ARMY MIL-DTL-62740 A-1998 PRINTED WIRING ASSEMBLY SPECIAL CIRCUITS《专用线路印刷线路装配》.pdf
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1、 flIL-DTL-627LIOA 9999906 2059338 933 I INCH-POUND I 23 Janwy 1998 SUPERSEDING 16 March 1992 MILDTL-6274OA(AT) MIL-P-62740( AT) DETAIL SPECIFICATION PRINTED W“G ASSEMBLY, SPECIAL CIRCUITS This specification is approved for use by U.S. Army Tank-automotive and Armaments Command, Department of the Arm
2、y, and is available for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers a Special Circuits Printed Wig Assembly referred to herein as the PWA. This is one of six printed wiring assemblies which comprise the Simplified Test Equipmenthter
3、nal Combustion Engine-Reprogrammable (STEfiCE-R) Vehicle Test Meter (VIM) (see Drawing 12259265). 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents in other sections of this speci
4、fication or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet a specified requirement documents cited in sections 3 and 4 of this specification, whether or not they are lis
5、ted. Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: U.S. Army Tank-automotive and Armaments Command, ATTN: AMSTA-TR-EBLUE, Warren, MI 48397-5000, by using the Standardization Document Improveme
6、nt Proposal (DD Form 1426) appearing at the end of this document, or by letter. I AMSC NIA FSC 5998 DISTRIBUTION STATEME“ A. Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-b2740A M 9999
7、906 2059319 87T M 2.2 Government documents. 2.2.1 Specifications. standards. and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of t
8、he Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation (see 6.2). STANDARDS DEPARTMENT OF DEFENSE MIL-STD-810 - Environmental Test Methods and Engineering Guidelines (see 4.2.1). (Unless otherwise indicated, copies of the above speci
9、fications, standards, and handbooks are available fkom the Stanhdization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 191 11-5094.) 2.2.2 ther Government documents. drawings. and publications. The following other Government documents, drawings, and publications form a part
10、of this document to the extent specified herein. Unless otherwise spded, the issues are those cited in the solicitation. -_ DRAWINGS DEPARTMENT OF DEFENSE 12258774 - Printed Wiring Assembly, Special Circuits. (Copies of these drawings are available fiom the U. S. Army Tank-automotive and Armaments C
11、ommand, AMSTA-TR-EBLUE, Warren, MI 48397-5000.) 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specilied, the issues of the documents which are DoD adopted are those listed in the issue of the DoDISS cited in the
12、 solicitation. Unless otherwise specified, the issues of documents not listed in the DoDISS are the issues of the documents cited in the solicitation (see 6.2). AMERICAN NATIONAL STANDARD INSTITUTE (ANSI) ANSI/IPC J-STD-O01 - Requirements for Soldered Electrical and Electronic Assemblies. 2 Provided
13、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-bZ740A = 99999Ob 2059320 591 Source P1-5,6 (Application for copies should be addressed to American National Standard Institute, 11 West 42nd Street, New York, NY 10036.) Voltage CW select. When a logic
14、level O is present at U21 pins 1 1, 10, and 9, the frequency of the signal at U21 pin 14 shall be the same as the frequency of the signai at U9 pins 14 and 15. The signal at U21 pin 14 shall be at Pl-64 no greater than 250 11s later. When a logic level O is present at U21 pins 10 and 9 and a logic l
15、evel 1 is present at U21 pin 11, the frequency of the signal at U21 pin 14 shall be the same as the fi-equency of the signal at U3 pin 7. The signal at U21 pin 14 shall be at Pl-64 no greater than 250 11s later. 3.3.10 Test push button debouncer. With a logic level O at Pl-50 and Pl-52 not connected
16、, U6 pin 3 and Pl-56 shall be at logic level O. When a logic level O is applied at Pl-52 and Pl-50 is open-circuited, U6 pin 3 and Pl-56 shall change to a logic level 1 in no greater than 400 ns. When a logic level O is applied at Pl-50 and Pl-52 is open-circuted, U6 pin 3 and Pl-56 shall change to
17、a logic level O in no greater than 400 ns. 3.3.11 Microprocessor interrupt. 3.3.1 1.1 Microprocessor interrupt signal. With a logic level 1 present at U6 pin 5, a logic level O shall appear at Pl-62 no greater than 1050 ns after the rising edge of the signal at U6 pin 3. With a logic level 1 present
18、 at U6 pin 9, a logic level O shall appear at P1-62 no greater than 1050 11s after the rising edge of the signai at U6 pin 11. A logic level O shall appear at Pl-60 no greater than 300 ns after the rising edge of the Signai at U6 pin 1 1. 3.3.1 1.2 Interrupt reset. When a logic level 1 is applied at
19、 P 1-99, a logic level 1 shall appear at Pl-62 no greater than 330 ns later. 3.3.12 Ignition signal pulse slxmer. The frequency of the signai at U3 pin 6 shall be the same as the fi-equency of a signal applied at Pl-86. The fi-equency can range from 2 Hertz (Hi) to 700 Hz. The rising edge of the sig
20、nal at U3 pin 6 shall occur between 3 1.3 and 63.2 microseconds (ps) - environment reauirements verification. The electrical performance tests specified in 4.2.3 through 4.2.3.17 shall be conducted prior to and at the completion of each environmental test. Verification of performance during the high
21、 temperature and low temperature 15 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-b27YOA m 999990b 2059333 LYT m environmental tests shall be demonstrated by the tests specified in 4.2.3.1,4.2.3.5,4.2.3.6, 4.2.3.7, and4.2.3.16. 4.2.6.1 Temp
22、erature. To determine conformance to 3.6.1, the PWA shall be tested as follows: 4.2.6.1.1 Hi U1 1, U12) provides -3.75 to 3.75 Vdc according to a 10-bit binary input. A four input digital Multiplexor (U3) can be controlled to route signals through a Divide by n+l Counter (US), which can selectively
23、divide the input frequency by any number fiom 1 to 64. A Test Push Button Debouncer (U6, U7) provides a clean signai for the microprocessor interrupt signal and an event flag. The output of the Multiplexor or the Divide by 17 Provided by IHSNot for ResaleNo reproduction or networking permitted witho
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