欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    ECA EIA-364-105B-2015 TP-105B Altitude C Low Temperature Test Procedure for Electrical Connectors and Sockets.pdf

    • 资源ID:704200       资源大小:65.18KB        全文页数:11页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    ECA EIA-364-105B-2015 TP-105B Altitude C Low Temperature Test Procedure for Electrical Connectors and Sockets.pdf

    1、 EIA STANDARD TP-105B Altitude Low Temperature Test Procedure for Electrical Connectors and Sockets EIA-364-105B (Revision of EIA-364-105A) January 2015 Electronic Components Industry Association ANSI/EIA-364-105-B(2015) Approved: January 26, 2015 EIA-364-105B NOTICE EIA Engineering Standards and Pu

    2、blications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particula

    3、r need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by

    4、those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent

    5、 owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 60512-11-2 (was IEC 512-6, test 11b), Combined/sequential cold, low air pressure and damp

    6、heat, 2002-02. It conforms in all essential respects this IEC standard. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health pr

    7、actices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5326.06, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2015 EIA Standa

    8、rds see 3.1 5.2 Number of contacts and sealing plugs; see 3.1 5.3 Wire end preparation (location in chamber); see 3.1 5.4 Connector accessories, support hardware to be installed on connector specimen during test; see 3.1 EIA-364-105B Page 3 5.5 Connector specimen preparation; see 3.2 5.6 Test voltag

    9、es for altitude, dielectric withstanding voltage, maximum leakage current, and test voltage application time, if other than 5 seconds; see 4.1.6. 5.7 Chamber pressure, temperature and duration of each cycle. 6 Documentation Documentation shall contain the details specified in clause 5, with any exce

    10、ptions, and the following: 6.1 Title of test 6.2 Specimen description include fixture, if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.5.1 Chamber pressure, temperature and duration of each cycle 6.5.2 Insulation resistanc

    11、e values and identity of each contact pair in test specimen 6.5.3 Dielectric withstanding test results and identity of each contact pair specimen 6.5.4 Connector visual examination 6.6 Name of operator and start/finish dates of test ECIA Document Improvement Proposal If in the review or use of this

    12、document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-02

    13、45) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA US

    14、E ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-4302 April 1999 Initial publication A SP-5163 February 2008 Revised paragraph 4.1.1, 4.1.2, 4.1.3, 4.1.6, 5.6 and 6.6B SP-5326.06 - Add paragraph 5.7 Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org


    注意事项

    本文(ECA EIA-364-105B-2015 TP-105B Altitude C Low Temperature Test Procedure for Electrical Connectors and Sockets.pdf)为本站会员(赵齐羽)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开