximum power output. The first adjacent side lobe shall be at least 7 dB below the main lobe, a

24、nd each successive side lobe shall be lower than its preceding one. Measurements shall be limited to the first four side lobes each side of the main lobe, to a level not to exceed 25 dB below the level of the main lobe. 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without l

25、icense from IHS-,-,-MI L-PRF-1 /I 570D TABLE I. Testinci and inspection - Continued - 18/ The pulling measurement shall be made in such a manner that thermal effects do not introduce appreciable errors. - 19/ A missing pulse is defined as a pulse of test condition (1) or any one of the pulses in the

26、 pulse group of test condition (2) that: (a) Has less than 70 percent of the energy content of a normal pulse, or (b) Is at a frequency greater than plus or minus 5 MHz from the operating frequency. Missing pulses shall be counted during the last 3 minutes of a test interval not to exceed 6 minutes.

27、 During each 15 second interval in the 3-minute test time, there shall be no more than 125 missing pulses. (c) In lieu of detecting individual pulses in test condition (2), a missing pulse detection level of 90 percent may be used as an alternative method if the energy of the three pulses is integra

28、ted as a group. - 20/ This test shall be the first test after the holding period or the first test of the end-of-life measurements. After completing the heater- cathode warmup time, the 6-minute maximum stability test interval described in s/ shall be started within 30 seconds after high voltage is

29、applied. The modulator used for test shall have an inverse overload actuation sensitivity of 1 -second short circuit. After the stability test has been completed, during the remainder of tests in test condition (I), no more than one overload actuation shall be allowed. - 21/ Measurements of temperat

30、ure and frequency shall be made after conditions of thermal equilibrium have been reached. - 22/ Stability shall not be measured during this test - 23/ Leakage current shall be less than 2.0 mA dc and the power output greater than 157 W throughout the test. To measure leakage current and its relatio

31、nship to power output, allow the tube to cool for a minimum of 1 hour. Operate the tube in the triple pulse, initially setting the current to 16 mA dc. Operate the tube for 1 hour. Maintain the line voltage constant. The leakage current is defined as the difference between the initial and final curr

32、ent. - 24/ The magnetron shall have a shelf life of 1 -year minimum. At any time during the shelf-life period, the tube shall be capable of being “snapped on“ at normal operating voltages for both test conditions (1) and (2). The “snap on“ test procedure and criteria shall be as defined in B/ and E/

33、. (a) Upon “snap-on“ in test condition (I), the magnetron rf output shall not exhibit more than 250 consecutive missing pulses at any time, when operated in accordance with the requirements of test condition (1). (b) Upon “snap-on“ in test condition (2), the magnetron rf output shall not exhibit mor

34、e than 30 consecutive missing pulse groups at any time, when operated in accordance with the requirements of test condition 2). (c) A missing rf output is defined in O/. (d) The other missing pulse and stability requirements under test conditions (1) and (2) apply. (e) At the end of this shelf-life

35、period, the tube shall have an operational service life of 500 hours minimum. The missing pulse requirements specified herein shall be applicable throughout this service life. - 25/ Excluding the leading edge and trailing edge of the detected rf pulse, the amplitude of the peak power shall not fall

36、below 1 O percent of the maximum value obtained during the pulse. - 26/ This test shall be the first test after completion of conformance inspection, part 1, test condition (1). The following modulator units shall be used, Ord numbers 1847960 and 21 30769. Input triggers and overload circuitry shall

37、 be as specified herein. “Normal“ overload sensitivity referred to herein is incorporated in Ord assembly 1847960. The inverse overload circuits in each channel shall be provided with two actuation sensitivity controls, position (a) normal (30 consecutive pulses short-circuit) and position (b) 250 m

38、s short circuit. With the sensitivity in position (b), and after the heater cathode warmup time, within 30 seconds maximum after high voltage is applied, the missing pulse test of s/ shall be conducted. Upon completion of this test, the overload sensitivity shall be changed to position (a) and the r

39、emainder of test condition (2) tests completed. During the total test period with the overload sensitivity in position (a), there shall be no more than five overloads allowed. In addition, there shall be no overloads in the last 20 minutes of the test interval. The test interval may be extended unti

40、l a satisfactory 20-minute period is obtained but the five overload criteria still applies. 5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 11 570D TABLE I. Testinci and inspection - Continued - 271 In handling and mounting the magnetron

41、, care shall be taken to prevent demagnetization. Ferro-magnetic materials shall not at any time be permitted to come closer than 8 inches from the magnet, except at the ends where the clearance may be 3 inches minimum. Energized magnets shall not at any time be permitted to come closer than 12 inch

42、es from the tube magnet. - 281 The packing shall be so designed as to provide a hand-carry inner container. The maximum dimensions of the container shall be 20 by 18 by 12 inches and the maximum weight shall be 12 pounds. - 291 This test shall also be performed after life-test end points - 301 Margi

43、nal notations are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 /I 570D SE SE SE SE SEE NOTE 10 SEE NOTE 5 SEE N

44、OTE 5 SURFACE II E NOTE 15 NOTE 4 SEE NOTE 9 BE REF. PLANE “B“ FIGURE I. Outline drawinq of electron tube type 7156A 7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 /I 570D n .250 (6.351 -20 HEX HD. SEE NOTE 10 SEE NOTES 5.12 AND 13 FIGU

45、RE I. Outline drawinq of electron tube type 7156A - Continued 8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-REF. PLANE IC MI L-PRF-1 /I 570D -R- tt k Hi 1 - - SEE NOTE 5 , , -S -T SEE NOTE 5 -U T i 1 w ?T t FIGURE I. Outline drawinq of electron t

46、ube type 7156A - Continued 9 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MI L-PRF-1 /I 570D FIGURE I. Outline drawinq of electron tube type 7156A - Continued. 10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license

47、 from IHS-,-,-MI L-PRF-1 /I 570D NOTES: I. Reference plane “A is defined as a plane passing along the face of the mounting plate. 2. Reference plane “B is defined as a plane perpendicular to plane “A passing through the center of holes as shown 3. Reference plane “C is defined as a plane mutually pe

48、rpendicular to planes “A and “B“ passing through the center of the hole as shown. 4. Parts of this axis may deviate from centerline by .I 25 inch (3.1 8 mm) 5. Includes angular as well as lateral deviation. 6. This dimension applies to zone of radiator only 7. Common heater - cathode connection 8. Heater connection 9. This dimension is from reference plane “B“ to end of radiator. 1 O. Cathode support temperature shall be measured at point indicated. 11. Anode temperature shall be measured at point indicated. 12. Refers to the centerline of the waveguide as determined by centers