REG NASA-LLIS-0465-1995 Lessons Learned - Crimped Electrical Connections - Scout Program.pdf
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1、Lessons Learned Entry: 0465Lesson Info:a71 Lesson Number: 0465a71 Lesson Date: 1995-06-13a71 Submitting Organization: LERCa71 Submitted by: Judy TerlepSubject: Crimped Electrical Connections - Scout Program Description of Driving Event: Functional failures were attributed to varying resistance value
2、s through crimped electrical connections (contacts, splices, terminals). The variation was from several milliohms to open circuits. Microscopic examination of the cross-section of the crimped area revealed either insufficient crimping or excessive deformation of the wire strands.Samples of the vario
3、us combinations of crimp connections (connector pins, connector sockets, terminal lugs, or splices) and wire gauges were made using various crimp tools and settings. Cross-sectioning of these samples indicated that the manufacturers recommended settings and positioners did not always provide the bes
4、t crimp conditions. Pull test results on similar crimp connections correlated with the cross-section conclusions.In 1975 the Scout Program established its own crimping standard, which specified the crimp tool model, contact positioner, and setting (if applicable) for each connection type (manufactur
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