SANS 3882-2008 Metallic and other inorganic coatings - Review of methods of measurement of thickness《金属及其他无机涂层 厚度测量方法综述》.pdf

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1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-21920-8 SANS 3882:2008Edition 2 ISO 3882:2003Edition 3SOUTH AFRICAN NATIONAL STANDARD Metallic and other inorganic coatings Review of meth

4、ods of measurement of thickness This national standard is the identical implementation of ISO 3882:2003 and is adopted with the permission of the International Organization for Standardization. Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 1

5、2 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 3882:2008 Edition 2 ISO 3882:2003 Edition 3 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee SABS TC 107, Metallic and other inorganic coatings, in accordance with procedur

6、es of the SABS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in November 2008. This SANS document supersedes SABS ISO 3882:1986 (first edition). Reference numberISO 3882:2003(E)ISO 2003INTERNATIONAL STANDARD ISO3882Third edition2003-04-15Me

7、tallic and other inorganic coatings Review of methods of measurement of thickness Revtements mtalliques et autres revtements inorganiques Vue densemble sur les mthodes de mesurage de lpaisseur SANS 3882:2008This s tandard may only be used and printed by approved subscription and freemailing clients

8、of the SABS .ISO 3882:2003(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editi

9、ng. In downloading this file, parties accept therein the responsibility of not infringing Adobes licensing policy. The ISO Central Secretariat accepts no liability in this area. Adobe is a trademark of Adobe Systems Incorporated. Details of the software products used to create this PDF file can be f

10、ound in the General Info relative to the file; the PDF-creation parameters were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at t

11、he address given below. ISO 2003 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below

12、or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2003 All rights reservedSANS 3882:2008This s tandard may only be used and p

13、rinted by approved subscription and freemailing clients of the SABS .ISO 3882:2003(E) ISO 2003 All rights reserved iiiContents Page Foreword iv Introduction v 1 Scope 1 2 Normative references . 1 3 Terms and definitions. 2 4 Non-destructive methods. 2 4.1 Split beam microscope (light section) method

14、, ISO 2128. 2 4.2 Magnetic methods, ISO 2178 and ISO 2361 2 4.3 Eddy current method, ISO 2360. 3 4.4 X-ray spectrometric methods, ISO 3497. 3 4.5 Beta backscatter method, ISO 3543 3 5 Destructive methods. 4 5.1 Microscopical (optical) method, ISO 1463 4 5.2 Fizeau multiple-beam interferometry method

15、, ISO 3868. 4 5.3 Profilometric (stylus) method, ISO 4518. 4 5.4 Scanning electron microscope method, ISO 9220 4 5.5 Dissolution methods. 5 5.5.1 Coulometric method, ISO 2177 5 5.5.2 Gravimetric (strip and weigh) method, ISO 10111. 5 5.5.3 Gravimetric (analytical) method, ISO 10111. 5 Bibliography .

16、 9 SANS 3882:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3882:2003(E) iv ISO 2003 All rights reservedForeword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO mem

17、ber bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmen

18、tal and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Direc

19、tives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodi

20、es casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 3882 was prepared by Technical Committee ISO/TC 107, Metallic and other inorga

21、nic coatings, Subcommittee SC 2, Test methods. This third edition cancels and replaces the second edition (ISO 3882:1986), which has been technically revised. SANS 3882:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3882:2003(E) ISO

22、2003 All rights reserved vIntroduction This International Standard summarizes the various methods used for the measurement of coating thickness and describes their working principles. Methods of measuring coating thickness may be either destructive or non-destructive (see Table 1). The information g

23、iven in Table 2 will assist in the choice of typical instrumental methods suitable for thickness measurements. For all instrumental methods, manufacturers instructions should be followed. The thickness ranges covered by the different methods depend on the coating materials, thickness of the coating,

24、 substrates and instruments used (see Table 3); e.g., although X-ray spectrometry can be used to measure the thickness of a chromium coating, thicknesses of 20 m or more cannot be measured with sufficient precision. Similarly, while magnetic methods may be used to measure the thickness of a gold coa

25、ting over a magnetic steel substrate, many magnetic instruments do not have the sensitivity to measure accurately thicknesses of gold coatings less than 2 m. Where a referee method is required the appropriate coating specification should be consulted. SANS 3882:2008This s tandard may only be used an

26、d printed by approved subscription and freemailing clients of the SABS .SANS 3882:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .INTERNATIONAL STANDARD ISO 3882:2003(E) ISO 2003 All rights reserved 1Metallic and other inorganic coatings

27、Review of methods of measurement of thickness 1 Scope This International Standard reviews methods for measuring the thickness of metallic and other inorganic coatings on both metallic and non-metallic substrates (see Tables 1, 2 and 3). It is limited to tests already specified, or to be specified, i

28、n International Standards, and excludes certain tests that are used for special applications. Table 1 Methods of measuring coating thickness Non-destructive Destructive Split beam microscope (light section) ISO 2128 aMicroscopical (optical) ISO 1463 Magnetic ISO 2178 and ISO 2361 Fizeau multiple-bea

