IEEE 1332-2012 en Reliability Program for the Development and Production of Electronic Products《电子产品生产和开发的电气与电子工程师学会(IEEE)标准可靠性程序》.pdf
《IEEE 1332-2012 en Reliability Program for the Development and Production of Electronic Products《电子产品生产和开发的电气与电子工程师学会(IEEE)标准可靠性程序》.pdf》由会员分享,可在线阅读,更多相关《IEEE 1332-2012 en Reliability Program for the Development and Production of Electronic Products《电子产品生产和开发的电气与电子工程师学会(IEEE)标准可靠性程序》.pdf(25页珍藏版)》请在麦多课文档分享上搜索。
1、IEEE Standard Reliability Program forthe Development and Production of Electronic Products Sponsored by the Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 16 January 2013 IEEE Reliability Society IEEE Std 1332-2012 (Revision of IEEE Std 1332-1998) IEEE Std 1332-2012 (Revision of
2、IEEE Std 1332-1998) IEEE Standard Reliability Program for the Development and Production of Electronic Products Sponsor Standards Committee of the IEEE Reliability Society Approved 5 December 2012 IEEE-SA Standards Board Approved 28 October 2014American National Standards InstituteAbstract: A standa
3、rd set of reliability program objectives for use between customers and producers, or within product development teams, to express reliability program requirements early in the development phase of electronic products and systems is provided in this document. Keywords: electronic equipment, electroni
4、c systems, electronics, IEEE 1332, reliability, reliability program, reliability program standard The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved.
5、 Published 16 January 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 201
6、3 IEEE. All rights reserved. iv Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers o
7、f the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This documen
8、t is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document a
9、vailable for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or
10、may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given documen
11、t is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the
12、IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata perio
13、dically. Copyright 2013 IEEE. All rights reserved. v Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or vali
14、dity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may i
15、ndicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Cl
16、aims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or co
17、nditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is
18、 entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. viParticipants At the time this IEEE standard was completed, the Reliability Assessment Working Group had the following membership: Michael Pecht, Ph
19、. D., Chair Michael H. Azarian, Ph. D., Vice Chair Louis J. Gullo, Sponsor Committee Chair and SA Liaison Lori Bechtold Joseph Childs Michael Cushing, Ph. D. Diganta Das, Ph. D. Carla Head Tyrone Jackson Jason Mackinlay Keith Moore Timothy Pohland Fred Schenkelberg Benjamin Werner The following memb
20、ers of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Satish Aggarwal James Arnold Michael H. Azarian, Ph. D. Hugh Barrass Michael Basler Thomas Basso Lori Bechtold Wallace Binder Pieter Botman Bill Brown Malcom Brown Gus
21、tavo Brunello William Byrd Paul Cardinal Juan Carreon Joseph Childs Keith Chow Michael Cushing, Ph. D. Diganta Das, Ph. D. Ratan Das Matthew Davis Ray Davis Patrick Diamond Thomas Dineen Neal Dowling Gary Engmann David Fuschi David Gilmer James Gleason Chris Gorringe Lowell Goudge Randall Groves Lou
22、is J. Gullo Michael Gundlach Werner Hoelzl D. Hoffman Gary Hoffman Akio Iso Atsushi Ito Kenneth Karg Stuart Kerry Yuri Khersonsky Yongbum Kim Joseph L. Koepfinger Jim Kulchisky Saumen Kundu Greg Luri Ahmad Mahinfallah Edward McCall Georges Montillet Jeffrey Moore R. Murphy Ryan Musgrove Michael S. N
23、ewman Ted Olsen William Petit Annette Reilly Ted Riccio Michael Roberts Sergio Santos Bartien Sayogo Robert Schaaf Fred Schenkelberg Stephen Schwarm Alexander Sinyak Jeremy Smith Jerry Smith Joseph Stanco Walter Struppler William Taylor Eric Udren Srinivasa Vemuru John Vergis Hung-Yu Wei Matthew Wil
24、kowski Forrest Wright Oren Yuen Daidi Zhong Copyright 2013 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this standard on 5 December 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Karachalios,
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