BS EN 62490-1-2010 ESL measuring method nPart 1 Capacitors with lead terminal for use nin electronic equipment《ESL测量方法 电子设备用带有铅终端的电容器》.pdf

《BS EN 62490-1-2010 ESL measuring method nPart 1 Capacitors with lead terminal for use nin electronic equipment《ESL测量方法 电子设备用带有铅终端的电容器》.pdf》由会员分享，可在线阅读，更多相关《BS EN 62490-1-2010 ESL measuring method nPart 1 Capacitors with lead terminal for use nin electronic equipment《ESL测量方法 电子设备用带有铅终端的电容器》.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS EN 62490-1:2010ESL measuring method Part 1: Capacitors with lead terminal for usein electronic equipmentBS EN 62490-1:2010 BRITISH STANDARDNational forewordThis British Standa

2、rd is the UK implementation of EN 62490-1:2010.It is identical to IEC 62490-1:2010.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/40X, Capacitors and resistors for electronicequipment.A list of organizations represented on this committee can beobtained on request to

3、its secretary.This publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. BSI 2010ISBN 978 0 580 57797 0ICS 31.060.01Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was

4、 published under the authority of theStandards Policy and Strategy Committee on 30 September 2010.Amendments issued since publicationDate Text affectedEUROPEAN STANDARD EN 62490-1 NORME EUROPENNE EUROPISCHE NORM September 2010 CENELEC European Committee for Electrotechnical Standardization Comit Eur

5、open de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62490-1:2010 E ICS 31.060.01 Engli

6、sh version ESL measuring method - Part 1: Capacitors with lead terminal for use in electronic equipment (IEC 62490-1:2010) Mthode de mesure de lESL - Partie 1: Condensateurs bornes de sortie utiliss dans les quipements lectroniques (CEI 62490-1:2010) ESL-Messverfahren - Teil 1: Kondensatoren mit Ans

7、chlussdrhten zur Verwendung in Gerten der Elektrotechnik aqund Elektronik (IEC 62490-1:2010) This European Standard was approved by CENELEC on 2010-09-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard th

8、e status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, Ge

9、rman). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgar

10、ia, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. EN 62490-1:2

11、010 - 2 - Foreword The text of document 40/2044/FDIS, future edition 1 of IEC 62490-1, prepared by IEC TC 40, Capacitors and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62490-1 on 2010-09-01. Attention is drawn to the possibili

12、ty that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an ide

13、ntical national standard or by endorsement (dop) 2011-06-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2013-09-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62490-1:2010 was approved by CENEL

14、EC as a European Standard without any modification. _ BS EN 62490-1:2010BS EN 62490-1:2010- 3 - EN 62490-1:2010 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the applicat

15、ion of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/

16、HD applies. Publication Year Title EN/HD Year IEC 60384-1 2008 Fixed capacitors for use in electronic equipment - Part 1: Generic specification EN 60384-1 2009 BS EN 62490-1:2010 2 62490-1 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Terms and definitions .5 4 Measurement jig,

17、short compensation jig, and spacer.5 4.1 Measurement jig (test fixture) 5 4.2 Short compensation jig5 4.3 Spacer 6 5 Measuring method7 5.1 Measuring instrument 7 5.2 Measurement conditions7 5.3 Preparation of sample .8 5.4 Measurement points 8 5.5 Frequency and signal level8 5.6 Measurement procedur

18、e8 5.6.1 General .8 5.6.2 Open compensation.9 5.6.3 Short compensation.9 5.6.4 ESL measurement .9 6 Items to be indicated in test result report10 Annex A (informative) The basic concept on ESL measuring method .11 Figure 1 Short compensation jig.6 Figure 2 Constructional example of the short compens

19、ation spacer and the measurement spacer 7 Figure 3 Measure points: seating plane or flange of capacitor on the printed circuit board 8 Figure 4 Method of short compensation .9 Figure 5 Example in state where electrode of measurement jig shifted.10 Figure A.1 Fundamental view of ESL measurement .11 B

20、S EN 62490-1:201062490-1 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ESL MEASURING METHOD Part 1: Capacitors with lead terminal for use in electronic equipment FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all na

21、tional electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Techni

22、cal Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work.

