DLA DSCC-DWG-94006 REV D-2006 CAPACITORS FIXED CERAMIC CHIP《固定片状陶瓷电容器》.pdf
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1、 REVISION SLT DESCRIPTION DATE APPROVED A Added suggested sources of supply. Editorial changes throughout. 14 Sep 94 David E. Moore B Changes in accordance with NOR 5910-R002-96 23 May 96 Andrew R. Ernst C Added suggested source of supply. Editorial changes throughout. 31 July 2000 Kendall A. Cotton
2、gim D Added pure tin prohibition. Updated address for vendor B. Editorial changes throughout. 27 July 2006 Michael A. Radecki Prepared in accordance with ASME Y14.100 Selected item drawing REV STATUS OF PAGES REV D D D D D D PAGES 1 2 3 4 5 6 PMIC N/A PREPARED BY ROBERT E. GRILLOT DESIGN ACTIVITY DE
3、FENSE ELECTRONICS SUPPLY CENTER DAYTON, OH 45444-5000 Original date of drawing 13 December 1993 CHECKED BY EDWARD H. BACK TITLE CAPACITORS, FIXED, CERAMIC, CHIP APPROVED BY DAVID E. MOORE SIZE A CODE IDENT. NO. 14933 DWG NO. 94006 REV D PAGE 1 OF 6 CURRENT DESIGN ACTIVITY CAGE CODE 037Z3 DEFENSE LOG
4、ISTICS AGENCY DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 AMSC N/A 5910-E347 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444-5000 SIZE A CODE IDENT NO. 14933 DWG NO. 94006 REV D PAGE 2
5、 1. SCOPE 1.1 Scope. This drawing and MIL-PRF-55681 describe the requirements for ceramic, chip. 1.2 Part or Identifying Number (PIN) The complete PIN is as follows: 94006 -XX Drawing number Dash number (see table I) 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are speci
6、fied in sections 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that
7、they must meet all specified requirements of documents in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the exten
8、t specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-55681 - Capacitor, Chip, Multiple Layer, Fixed, Unencapsulated, Ceramic Dielectric, Established Reliability and Non-Established
9、Reliability, General Specification For. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods for Electronic and Electrical Component Parts. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or fr
10、om the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, howe
11、ver, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Interface and physical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-55681 and herein (see figure 1). 3.1.1 Termination. Termination shall be solder
12、 coated and shall be solderable when tested in accordance with MIL-STD-202, method 208. 3.1.2 Tin Plated Finishes. Tin Plating is prohibited as a final finish or as an undercoat. Tin-Lead (Sn-Pb) finishes are acceptable provided that the minimum lead content is 4 percent. 3.1.3 Operating temperature
13、 range. The operating temperature range shall be -55C to +125C. (No derating of working voltage.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444-5000 SIZE A CODE IDENT NO. 14933 DWG NO. 94006 REV
14、D PAGE 3 1/ 3.81 typical. NOTES: 1. Dimensions are in millimeters. 2. The U.S. Government preferred system of measurement is the metric SI system. However, this item was originally designed using inch-pound units of measurement. In the event of conflict between the metric and inch-pound units, the i
15、nch-pound units shall take precedence. 3. The solder coated device may exceed the above body dimensions by a maximum of 0.15 mm. FIGURE 1. Case dimensions and configuration. Dimensions L 0.050 W 0.050 T Max 1/ Y +0.25 -0.00 5.71 6.35 4.19 0.38 mm Inches 0.15 .006 0.25 .010 0.38 .015 0.50 .020 3.81 .
16、150 4.19 .165 5.71 .225 6.35 .250 TERMINATION Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444-5000 SIZE A CODE IDENT NO. 14933 DWG NO. 94006 REV D PAGE 4 3.2 Electrical characteristics. 3.2.1 Rated
17、 voltage. The rated voltage shall be in accordance with table I. 3.2.2 Dielectric type. The dielectric type shall be ceramic. 3.2.3 Capacitance change with temperature (TC). Capacitance change shall be less than 15 percent. 3.2.4 Operating frequency. Operating frequency shall be up to 100 MHz. 3.2.5
18、 Capacitance. See table I. Measured in accordance with method 305 of MIL-STD-202, 1 kHz at 1.0 V rms at +25C. 3.2.6 Dissipation factor (+25C). 2.5 percent maximum measured under the same conditions as capacitance. 3.2.7 Insulation resistance. MIL-STD-202, method 302 at rated voltage. At +25C: 1,000
19、megohms minimum. At +125C: 100 megohms minimum. 3.2.8 Dielectric withstanding voltage. Two times working voltage (WVDC) for 5 seconds. 3.2 9 Capacitance tolerance. K = 10 percent, M = 20 percent. 3.3 Solderability of terminals. In accordance with MIL-PRF-55681 (see 3.1.1). 3.4 Immersion cycling. In
20、accordance with MIL-PRF-55681. 3.5 Moisture resistance. In accordance with MIL-PRF-55681 with 20 continuous cycles. 3.6 Life. Two hundred percent of rated voltage for 96 hours at +125C in accordance with MIL-STD-202, method 108, test condition A. 3.7 Shock. MIL-STD-202, method 213, test condition J.
21、 3.8 Thermal shock. MIL-STD-202, method 107, test condition B. 3.9 Voltage conditioning. In accordance with MIL-PRF-55681, 100 percent of rated voltage. 3.10 Marking. Marking of the capacitor is not required; however, each unit package shall be marked in accordance with MIL-STD-1285 and include the
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