SANS 3543-2008 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method《金属及非金属镀层 厚度测量 贝塔反向散射法》.pdf

《SANS 3543-2008 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method《金属及非金属镀层 厚度测量 贝塔反向散射法》.pdf》由会员分享，可在线阅读，更多相关《SANS 3543-2008 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method《金属及非金属镀层 厚度测量 贝塔反向散射法》.pdf（23页珍藏版）》请在麦多课文档分享上搜索。

1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-21916-1 SANS 3543:2008Edition 2 and ISO tech. corr. 1ISO 3543:2000Edition 2 and tech. corr. 1SOUTH AFRICAN NATIONAL STANDARD Metallic and

4、non-metallic coatings Measurement of thickness Beta backscatter method This national standard is the identical implementation of ISO 3543:2000 and ISO technical corrigendum 1, and is adopted with the permission of the International Organization for Standardization. Published by SABS Standards Divisi

5、on 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 3543:2008 Edition 2 and ISO tech. corr. 1 ISO 3543:2000 Edition 2 and tech. corr. 1 Table of changes Change No. Date Scope ISO tech. corr. 1 2003 Corrected to modify the f

6、ormula in the counting statistics and to modify figure A.1. National foreword This South African standard was approved by National Committee SABS TC 107, Metallic and other inorganic coatings, in accordance with procedures of the SABS Standards Division, in compliance with annex 3 of the WTO/TBT agr

7、eement. This SANS document was published in November 2008. This SANS document supersedes SABS ISO 3543:1981 (first edition). ICS 25.220.20; 25.220.40 Ref. No. ISO 3543:2000/Cor.1:2003(E) ISO 2003 All rights reserved Published in Switzerland INTERNATIONAL STANDARD ISO 3543:2000 TECHNICAL CORRIGENDUM

8、1 Published 2003-12-01 INTERNATIONAL ORGANIZATION FOR STANDARDIZATION ORGANISATION INTERNATIONALE DE NORMALISATIONMetallic and non-metallic coatings Measurement of thickness Beta backscatter method TECHNICAL CORRIGENDUM 1 Revtements mtalliques et non mtalliques Mesurage de lpaisseur Mthode par rtrod

9、iffusion des rayons bta RECTIFICATIF TECHNIQUE 1 Technical Corrigendum 1 to ISO 3543:2000 was prepared by Technical Committee ISO/TC 107, Metallic and other inorganic coatings, Subcommittee SC 2, Test methods. Page 6 Subclause 5.1, paragraph 2, line 3 shall read it is often helpful to express the st

10、andard deviation as a percentage of the count, that is 100 /XX, or 100 / X . Page 14 Figure A.1: the isotopes shall be indicated against each curve; in descending order they are: Ru-106 Sr-90 Bi-210 Ti-204 Pm-147 C-14 SANS 3543:2008This s tandard may only be used and printed by approved subscription

11、 and freemailing clients of the SABS .This page is intentionally left blankSANS 3543:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .Reference numberISO 3543:2000(E)ISO 2000INTERNATIONALSTANDARDISO3543Second edition2000-12-15Metallic and

12、non-metallic coatings Measurement of thickness Betabackscatter methodRevtements mtalliques et non mtalliques Mesurage de lpaisseur Mthode par rtrodiffusion des rayons betaSANS 3543:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3543:

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15、tive to the file; the PDF-creation parameterswere optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely eventthat a problem relating to it is found, please inform the Central Secretariat at the address given below. ISO 200

16、0All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronicor mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member bodyin the country

17、 of the requester.ISO copyright officeCase postale 56 Gb7 CH-1211 Geneva 20Tel. + 41 22 749 01 11Fax + 41 22 749 09 47E-mail copyrightiso.chWeb www.iso.chPrinted in Switzerlandii ISO 2000 All rights reservedSANS 3543:2008This s tandard may only be used and printed by approved subscription and freema

