SAE AS 6171-2016 Test Methods Standard General Requirements Suspect Counterfeit Electrical Electronic and Electromechanical Parts.pdf

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1、 SAE AS6171 ADOPTION NOTICE The document SAE AS6171, “Test Method Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts”, was adopted on 28 March 2017 for use by the Department of Defense (DoD). Proposed changes by DoD activities must be submitted t

2、o the DoD Adopting Activity: DLA Land and Maritime, Attn: VAS, P. O. Box 3990, Columbus, OH 43218-3990, or email to Hybriddla.mil. Copies of this document is available from SAE International, 400 Commonwealth Drive, Warrendale, PA 15096-0001, www.sae.org. CONCLUDING MATERIAL Custodians: Adopting act

3、ivity: Air Force - 85 DLA - CC Navy - SH DLA - CC (Project SESS-2017-009) Review activities: Navy MC, SA NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the info

4、rmation above using the ASSIST Online database at https:/assist.dla.mil. AMSC N/A FSC SESS Source: https:/assist.dla.mil - Downloaded: 2017-05-08T15:28ZCheck the source to verify that this is the current version before use.Access to Additional Content for SAE AS6171, Dated: October 2016 (Click here

5、to view the publication) This Page is not part of the original publication This page has been added by IHS as a convenience to the user in order to provide access to additional content as authorized by the Copyright holder of this document Click the link(s) below to access the content and use normal

6、 procedures for downloading or opening the files. AS6171 Information contained in the above is the property of the Copyright holder and all Notice of Disclaimer General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts RATIONALE This standard was created in respo

7、nse to a significant and increasing volume of Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts entering the aerospace supply chain, posing significant performance, reliability, and safety risks. This standard was created to provide uniform requirements, practices an

8、d methods for testing EEE parts to mitigate the risks of receiving or using SC EEE parts. FOREWORD To assure customer satisfaction, industry organizations must produce, and continually improve, safe, reliable products that meet or exceed customer and regulatory authority requirements. The globalizat

9、ion of industry and the resulting diversity of regional/national requirements and expectations has complicated this objective. End-product organizations face the challenge of ensuring the quality and integration of products purchased from suppliers throughout the world and at all levels within the s

10、upply chain. Suppliers and processors face the challenge of delivering products to multiple customers having varying quality expectations and requirements. This document standardizes requirements, practices, and methods for testing EEE parts and detecting Suspect/Counterfeit parts, to thereby ensure

11、 consistency across the supply-chain for test requirements. SAE INTERNATIONAL AS6171 Page 2 of 102 TABLE OF CONTENTS 1. SCOPE 4 1.1 Purpose . 4 1.2 Application . 5 1.3 Product Classification 5 1.3.1 Programmable Devices . 5 2. REFERENCES 5 2.1 Applicable Documents 5 2.1.1 SAE Publications . 5 2.1.2

12、Related Publications . 6 2.2 Terms and Definitions . 7 2.2.1 SUSPECT COUNTERFEIT PART 7 2.2.2 FRAUDULENT PART . 7 2.2.3 NONCONFORMING PART. 8 2.2.4 COUNTERFEIT PART 8 2.2.5 Related Terms and Definitions 10 2.3 Acronyms 23 3. GENERAL REQUIREMENTS AND RECOMMENDATIONS 27 3.1 Risk Assessment . 29 3.1.1

13、Risk Assessment Model 30 3.1.2 Model Design 30 3.1.3 Risk Characterization Scoring Worksheet 35 3.2 Test Sequence Overview 37 3.3 Testing Requirements and Minimum Tier Level Testing 37 3.4 Suspect/Counterfeit (SC) Part Detection Sequence . 37 3.5 Sampling Plan . 42 3.5.1 Standard Lot Sampling Plan .

14、 42 3.5.2 Small Lot Sampling Plan . 43 3.6 Test Plan . 45 3.7 Analysis and Interpretation of Test Results 45 3.7.1 Factors in Determination of Suspect/Counterfeit Parts . 46 3.8 Test Report . 47 3.9 Training, Qualification, and Certification . 48 3.9.1 Personnel Training, Qualification, and Certific

15、ation 48 3.9.2 Test Laboratory/Test Facility Resources 50 3.9.3 Test Laboratory Proficiency 50 3.9.4 Calibration . 51 3.9.5 Device Handling Requirements 51 3.9.6 Personnel Safety . 53 3.10 Data and Report Retention Requirements 53 3.11 Certificate of Quality Conformance (CoQC) Requirements 54 4. SUS

16、PECT/COUNTERFEIT PART DETECTION TEST METHODS. 54 4.1 Summary of Suspect/Counterfeit EEE Parts Detection Test Methods . 55 4.1.1 External Visual Inspection (EVI), AS6171/2 55 4.1.2 X-ray Fluorescence (XRF) Spectroscopy, AS6171/3 . 56 4.1.3 Delid/Decapsulation Physical Analysis (DDPA), AS6171/4 56 4.1

