1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor cage 27014 as device type 02. Add ground bounce immunity criteria. Editorial changes throughout jak. 96-11-04 Monica L. Poelking B Change CIN, COUT, and ground bounce for device type 01. Editorial changes throughout jak. 99-03-10 Monic
2、a L. Poelking C Corrections made to figure 1 jak. 99-08-17 Monica L. Poelking D Make changes to ground bounce immunity limits for device type 02. Editorial changes throughout. jak. 03-02-18 Thomas M. Hess E Update the boilerplate paragraphs to the current requirements of MIL-PRF-38535 jak. 10-04-15
3、Thomas M. Hess REV SHEET REV E E E E SHEET 15 16 17 18 REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Wanda L. Meadows DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECK
4、ED BY Thomas J. Ricciuti THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUFFER/DRIVER WITH NONINVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, DRAWING APPROVAL DAT
5、E 93-05-03 MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-93174 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E231-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93174 DEFENSE SUPPLY
6、CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead fi
7、nishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93174 01 M X A Federal RHA Device Device Case Lead stock class
8、designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. De
9、vice class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit fun
10、ction 01 54ABT16244 16-bit buffer/driver with noninverting three-state outputs, TTL compatible inputs. 02 54ABT16244 16-bit buffer/driver with noninverting three-state outputs, TTL compatible inputs. 1.2.3 Device class designator. The device class designator is a single letter identifying the produc
11、t assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case
12、outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for dev
13、ice class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93174 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3
14、/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +7.0 V dc 4/ DC input clamp current (IIK) (VINVCC) . -18 mA DC output clamp current (IOK) (VOUT 0.0 V) . -50 mA DC output current (IOL) (per output
15、) . +96 mA Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD): Device type 01 . 598 mW 5/ Device type 02 . 753 mW 5/ 1.4 Recommende
16、d operating conditions. 2/ 3/ 6/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc to VCCMinimum high level input voltage (VIH) . +2.0 V Maximum low level input voltage (VIL) +0.8 V Case operating temperature range (TC
17、) -55C to +125C Maximum input transition rise or fall rate (t / V) (outputs enabled). 10 ns/V Maximum High level output current (IOH) -24 mA Maximum Low level output current (IOL) . +48 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at t
18、he maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage
19、 ratings may be exceeded provided that the input and output clamp-current ratings are observed. 5/ Power dissipation values are derived using the formula PD= VCCICC + nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and “n“ represents the total nu
20、mber of outputs. 6/ Unused or floating inputs must be held high or low. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93174 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4
21、DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the is
22、sue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Met
23、hod Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dap
24、s.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Noth
25、ing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified
26、 in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and
27、as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shal
28、l be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circu
29、it and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. U
30、nless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-
31、,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93174 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each s
32、ubgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not mar
33、king the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance
34、mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall b
35、e required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). T
36、he certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, ap
37、pendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for devi
38、ce class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring acti
39、vity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in m
40、icrocircuit group number 126 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93174 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM
41、2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V Devicetype VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max High level output voltage 3006 VOH For all inputs affecting out
42、put under test, VIH= 2.0 V min or VIL= 0.8 V max IOH= -3.0 mA All 4.5 V 1, 2, 3 2.5 V 5.0 V 1, 2, 3 3.0 IOH= -24 mA All 4.5 V 1, 2, 3 2.0 Low level output voltage 3007 VOL For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0.55 V Three-state output leakage c
43、urrent high 3021 IOZH 4/ For control inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 +50.0 A Three-state output leakage current low 3020 IOZL 4/ For control inputs affecting output under test, VIH= 2.0 V, VIL= 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -50.0 A Negat
44、ive input clamp voltage 3022 VIC- For input under test, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V Off-state leakage current IOFF For input or output under test VINor VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100.0 A High-state leakage current ICEX For output under test, VOUT= 5.5 V Outputs at high
45、logic state All 5.5 V 1, 2, 3 50.0 A Input current high 3010 IIH For output under test, VIN= 5.5 V 01 5.5 V 1, 2, 3 +1.0 A 02 1, 2, 3 +2.0 Input current low 3009 IIL For output under test, VIN= 0.0 V 01 5.5 V 1, 2, 3 -1.0 A 02 1, 2, 3 -2.0 Output current 3011 IO5/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50.0
46、 -180.0 mA Quiescent supply current delta, TTL input level 3005 ICC6/ For input under test VIN= 3.4 V For all other inputs VIN= VCCor GND Data inputs, outputs enabled 01 5.5 V 1, 2, 3 1.5 mA 02 1, 2, 3 2.5 Data inputs, outputs disabled All 5.5 V 1, 2, 3 1.0 Control inputs 01 5.5 V 1, 2, 3 1.5 02 1,
47、2, 3 2.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93174 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. E
48、lectrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V Devicetype VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max Quiescent supply current , outputs high 3005 ICCHFor all inputs, VIN= VCCor GND IOUT= 0 A All 5.5 V 1, 2, 3 2.0 mA Quiescent supply current , outputs low 3005 ICCL01 5.5 V 1, 2, 3 32.0 02 1, 2, 3 60.0 Quiescent supply current , outputs disabled 3005 ICCZAll 5.5 V 1, 2, 3 2.0 Input capacitance 3012 CINTC