18、iling clients of the SABS .ISO 3543:2000(E) ISO 2000 All rights reserved iiiContents PageForeword.iv1 Scope 12 Terms and definitions .13 Principle44 Apparatus .65 Factors relating to measurement uncertainty 66 Calibration of instruments 97 Measuring procedure 108 Measurement uncertainty .119 Test re

19、port 11Annex A (informative) General information13SANS 3543:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3543:2000(E)iv ISO 2000 All rights reservedForewordISO (the International Organization for Standardization) is a worldwide fed

20、eration of national standards bodies (ISOmember bodies). The work of preparing International Standards is normally carried out through ISO technicalcommittees. Each member body interested in a subject for which a technical committee has been established hasthe right to be represented on that committ

21、ee. International organizations, governmental and non-governmental, inliaison with ISO, also take part in the work. ISO collaborates closely with the International ElectrotechnicalCommission (IEC) on all matters of electrotechnical standardization.International Standards are drafted in accordance wi

22、th the rules given in the ISO/IEC Directives, Part 3.Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.Attention is drawn to

23、the possibility that some of the elements of this International Standard may be the subject ofpatent rights. ISO shall not be held responsible for identifying any or all such patent rights.International Standard ISO 3543 was prepared by Technical Committee ISO/TC 107, Metallic and other inorganiccoa

24、tings, Subcommittee SC 2, Methods of inspection and coordination of test methods.This second edition cancels and replaces the first edition (ISO 3543:1981), which has been technically revised.Annex A of this International Standard is for information only.SANS 3543:2008This s tandard may only be used

25、 and printed by approved subscription and freemailing clients of the SABS .INTERNATIONAL STANDARD ISO 3543:2000(E) ISO 2000 All rights reserved 1Metallic and non-metallic coatings Measurement of thickness Beta backscatter method1 ScopeWARNING Beta backscatter instruments used for the measurement of

26、coating thicknesses use a numberof different radioactive sources. Although the activities of these sources are normally very low, they canpresent a hazard to health, if incorrectly handled. Therefore, reference should be made to currentinternational and national standards, where these exist.This Int

27、ernational Standard specifies a method for the non-destructive measurement of coating thicknesses usingbeta backscatter gauges. It applies to both metallic and non-metallic coatings on both metallic and non-metallicsubstrates. To make use of this method, the atomic numbers or equivalent atomic numbe

28、rs of the coating and thesubstrate need to differ by an appropriate amount.NOTE Since the introduction of the X-ray fluorescence method (ISO 3497), the beta backscatter method has been usedless and less for the measurement of coating thickness. However, because of its lower cost, it is still a very

29、useful method ofmeasurement for many applications. In addition it has a wider measuring range.2 Terms and definitionsFor the purposes of this International Standard, the following terms and definitions apply.2.1radioactive decayspontaneous nuclear transformation in which particles or gamma radiation

30、 are emitted or X-radiation is emittedfollowing orbital electron capture, or the nucleus undergoes spontaneous fissionISO 921:1997, definition 9722.2beta particleelectron or positron which has been emitted by an atomic nucleus or neutron in a nuclear transformationISO 921:1997, definition 812.3beta-

31、emitting isotopebeta-emitting sourcebeta emittermaterial, the nuclei of which emit beta particlesNOTE 1 It is possible to classify beta emitters by the maximum energy level of the particles that they release during theirdisintegration.NOTE 2 Table A.1 lists some isotopes used with beta backscatter g

32、auges.SANS 3543:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3543:2000(E)2 ISO 2000 All rights reserved2.4electron-voltunit of energy equal to the change in energy of an electron in passing through a potential difference of 1 VNOTE

33、 1 1 eV = 1,602 19 Gb4 10G2d19JISO 921:1997, definition 393NOTE 2 Since the electron-volt is too small for the energies encountered with beta particles, the mega-electron-volt (MeV) iscommonly used.2.5activitydisintegration ratenumber of spontaneous nuclear disintegrations occurring in a given quant

34、ity of material during a suitably smallinterval of time divided by that interval of timeISO 921:1997, definition 23NOTE 1 In beta backscatter measurements a higher activity corresponds to a greater emission of beta particles.NOTE 2 The SI unit of activity is the becquerel (Bq). The activity of a rad