17、.4 Radiological (X-ray) Inspection, AS6171/5 . 56 4.1.5 Acoustic Microscopy, AS6171/6 . 56 4.1.6 Electrical, AS6171/7 56 4.1.7 Raman Spectroscopy, AS6171/8 57 4.1.8 Fourier Transform Infrared (FTIR) Spectroscopy, AS6171/9 57 4.1.9 Thermogravimetric Analysis (TGA), AS6171/10 . 57 4.1.10 Design Recove

18、ry, AS6171/11 . 58 SAE INTERNATIONAL AS6171 Page 3 of 102 5. MATERIAL CONTROL 58 5.1 Control of Nonconforming Parts and Scrap 58 5.1.1 Control of Suspect or Confirmed Counterfeit Parts 58 6. NOTES 58 6.1 Revision Indicator 58 APPENDIX A EEE PARTS AND DEVICES APPLICABILITY . 59 APPENDIX B RECOMMENDED

19、 TEST LAB HANDLING SET-UP INFORMATION FOR WORK AREAS UNDER CONDITIONS OF LOW RELATIVE HUMIDITY AND HANDLING SENSITIVE ESD DEVICES 60 APPENDIX C RISK SCORING EXAMPLES . 61 APPENDIX D ADDITIONAL TEST METHODS . 69 APPENDIX E TEST SEQUENCE RESULTS 73 TABLE 1 TIER LEVELS AND RISK SCORES . 30 TABLE 2 PROD

20、UCT RISK CATEGORIES AND VALUES 32 TABLE 3 COMPONENT RISK CATEGORIES AND VALUES . 33 TABLE 4 SUPPLIER RISK DEFINITION/SCORE 34 TABLE 5 RISK CHARACTERIZATION WORKSHEET 36 TABLE 6A MODELS OF TEST SEQUENCES TO ACHIEVE THE OVERALL DEFECT COVERAGE THRESHOLD FOR THE FIVE RISK TIER LEVELS - ACTIVE PARTS, CO

21、MPLEX. 39 TABLE 6B MODELS OF TEST SEQUENCES TO ACHIEVE THE OVERALL DEFECT COVERAGE THRESHOLD FOR THE FIVE RISK TIER LEVELS - ACTIVE PARTS, SIMPLE . 40 TABLE 7 MODELS OF TEST SEQUENCES TO ACHIEVE THE OVERALL DEFECT COVERAGE THRESHOLD FOR THE FIVE RISK TIER LEVELS - PASSIVE PARTS 41 TABLE 8 STANDARD L

22、OT SAMPLING PLAN 42 TABLE 9 SMALL LOT SAMPLING PLAN 43 TABLE 10 DETAILED SMALL LOT SAMPLING PLAN (SEE NOTES) . 44 TABLE 11 TEST PLAN INFORMATION 45 SAE INTERNATIONAL AS6171 Page 4 of 102 1. SCOPE 1.1 Purpose This SAE Aerospace Standard (AS) standardizes inspection and test procedures, workmanship cr

23、iteria, and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts. The requirements of this document apply once a decision is made to use parts with unknown chain of custody that do not have pedigree back to the o

24、riginal component manufacturer, or have been acquired from a broker or independent distributor, or when there are other known risk elements that result in the User/Requester to have concerns about potential SC EEE parts. The tests specified by this standard may also detect occurrences of malicious t

25、ampering, although the current version of this standard is not designed specifically for this purpose. This standard ensures consistency across the supply chain for test techniques and requirements based on assessed risk associated with the application, component, supplier, and other relevant risk f

26、actors. The requirements of this document supplement the requirements of a higher level quality standard (e.g., AS9100, AS9003, AS9120, ISO 9001) and other quality management system documents. They are not intended to stand alone, supersede, or cancel requirements found in other quality management s

27、ystem documents, or requirements imposed by contracting authorities. This standard should be implemented when other risk mitigation methods for avoiding the use of SC EEE parts (e.g., acquiring all parts from Authorized Sources, redesigning the system, having obsolete parts emulated, etc.) are eithe

28、r unavailable or inadequate. This standard mitigates the technical risk of performing insufficient inspection and test to determine suspect counterfeit EEE parts. This standard is not intended to be used to assess quality or reliability issues that may arise because of component production issues or

29、 due to mishandling, improper storage, or other attributes specific to quality or reliability. The following terminology is used throughout this document and associated AS6171 Slash Sheets: a. Shall = is mandatory; b. Should = is recommended; and c. Will = is planned (is considered to be part of a s

30、tandard process). This standard should be utilized when parts are not available from sources with known traceability to the Original Component Manufacturer (OCM), Original Equipment Manufacturer (OEM) for electromechanical parts, or authorized manufacturer. The requirements of this document specify

31、testing based on acceptable levels of risk for a program or customer, to identify anomalies or performance issues that may indicate suspect counterfeit and counterfeit activity. No amount of testing can confirm an item as authentic; this would require that there be a known, unbroken chain of custody