29、m interferometry ISO 3868 bEddy current ISO 2360 Profilometric (stylus) ISO 4518 bX-ray spectrometric ISO 3497 Scanning electron microscope ISO 9220 Beta backscatter ISO 3543 Dissolution methods: Gravimetic strip and weigh method and gravimetric analytical method ISO 10111 Coulometric method ISO 217

30、7 aCan be destructive in some applications. bCan be non-destructive in some applications. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition

31、 of the referenced document (including any amendments) applies. ISO 1463, Metallic and oxide coatings Measurement of coating thickness Microscopical method ISO 2064, Metallic and other inorganic coatings Definitions and conventions concerning the measurement of thickness ISO 2128, Anodizing of alumi

32、nium and its alloys Determination of thickness of anodic oxide coatings Non-destructive measurement by split-beam microscope ISO 2177, Metallic coatings Measurement of coating thickness Coulometric method by anodic dissolution ISO 2178, Non-magnetic coatings on magnetic substrates Measurement of coa

33、ting thickness Magnetic method ISO 2360, Non-conductive coatings on non-magnetic basis materials Measurement of coating thickness Amplitude-sensitive eddy current method ISO 2361, Electrodeposited nickel coatings on magnetic and non-magnetic substrates Measurement of coating thickness Magnetic metho

34、d SANS 3882:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3882:2003(E) 2 ISO 2003 All rights reservedISO 3497, Metallic coatings Measurement of coating thickness X-ray spectrometric methods ISO 3543, Metallic and non-metallic coatin

35、gs Measurement of thickness Beta backscatter method ISO 3868, Metallic and other non-organic coatings Measurement of coating thicknesses Fizeau-multiple beam interferometry method ISO 4518, Metallic coatings Measurement of coating thickness Profilometric method ISO 9220, Metallic coatings Measuremen

36、t of coating thickness Scanning electron microscope method ISO 10111, Metallic and other inorganic coatings Measurement of mass per unit area Review of gravimetric and chemical analysis methods 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 2064 app

37、ly. 4 Non-destructive methods 4.1 Split beam microscope (light section) method, ISO 2128 This equipment, originally designed for the measurement of surface roughness, is used for measuring the thickness of transparent and translucent coatings, in particular, anodic oxide coatings on aluminium. A lig

38、ht beam is projected on to the surface at an angle of 45. Part of the beam is reflected from the surface of the coating and the rest penetrates the coating and is reflected from the coating/metal substrate interface. The distance that separates the two images observed in the eyepiece of the microsco

39、pe is proportional to the thickness of the coating and can be measured by means of a vernier screw which controls a calibrated graticule. The method can be used where sufficient light is reflected from the coating/metal substrate interface to give a clear image in the microscope. For transparent or

40、translucent coatings, such as anodic oxide films, this method is non-destructive. For measuring the thickness of opaque coatings, a small area of the coating is removed and in this application the method is destructive. The step between the surface of the coating and the basis metal produces a defle

41、ction of the light beam which gives an absolute measure of the coating thickness. The method is not suitable for hard anodic coatings or for coatings that are very thin (less than 2 m thick), very thick (greater than 100 m thick) or rough. It is not suitable for coatings on heavily shot-blasted surf

42、aces. Other methods such as eddy current (ISO 2360), interference microscope (ISO 3868) and microscopical (ISO 1463) may be applicable for thickness measurement where the split beam microscope method cannot be used. The method is best suited to small parts because of the ease with which they can be

43、set up on the microscope stage. The measurement uncertainty of the method is usually less than 10 % of the thickness. 4.2 Magnetic methods, ISO 2178 and ISO 2361 Instruments for these methods measure either the magnetic attraction between a magnet and the basis metal, as influenced by the presence o

44、f the coating, or the reluctance of a magnetic flux path passing through the coating and the basis metal. All instruments using magnetic methods are sensitive to the magnetic condition and properties of the test specimen, surface curvature, surface cleanliness, surface roughness, and thickness of th

45、e basis metal and of the coating. SANS 3882:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3882:2003(E) ISO 2003 All rights reserved 3These methods are limited in practice to non-magnetic coatings on a magnetic substrate (see ISO 217

46、8) and to electroplated nickel coatings on a magnetic or non-magnetic substrate (see ISO 2361). The measurement uncertainty of the method is less than 10 % of the thickness or 1,5 m, whichever is the greater. 4.3 Eddy current method, ISO 2360 ISO 2360 describes an amplitude method and is based on di

47、fferences in electrical conductivity between coatings and substrates. The method is used primarily for measuring the thickness of non-conductive coatings on non-magnetic metals and of single layer metal coatings on non-conductors. If this method is used for measuring thicknesses of metallic coatings

48、 on metallic substrates, great care is necessary if acceptable results are to be obtained. The method is ideal for rapid determination of anodic coating thickness measurements on aluminium and its alloys and is well suited for use in field measurements. For autocatalytic nickel coatings, this method

49、 gives erratic measurements due to variations in conductivity of the coatings with changes in phosphorous content. ISO 2360 only covers the measurement of the thickness of a non-conductive coating on a non-magnetic basis metal. The measurement uncertainty of the method is usually less than 10 % of the thickness or 0,5 m, whichever is the greater. 4.4 X-ray spectrometric methods, ISO 3497 These methods use emission and absorption X-ray spectrometry for determining the thickness of