欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    DLA SMD-5962-86027 REV D-2003 MICROCIRCUIT DIGITAL 4-BIT BIPOLAR MICROPROGRAM SEQUENCER MONOLITHIC SILICON《硅单块 4比特双极微程序序列发生器数字微型电路》.pdf

    • 资源ID:698823       资源大小:117.48KB        全文页数:16页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    DLA SMD-5962-86027 REV D-2003 MICROCIRCUIT DIGITAL 4-BIT BIPOLAR MICROPROGRAM SEQUENCER MONOLITHIC SILICON《硅单块 4比特双极微程序序列发生器数字微型电路》.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Convert to military drawing format. Add case outline Z, change case outline 3 lead finish from C to A for vendor part number AM2909A/B3A. Add vendor CAGE number 50088 to drawing. 87-10-07 Michael A. Frye B Table I, change IIH2test conditions. Edi

    2、torial changes throughout. 88-09-27 Michael A. Frye C Changes in accordance with NOR 5962-R027-93. 92-11-30 Monica L. Poelking D Incorporate revision C. Update boilerplate to MIL-PRF-38535 requirements. LTG 03-01-21 Thomas M. Hess REV SHET REV D SHET 15 REV STATUS REV D D D D D D D D D D D D D D OF

    3、SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Greg A. Pitz DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Ray Monnin COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT

    4、, DIGITAL, 4-BIT BIPOLAR MICROPROGRAM SEQUENCER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 86-02-24 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 86027 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E177-03 DISTRIBUTION STATEMENT A. Approved for public release;

    5、distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This draw

    6、ing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 86027 01 X X Drawing number Device type (see 1.2.1) Case outline

    7、 (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 2909A Microprogram sequencer 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter De

    8、scriptive designator Terminals Package style X GDIP1-T28 or CDIP2-T28 28 Dual-in-line package Y See figure 1 28 Flat pack Z GDFP2-F28 28 Flat pack 3 CQCC1-N28 28 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings

    9、. Supply voltage range. -0.5 V dc to +7.0 V dc Input voltage range -0.5 V dc to +5.5 V dc Storage temperature range . -65C to +150C Maximum power dissipation (PD). 770 mW 1/ Thermal resistance, junction-to-case (JC): Cases X, Z, and 3 See MIL-STD-1835 Case Y. 14C/W 2/ Junction temperature (TJ) 175C

    10、DC output current, into inputs 30 mA DC input current -30 mA to +5.0 mA 1.4 Recommended operating conditions. Supply voltage (VCC) 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL). 0.8 V dc Case operating temperature range (TC

    11、) -55C to +125C 1/ Must withstand the added PDdue to short circuit test;e.g., IOS. 2/ When a thermal resistance value for this case is included in MIL-STD-1835, that value shall supersede the value indicated herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license

    12、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form

    13、a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DE

    14、FENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard

    15、 Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence

    16、. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements

    17、. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non- JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has

    18、 been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modificatio

    19、ns to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2

    20、 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Logic diagram. The logic diagram shall be

    21、 as specified on figure 2 3.2.3 Terminal connections. The terminal connections shall be as specified on figure 3. 3.2.4 Truth table. The truth table shall be as specified on figure 4. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure

    22、 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless

    23、otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for

    24、 each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where markin

    25、g of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A.

    26、The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved s

    27、ource of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of confor

    28、mance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and

    29、review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitt

    30、ed without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C VCC= 5.0 V 10% unless otherwise spe

    31、cified Group A subgroups Device type Limits Unit Min Max Output high voltage VOHVCC= minimum, IOH= 1.0 mA VIN= VIHor VIL1, 2, 3 All 2.4 V Output low voltage VOLVCC= minimum, IOL= 16 mA VIN= VIHor VIL1, 2, 3 All 0.5 V Input high level VIH1, 2, 3 All 2.0 V Input low level VIL1, 2, 3 All 0.8 V Input cl

    32、amp voltage VICVCC= minimum, IIN= -18 mA 1, 2, 3 All -1.5 V Cn-1.08 Push/pop, OE -0.76 Input low current IILVCC= maximum VIN= 0.4 V Others 1, 2, 3 All -0.41 mA Cn40 Push/pop, OE 40 Input high current IIH1VCC= maximum VIN= 2.7 V Others 1, 2, 3 All 20 A Cn, Push/pop 0.2 Input high current IIH2VCC= max

    33、imum VIN= 5.5 V Others 1, 2, 3 All 0.1 mA Y0 Y3-30 -100 Output short circuit current 1/ IOSVCC= 6.0 V VOUT= 0.5 V Cn+41, 2, 3 All -30 -85 mA TC= -55C and +125C 1, 3 140 Power supply current ICCVCC= maximum 2/ TC= +25C 2 All 110 mA IOZLVOUT= 0.4 V -20 Output OFF current IOZHVCC= maximum (Y0-3) VOUT=