23、 International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) T

24、he formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendat

25、ions for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end

26、user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publicati

27、on shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent

28、 certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any person

29、al injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative refer

30、ences cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for

31、identifying any or all such patent rights. International Standard IEC 62490-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. The text of this standard is based on the following documents: FDIS Report on voting 40/2044/FDIS 40/2056/RVD Full informa

32、tion on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 62490 series, under the general title ESL measuring method,

33、can be found on the IEC website. BS EN 62490-1:2010 4 62490-1 IEC:2010 The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this d

34、ate, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. BS EN 62490-1:201062490-1 IEC:2010 5 ESL MEASURING METHOD Part 1: Cap with lead terminal for use in electronic equipment 1 Scope This part of IEC 62490 provides the equivalent series inductance L (ESL) me

35、asuring method for capacitors with lead terminal type for use in electronic equipment. The inductance values of capacitors provided for this document are within the range of 1 nH to 10 nH. 2 Normative references The following referenced documents are indispensable for the application of this documen

36、t. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60384-1:2008, Fixed capacitors for use in electronic equipment Part 1: Generic specification 3 Terms and definitions For the purpose

37、of this document, the terms and definitions given in IEC 60384-1 and the following apply. 3.1 equivalent series inductance L ESL inductive part of the impedance of capacitors NOTE 1 The unit of ESL is Henry (H). 4 Measurement jig, short compensation jig, and spacer 4.1 Measurement jig (test fixture)

38、 The measurement jig shall have the following features: a) the lead terminal holding method shall be screw up; b) the measurement jig has two pairs of screw-fixation electrodes for fixing the lead terminals of the capacitor to be measured. In pairs, one of the electrodes is fixed to the measurement

39、jig and the other is adjustable for fixing the lead wire. The adjustable electrode shall move only in a direction to hold the lead terminal and shall not rotate around the electrode fixing screw. 4.2 Short compensation jig The short compensation jig shall be the lead wire rod which has the following

40、 features of the materials and dimensions, which includes the diameter or the cross-section area: a) materials shall be the same materials as the lead wire of the capacitor to be measured; b) shape shall be as shown in Figure 1; BS EN 62490-1:2010 6 62490-1 IEC:2010 c) spacing section (pitch) shall

41、be the same lead spacing as the capacitor to be measured. The tolerance on the lead spacing of a short compensation jig shall be 0,25 mm; d) the straight section (shank) of the jig length shall be 5 mm to 10 mm, depending on what the measurement jig is able to hold. The straight section of the jig s

42、hall be kept from bending. Key P spacing section (pitch) (shaded section) l straight section (shank) Figure 1 Short compensation jig 4.3 Spacer These spacers shall be firmly fixed onto the measurement jig. The spacer material shall be nonmagnetic. An example is shown in Figure 2. P l IEC 1725/10 BS

43、EN 62490-1:201062490-1 IEC:2010 7 Dimensions in millimetres NOTE The basic method for measuring ESL when using these types of spacer is shown in Annex A.Figure 2 Constructional example of the short compensation spacer and the measurement spacer 5 Measuring method 5.1 Measuring instrument The impedan

44、ce analyser (balance bridge method) with the following specification or equivalent shall be used: a) inductance value (ESL) can be measured at a frequency of 40 MHz or higher; b) basic impedance accuracy shall be 0,08 % or better; c) impedance value of 3 m or less can be measured. 5.2 Measurement co

45、nditions The measurements shall be made under the standard atmospheric conditions for testing, as specified in IEC 60384-1:2008, 4.2.1. In addition, if there is any doubt as to the validity of measurement, the recovery conditions, as specified in IEC 60384-1:2008, 4.2.2, shall be implemented. Key fo

46、r Figure 2a P lead spacing *Lead spacing shall be the same as the capacitor to be measured. Key for Figure 2b t thickness of the spacer Figure 2a Front view of the spacer Figure 2b Side view of the spacer P tRemarks 1,5 0,1 Short compensation spacer 3,5 0,3 3,25 0,1 Measurement spacer 1,5 0,1 Short

47、compensation spacer 5,0 0,3 4,0 0,1 Measurement spacer 30 5,5 0,5 1,2 P*/2 t 0,5 P*/2 2 3 00,1 17 +0,10IEC 1726/10 BS EN 62490-1:2010 8 62490-1 IEC:2010 5.3 Preparation of sample The lead terminals of a capacitor to be measured shall be cut at a length of 5 mm to 10 mm. When cutting the lead termina

48、ls, the lead terminal shall be kept from bending. NOTE By cutting the leads shorter, they make stable contact with the measurement electrodes and provide highly repeatability and reproducibility. 5.4 Measurement points The measurement points of ESL shall be the places of the seating plane or flange

49、of the capacitor to be measured. An example is shown in Figure 3. NOTE Although during measurement the spacer is used, the measured value is equivalent to the value that would be measured at the seating plane of the lead terminals of capacitors as shown in Annex A. 1 2 IEC 1727/10 Key 1 flange 2 seating plane Figure 3 Measure points: seating plane or flange of capacitor on the printed circuit board 5.5 Frequency and signal level Unless otherwise s