REG NASA-LLIS-0783-2000 Lessons Learned - Thermal Test Levels& Durations.pdf
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1、Best Practices Entry: Best Practice Info:a71 Committee Approval Date: 2000-04-14a71 Center Point of Contact: JPLa71 Submitted by: Wilson HarkinsSubject: Thermal Test Levels they also have been demonstrated to provide an effective screen of assemblies. This resulted in the JPL standard minimum test r
2、ange of -20C to +75C (for electronic assemblies in particular).These conservative test level ranges lead to several desirable features. The conservative high temperature limit restricts the permitted temperature rise from the shearplate to the junction of electronic piece parts. Thus junction temper
3、atures during the bulk of a mission are much cooler than assemblies designed and tested at lower shearplate temperatures. The increase in theoretical reliability is on the order of a factor of 10 per 25C. (refer to “Part junction Temperature“, Reliability Preferred Practice No. PD-ED-1204)There are
4、at least two failure mechanisms for both design and workmanship that should be screened by an adequate thermal environmental test of any given assembly. The first is based on Arrhenius rate related physics where time at high temperature is the key to demonstrating reliability during testing. Electro
5、nic part life is a prime example of an Arrhenius mechanism, but so are other elements Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-of assemblies including interactions between metal traces within printed wiring boards (PWBs), certain component to
6、board joints, and even solder joints to a certain extent. The other identifiable mechanism is thermally induced mechanical stress (including fatigue) as between components and the board and especially solder joints.Arrhenius Rate Physics:Contrast the test level of 75C (shearplate) to 50C short term
7、worst case transients during flight and 25C for the bulk of the mission. Based on Arrhenius reaction rate physics described in the following figures, the 75C test provides a demonstrated reliability some 2 to 8 times that of short transients to 50C, (typical of thermal cycling tests), and some 4 to
8、94 times that of long term mission shearplate temperatures (25C). These reliability ratios are based on activation energies of 0.3 eV to 1.0 eV which cover most assembly element reaction physics.refer to D descriptionD Provided by IHSNot for ResaleNo reproduction or networking permitted without lice
9、nse from IHS-,-,-refer to D descriptionD The Mariner and Viking spacecraft performed a hot dwell test (75C) of 288 hours duration. This was reduced to 144 hours for the Voyager and Galileo spacecraft. The statistical database supporting this shorter test is unique to the JPL design rules and process
10、es; therefore, the longer hot dwell duration of 288 hours is recommended for assemblies designed to non-equivalent or less conservative practices.The following figure shows the percentage of the screening test capability for Class S parts that is used by a JPL assembly test at 75C for 144 hours. A v
11、ery conservative assumption here is that all parts in the assembly test have a 35C temperature rise and that they are at 110C for the entire test. Even given this over-conservative assumption, the JPL test uses only 0.018% of the class S parts minimum screened capability. Clearly less than 2/10000s
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