1、 EIA STANDARD TP-30A Capacitance Test Procedure for Electrical Connectors and Sockets EIA-364-30A (Revision of EIA-364-30) APRIL 2002 ELECTRONIC COMPONENTS, ASSEMBLIES & MATERIALS ASSOCIATION THE ELECTRONIC COMPONENT SECTOR OF THE ELECTRONIC INDUSTRIES ALLIANCE EIA-364-30A ANSI/EIA-364-30A-2002 Appr
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6、o parties adopting the Standard or Publication. This Standard is based upon the major technical content of International Electrotechnical Commission standard 512-9, test 22a, capacitance, 1992-04, second edition. It conforms in all essential respects with this IEC standard. This Standard does not pu
7、rport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standa
8、rds Proposal Number 3988-A, formulated under the cognizance of the CE-2.0 National Connector Standards Committee.) Published byELECTRONIC INDUSTRIES ALLIANCE 2002 Technology Strategy & Standards Department 2500 Wilson Boulevard Arlington, VA 22201 PRICE: Please refer to the current Catalog of EIA El
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11、tering into a license agreement. For information, contact: Global Engineering Documents 15 Inverness Way East Englewood, CO 80112-5704 or call U.S.A. and Canada 1-800-854-7179, International (303) 397-7956 Copyright Electronic Components, Assemblies & Materials Association Reproduced by IHS under li
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13、 Clause Page 1 Introduction 1 1.1 Scope 1 1.2 Object . 1 1.3 Definitions 1 2 Test resources . 1 2.1 Equipment 1 2.2 Fixture 2 3 Test specimen . 2 3.1 Description . 2 4 Test procedure 2 5 Details to be specified 3 6 Test documentation 3 Copyright Electronic Components, Assemblies & Materials Associat
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15、orking permitted without license from IHS-,-,-EIA-364-30A Page 1 TEST PROCEDURE NO. 30A CAPACITANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 3988-A, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously publi
16、shed in EIA-364-30.) 1 Introduction 1.1 Scope This procedure applies to electrical connectors and sockets. 1.2 Object This standard describes a test method to measure capacitance from 1 kHz to 1 MHz. 1.3 Definition That property of a system of conductors and dielectrics which permits the storage of
17、electricity when potential differences exist between the conductors. Its value is expressed as the ratio of the electrostatic charge on a conductor to the potential difference between the conductors required to maintain that charge. 2 Test resources 2.1 Equipment Capacitance shall be measured with a
18、 capacitance meter or bridge that will ensure an accuracy of 0.5% of indicated value + 0.2 picofarad. The sum of the peak ac and dc voltages shall not exceed the voltage rating of the specimen. The test frequency shall be 1 kHz 1% or 1 MHz 1%, (1 kHz 1% is preferred), unless otherwise specified in t
19、he referencing document. 3 Test specimen The test specimen shall consist of a connector (may be mated or unmated), or socket according to the referencing document. Copyright Electronic Components, Assemblies & Materials Association Reproduced by IHS under license with ECA Not for ResaleNo reproducti
20、on or networking permitted without license from IHS-,-,-EIA-364-30A Page 2 4 Test procedure 4.1 Capacitance shall be measured at the specified frequency using the following configurations. 4.1.1 Between one contact and ground with the following parts connected to ground by the lowest impedance path:
21、 all other contacts, all metal parts, the mounting plate. 4.1.2 Between any two adjacent contacts, the following parts all being connected to ground at a common point: all other contacts, all metal parts, the mounting plate. NOTE When measuring pin-to-pin capacitance (crosstalk capacitance) in a con
22、nector containing filter elements the shell of the connector shall be terminated to the bridge guard. 4.1.3 Any other point or operating condition, as specified in the referencing document. 4.2 The test lead capacitance shall be subtracted from the reading. 5 Details to be specified The following de
23、tails shall be specified in the referencing document: 5.1 Initial measurements and conditions, if other than standard atmospheric conditions. 5.2 Preparation of the specimen 5.3 Specimen description and measurement points 5.4 Value of the measuring frequency 5.5 Any special fixture requirements 5.6
24、Magnitude of polarizing voltage and/or magnitude of ac rms test signals Copyright Electronic Components, Assemblies & Materials Association Reproduced by IHS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA-364-30A Page 3 6 Documentation D
25、ocumentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Test equipment used, and date of last and next calibration 6.3 Ambient temperature and humidity 6.4 Values and observations 6.5 Name of operator and date of test Copyright Elec
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