35、ioactive element used in beta backscatter gauges isgenerally expressed in microcuries (G6dCi) (1 G6dCi = 3,7 Gb4 104Bq, which represents 3,7 x 104disintegrations per second).2.6radioactive half-lifetime required for the activity to decrease to half its value by a single radioactive decay processISO

36、921:1997, definition 9752.7scatteringprocess in which a change in direction or energy of an incident particle or incident radiation is caused by a collisionwith a particle or a system of particlesISO 921:1997, definition 10852.8backscatterscattering as a result of which a particle leaves a body of m

37、atter from the same surface at which it enteredNOTE Radiations other than beta rays are emitted or backscattered by a coating and substrate and some of these can beincluded in the backscatter measurement. In this International Standard the term “backscatter” is used to mean the totalradiation measur

38、ed.2.9backscatter coefficient (of a body)Rratio of the number of particles backscattered to that entering the bodyNOTE The value of R is independent of the activity of the isotope and of the measuring time.SANS 3543:2008This s tandard may only be used and printed by approved subscription and freemai

39、ling clients of the SABS .ISO 3543:2000(E) ISO 2000 All rights reserved 32.10backscatter count2.10.1absolute backscatter countXnumber of particles backscattered during a fixed interval of time, and received by a detectorNOTE X depends on the activity of the isotope, the measuring time, the geometric

40、 configuration of the measuring systemand the properties of the detector. The count produced by the uncoated substrate is generally designated by Xo, and that of thecoating material by Xs. To obtain these values, both these materials have to be available with a thickness greater than thesaturation t

41、hickness (see 2.13).2.10.2normalized backscatter countXnquantity that is independent of the activity of the isotope, the measuring time and the properties of the detector anddefined by the equation:onsoXXXXXG2dG3dG2dwhereXois the absolute backscatter count of the saturation thickness of the substrat

42、e material;Xsis the absolute backscatter count of the saturation thickness of the coating material;X is the absolute backscatter count of the coated specimen;each of these counts being taken over the same interval of timeNOTE 1 The value of Xnis valid between 0 and 1.NOTE 2 For simplicity, it is oft

43、en advantageous to express the normalized backscatter count as a percentage by multiplyingXnby 100.2.11normalized backscatter curvecurve obtained by plotting the coating thickness as a function of Xn2.12equivalent (apparent) atomic numberfor a material, which can be an alloy or a compound, the atomi

44、c number of an element that has the samebackscatter coefficient R as the material2.13saturation thicknessminimum thickness of a material that, if exceeded, does not produce a change in backscatterNOTE Figure A.1 shows saturation thickness, s, plotted as a function of density for different isotopes.S

45、ANS 3543:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 3543:2000(E)4 ISO 2000 All rights reserved2.14sealed sourceradioactive source sealed in a container or having a bonded cover, the container or cover being strong enough topreven

46、t contact with and dispersion of the radioactive material under the conditions of use and wear for which itwas designedISO 921:1997, definition 1094NOTE Also referred to as “sealed isotope”.2.15apertureopening of the mask abutting the test specimen and that determines the size of the area on which t

47、he coatingthickness is to be measuredNOTE This mask is also often referred to as a platen, an aperture platen or a specimen support.2.16source geometryspatial arrangement of the source, the aperture and the detector, with respect to each other2.17dead timetime period during which a Geiger-Mller dete

48、ctor is unresponsive to the receipt of further beta particles2.18resolving timerecovery time of the Geiger-Mller detector tube and associated electronic equipment during which the countingcircuit is unresponsive to further pulses2.19basis materialbasis metalmaterial upon which coatings are deposited

49、 or formedISO 2080:1981, definition 1342.20substratematerial upon which a coating is directly depositedNOTE For a single or first coating the substrate is identical with the basis material; for a subsequent coating theintermediate coating is the substrateISO 2080:1981, definition 6303PrincipleWhen beta particles impinge upon a material, a certain portion of particles is backscattered. This backscatter isessentially a function of the atomic number of the