32、 to the OCM/OEM or authorized manufacturer. Therefore, organizations should attempt to obtain parts from sources that have known traceability to the OCM or authorized manufacturer to avoid receiving counterfeit parts. All intermediaries from the origin (i.e., OCM/OEM or authorized manufacturer) to t

33、he final destination should consist of Trusted Suppliers, and transportation should be provided by logistics carriers that have documented processes and procedures to avoid tampering or substitution during the journey to the parts final destination. A preference should be given to parts with known p

34、edigree over parts with unknown pedigree to avoid counterfeit parts. This standard does not apply to parts obtained directly from a Trustworthy Authorized Supplier with traceability to the OCM/OEM or authorized manufacturer. This standard does not have specific test methods to determine if an item i

35、s a Fraudulent Part beyond what is considered counterfeit. Test data on anomalies can be gathered for potential legal determination of fraudulent intent or negligence. This document does not make a legal determination of fraud, and appropriate legal counsel should be consulted for further action. Un

36、less otherwise specified in the SOW or PO by the User/Requester, the information in the Appendices is not considered mandatory. SAE INTERNATIONAL AS6171 Page 5 of 102 1.2 Application This document is intended for use in aviation, space, defense, and other high performance/reliability electronic equi

37、pment applications. Any other sector that is at risk for counterfeit EEE parts could adopt this standard to mitigate the concern. This standard is recommended for use by all contracting organizations that procure EEE parts and devices, whether such parts and devices are procured directly or integrat

38、ed into procured electronic assemblies or equipment. The requirements of this standard are generic and intended to be applied/flowed down to all organizations that procure EEE parts and devices. 1.3 Product Classification This standard applies to the Electrical, Electronic, and Electromechanical (EE

39、E) parts and devices that are outlined in the Applicability Matrix in Appendix A, Table A1. The test methods to be used in evaluating the part types are based upon inspection for material, construction, and function. Although the AS6171 test methods are not specifically designed to evaluate all EEE

40、parts, some of the evaluation techniques may be employed to investigate the authenticity of certain EEE parts. 1.3.1 Programmable Devices In the case of a programmed or programmable device containing non-volatile memory supplied to the Test Laboratory for evaluation, the Test Laboratory shall determ

41、ine if the device is programmed as directed by test requirements through a statement of work. If known, the User/Requester should indicate to the Test Laboratory if the part is programmed. If there is advanced knowledge that the part is programmed, the Cognizant Engineer should notify the Test Labor

42、atory with instruction on how to proceed. The programmed state of the device and the programmed device test method should be supplied to the Test Laboratory in the Test Requirements as part of the statement of work. The Test Laboratory shall indicate in the test report if they conducted a test for p

43、rogrammability or if the test laboratory has knowledge that the parts are programmed (e.g., the User/Requester indicated the parts are programmed). 2. REFERENCES 2.1 Applicable Documents The following publications form a part of this document to the extent specified herein. The latest issue of SAE p

44、ublications shall apply. The applicable issue of the other publications shall be the issue in effect on the date of the purchase order. In the event of conflict between the text of this document and references cited herein, the text of this document takes precedence, except that nothing in this docu

45、ment supersedes applicable laws and regulations unless a specific exemption has been obtained in writing from empowered authorities. 2.1.1 SAE Publications Available from SAE International, 400 Commonwealth Drive, Warrendale, PA 15096-0001, Tel: 877-606-7323 (inside USA and Canada) or +1 724-776-497

46、0 (outside USA), www.sae.org. AS6171 Slash Sheets. This standard is composed of a main document that is titled AS6171 Test Methods Standard; General Requirements, Suspect/Counterfeit Electrical, Electronic, and Electromechanical Parts, and supporting Slash Sheets with test method requirements. AS617

47、1/1 Suspect/Counterfeit Test Evaluation Method AS6171/2 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, And Surface Texture Analysis Test Methods AS6171/3 Techniques for Suspect/Counterfeit EEE Parts Detection by X-ray Fluorescence Tes

48、t Methods AS6171/4 Techniques for Suspect/Counterfeit EEE Parts Detection by Delid/Decapsulation Physical Analysis Test Methods SAE INTERNATIONAL AS6171 Page 6 of 102 AS6171/5 Techniques for Suspect/Counterfeit EEE Parts Detection by Radiological Test Methods AS6171/6 Techniques for Suspect/Counterf

49、eit EEE Parts Detection by Acoustic Microscopy (AM) Test Methods AS6171/7 Techniques for Suspect/Counterfeit EEE Parts Detection by Electrical Test Methods AS6171/8 Techniques for Suspect/Counterfeit EEE Parts Detection by Raman Spectroscopy Test Methods AS6171/9 Techniques for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Methods AS6171/10 Techniques for Suspect/Counterfeit EEE Parts Detection by Thermogravimetric Analysis (TGA) Test Methods AS6171/11 Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test M