ASTM E1329-2000(2005) Standard Practice for Verification and Use of Control Charts in Spectrochemical Analysis《化学光谱分析的控制图的检查和使用的标准规程》.pdf
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1、Designation: E 1329 00 (Reapproved 2005)Standard Practice forVerification and Use of Control Charts in SpectrochemicalAnalysis1This standard is issued under the fixed designation E 1329; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revisi
2、on, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice covers procedures for determining if aspectrochemical analysis is under statistical con
3、trol.1.2 Criteria are presented for determining when correctiveaction is required.1.3 Control will be effected by using verifiers to testinstrument response. It is recommended, although not required,that this be accompanied by the plotting of control charts.1.4 The preparation of control charts is d
4、escribed.1.5 LimitationsThe procedures that are described do notapply to analyses that require a calibration each time a set ofanalyses is run. Reference is made specifically to opticalemission spectroscopy, but the practice has a more generalapplication.1.6 This practice does not apply to validatio
5、n proceduresthat monitor the correctness of calibration.2. Referenced Documents2.1 ASTM Standards:2E 135 Terminology Relating to Analytical Chemistry forMetals, Ores, and Related MaterialsE 158 Practice for Fundamental Calculations to ConvertIntensities into Concentrations in Optical Emission Spec-t
6、rochemical Analysis3E 305 Practice for Establishing and Controlling Spectro-chemical Analytical Curves3E 456 Terminology Relating to Quality and StatisticsE 876 Practice for Use of Statistics in the Evaluation ofSpectrometric Data32.2 Other ASTM Documents:MNL 7 Manual on Presentation of Data and Con
7、trol ChartAnalysis43. Terminology3.1 DefinitionsFor definitions of terms used in this prac-tice, refer to Terminologies E 135 and E 456 and PracticeE 876. Refer also to the glossary of terms and symbolsappearing in MNL 7.43.2 Definitions of Terms Specific to This Standard:3.2.1 control limitsin cont
8、rol charts, the upper and lowerlimits of a statistic that are not expected to be exceeded,designated as UCL and LCL respectively in this practice. Forthe statistic that is the average of more than one reading ordetermination, the upper and lower limits will be equidistantfrom a central line (CL) rep
9、resenting the expected average. Forthe statistic of either standard deviation or range, the upperlimit will be farther from the central line if the lower limit iszero.3.2.2 normalizationa procedure for correcting readings toa common basis. A special case of normalization is standard-ization in which
10、 readings are made to conform to an existingcalibration. Normalization permits gathering data in differentperiods of time and correcting for drift in a way that may beindependent of standardization routines.3.2.3 variationdifference in an observed value from anorm.3.2.3.1 assignable causevariation w
11、hich can be identifiedand corrected. It may be the result of a condition of aninstrument or a method of operation. For example, signalintensities may be affected because a spectrometer is notprofiled properly.3.2.3.2 chance or common causerandom variation whichconsistently affects a system, contribu
12、ting to the imprecision ina predictable way. In the application of control charts, theassumption is made that chance causes of variation arenormally distributed.4. Significance and Use4.1 Consistency in analysis depends on being aware of asignificant change in instrumental response, such as that cau
13、sedby drift or changes in analytical precision, or both, and takingcorrective action. The usual corrective action for drift isstandardization. Standardization, however, when there is noreal need, can only broaden the spread of subsequent analyses.1This practice is under the jurisdiction of ASTM Comm
14、ittee E01 on AnalyticalChemistry for Metals, Ores, and Related Materials and is the direct responsibility ofSubcommittee E01.22 on Laboratory Quality.Current edition approved May 1, 2005. Published June 2005. Originallyapproved in 1990. Last previous edition approved in 2000 as E 1329 00.2For refere
15、nced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Withdrawn.4ASTM Manual Series, ASTM, 6th edition, 1990.1Copyright ASTM
16、International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.One purpose of this practice is to set guidelines that will avoid“ overstandardization.”4.2 To control manufacturing processes, there must beconfidence that a consistent material is being produced and
17、thatthe analysis of the material is reliable. For assurance that thematerial meets specification, a purchaser may require thesupporting record of control charts to assess that properanalytical control has been maintained.4.3 Ideally, variations in analytical results may be held tochance causes. The
18、concept of a confidence interval or limitson a control chart is based on what can be expected when allnormal precautions are exercised. When results appear to goout of control, the analyst should consider and correct whatmight be an assignable cause. As experience is accumulated,however, it may not
19、seem unusual for readings to drift withtime as optics degrade, detector response changes, or excita-tions modify as, for example, when deposits build up on acounter electrode (a correctable assignable cause), or thelonger range effects as an X-ray tube deteriorates.5. Problems in Applying Control5.1
20、 A complication in effecting verification control or inusing control charts with spectrochemical analyses is that themeasurements being taken are not absolute. Determinationsdepend upon comparisons of one measurement to another: therelative intensity of an analytical line to the relative intensity o
21、fan internal standard line in optical emission spectroscopy; theinterrelationship of counts in X-ray spectroscopy under somespecified condition of maintaining a fixed intensity from anirradiating source and holding to a consistent response from adetector with or without pulse height analyzers and wi
22、th orwithout an external monitor; the nonlinear relationship ofemulsion blackening to radiation in photographic measure-ments; and the relative response in integrating for fixed timeswith ostensibly constant radiation sources. Added to these isthe complication of background signal in all techniques.
23、5.2 It is important to recognize that there are several sourcesof random variation, including variations from the measuringmethod as well as inhomogeneity in the specimens. The devicebeing used to test analytical response is the analytical systemitself. This differs from normal statistical process c
24、ontrol wherean independent and usually more accurate measuring device isused to verify the process variability.6. Verifiers6.1 It is recommended that readings for all potential verifi-ers as well as standardants be established by measuring themalong with the calibrants.6.1.1 Ideally, the full set of
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