    34、2.7 V 1, 2, 3 All 20 A Functional tests See 4.3.1c 7, 8 All Setup time 1 RE ts19, 10, 11 All 19 ns Hold time 1 RE th19, 10, 11 All 5 ns Setup time 2 Rits29, 10, 11 All 12 ns Hold time 2 Rith29, 10, 11 All 5 ns Setup time 3 PUP ts39, 10, 11 All 27 ns Hold time 3 PUP th39, 10, 11 All 5 ns Setup time 4

    35、 FE ts49, 10, 11 All 27 ns Hold time 4 FE th49, 10, 11 All 5 ns Setup time 5 Cnts59, 10, 11 All 18 ns Hold time 5 Cnth59, 10, 11 All 5 ns Setup time 6 Dits69, 10, 11 All 25 ns Hold time 6 Dith69, 10, 11 All 0 ns Setup time 7 ORits79, 10, 11 All 25 ns Hold time 7 ORith7See figure 5 CL= 50 pF 9, 10, 1

    36、1 All 0 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Elec

    37、trical performance characteristics - Continued Test Symbol Conditions -55C TC +125C VCC= 5.0 V 10% unless otherwise specified Group A subgroups Device type Limits Unit Min Max Setup time 8 S0, S1 ts89, 10, 11 All 29 ns Hold time 8 S0, S1th89, 10, 11 All 0 ns Setup time 9 ZERO ts99, 10, 11 All 29 ns

    38、Hold time 9 ZERO th99, 10, 11 All 0 ns tpd120 Propagation delay 1-2 from (input): DiTo (output): Y To (output): Cn+4tpd29, 10, 11 All 25 ns tpd329 Propagation delay 3-4 from (input): S0, S1To (output): Y To (output): Cn+4tpd49, 10, 11 All 34 ns tpd520 Propagation delay 5-6 from (input): ORiTo (outpu

    39、t): Y To (output): Cn+4 tpd69, 10, 11 All 25 ns Propagation delay 7 from (input): CnTo (output): Cn+4tpd79, 10, 11 All 16 ns tpd830 Propagation delay 8-9 from (input): ZERO To (output): Y To (output): Cn+4tpd99, 10, 11 All 35 ns Propagation delay 10 from (input): OE low (enable) To (output): Y tpd10

    40、See figure 5 CL= 50 pF 9, 10, 11 All 25 ns Propagation delay 11 from (input): OE high (disable) To (output): Y tpd11See figure 5 CL= 5 pF 9, 10, 11 All 25 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR

    41、OCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C VCC= 5.0 V 10% unless otherwise specified Group A subgroups Device t

    42、ype Limits Unit Min Max tpd1245 Propagation delay 12-13 from clock (input): Clock S1, S0= LH To (output): Y To (output): Cn+4tpd139, 10, 11 All 50 ns tpd1445 Propagation delay 14-15 from clock (input): Clock S1, S0= LL To (output): Y To (output): Cn+4tpd159, 10, 11 All 50 ns tpd1653 Propagation dela

    43、y 16-17 from clock (input): Clock S1, S0= HL To (output): Y To (output): Cn+4tpd179, 10, 11 All 58 ns Minimum clock low time tCL9, 10, 11 All 20 ns Minimum clock high time tCHSee figure 5 CL= 50 pF 9, 10, 11 All 20 ns 1/ Not more than one output should be shorted at a time. Duration of the short cir

    44、cuit test should not exceed 1 second. 2/ Apply GND to Cn, R0, R1, R2, R3, 0R0, 0R1, 0R2, 0R3, D0, D1, D2and D3. Other inputs high. All outputs open. Measured after low to high clock transition. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

    45、 MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline Y Min Max Min Max Parameter Millimeters Inches A .13 2.29 .055 .090 b .38 .48 .015 .019 C .10 .15 .004 .006 D 9.40 10.54 .370 .415 E 9.40 10.16 .370

    46、 .400 E1 - 10.67 - .420 e 1.14 1.40 .045 .055 L 6.35 8.13 .250 .320 L1 23.37 24.89 .920 .980 Q .51 1.02 .020 .040 S - 1.14 - .045 S1.13 - .005 - S2.10 - .004 - NOTES: 1. Index area: A notch, tab, or pin one identification mark shall be located within the shaded area shown. 2. D and E1 allow for off-

    47、center lid meniscus and glass overrun. 3. All leads in dimensions b and C increase by 3 mils maximum limit, when tinplate/solder dip lead finish applied. 4. Exterior of frames to be of any shape, as long as electrically continous with all leads and meets outside frame dimension measurement. FIGURE 1

    48、 Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 FIGURE 2. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 86027 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 Device type All Case outli


    注意事项

    本文(DLA SMD-5962-86027 REV D-2003 MICROCIRCUIT DIGITAL 4-BIT BIPOLAR MICROPROGRAM SEQUENCER MONOLITHIC SILICON《硅单块 4比特双极微程序序列发生器数字微型电路》.pdf)为本站会员(bowdiet140)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开