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    IEEE 81-2012 - IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System.pdf

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    IEEE 81-2012 - IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System.pdf

    1、 IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System Sponsored by the Substations Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 28 December 2012 IEEE Power and Energy SocietyIEEE Std 81-2012(Revision of IEEE Std 81-1983) IEEE St

    2、d 81TM-2012 (Revision of IEEE Std 81-1983) IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System Sponsor Substations Committee of the IEEE Power and Energy Society Approved 5 December 2012 IEEE-SA Standards BoardApproved 3 October 2014 Ameri

    3、can National Standards InstituteAbstract: Practical test methods and techniques are presented for measuring the electrical characteristics of grounding systems. Topics addressed include safety considerations, measuring earth resistivity, measuring the power system frequency resistance or impedance o

    4、f the ground system to remote earth, measuring the transient or surge impedance of the ground system to remote earth, measuring step and touch voltages, verifying the integrity of the grounding system, reviewing common methods for performing ground testing, reviewing instrumentation characteristics

    5、and limitations, and reviewing various factors that can distort test measurements. Keywords: electrical measurements, ground impedance, ground potential rise, ground resistance, ground testing, IEEE 81TM, remote earth, soil resistivity The Institute of Electrical and Electronics Engineers, Inc. 3 Pa

    6、rk Avenue, New York, NY 10016-5997, USA Copyright 2012 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 28 December 2012. Printed in the United States of America. National Electrical Safety Code and NESC are registered trademarks in the U.S. Patent +1 978

    7、 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2012 IEEE. All rights reserved. Notice to users Laws and regulations Users of IEEE Standards documents should consult all app

    8、licable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the pu

    9、blication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use

    10、, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to thi

    11、s document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any

    12、point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the

    13、 IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any,

    14、for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. v Copyright 2012 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation o

    15、f this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assura

    16、nce via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under re

    17、asonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential

    18、Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasona

    19、ble or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 20

    20、12 IEEE. All rights reserved. Participants At the time this guide was submitted to the IEEE-SA Standards Board for approval, the Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System Working Group had the following membership: Dennis DeCosta, Chair Robert

    21、Brown, Vice Chair William Sheh, Secretary Hanna Abdallah Stan Arnot Thomas Barnes Bryan Beske Dale Boling Steven Brown K. S. Chan Koushik Chanda E. Peter Dick Marcia Eblen Gary Engmann D. Lane Garrett Steven Greenfield Martin Havelka Jeffrey Jowett Richard Keil Dave Kelley Donald Laird Henri Lemeill

    22、eur Allen Love Sakis Meliopoulos Mike Noori Robert Nowell Shashi Patel Jesse Rorabaugh Hamid Sharifnia Douglas Smith Curtis Stidham Brian Story Alexander WongThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or absten

    23、tion. Hanna Abdallah William Ackerman Michael Adams Ali Al Awazi Stan Arnot Michael Baldwin Thomas Barnes Robert Barnett G. Bartok Earle Bascom III George Becker W. J. (Bill) Bergman Bryan Beske Steven Bezner Wallace Binder Dale Boling Dieter Braun Jeffrey Britton Derek Brown Steven Brown William Bu

    24、sh Mark Bushnell William Byrd Thomas Callsen Michael Champagne Koushik Chanda Robert Christman Randy Clelland Bryan Cole Jerry Corkran Alireza Daneshpooy Glenn Davis Dennis DeCosta Gary Donner Douglas Dorr Donald Dunn Marcia Eblen Michael Edds Gary Engmann Brian Erga C. Erven Rabiz Foda Marcel Forti

    25、n Fredric Friend D. Lane Garrett George Gela Frank Gerleve David Giegel David Gilmer Jalal Gohari Edwin Goodwin James Graham Joseph Gravelle Steven Greenfield Randall Groves Bal Gupta Ajit Gwal David Harris Martin Havelka Lee Herron Gary Heuston Scott Hietpas Raymond Hill Robert Hoerauf Ronald Hotch

    26、kiss R. Jackson Joseph Jancauskas Jeffrey Jowett Richard Keil Chad Kennedy Gael Kennedy Yuri Khersonsky Chad Kiger James Kinney Hermann Koch Joseph L. Koepfinger Jim Kulchisky Saumen Kundu Donald Laird Chung-Yiu Lam Benjamin Lanz Thomas La Rose Michael Lauxman Albert Livshitz Debra Longtin Greg Luri

    27、 Jinxi Ma Jorge Marquez John Mcalhaney, Jr. William McBride Edward McCall William McCoy Nigel McQuin Daleep Mohla Georges Montillet Adi Mulawarman Jerry Murphy Arun Narang Dennis Neitzel vii Copyright 2012 IEEE. All rights reserved. Arthur Neubauer Michael S. Newman Nick S. A. Nikjoo Robert Nowell L

    28、orraine Padden Donald Parker Bansi Patel Shashi Patel Donald Platts Percy Pool Reynaldo Ramos Johannes Rickmann Michael Roberts Charles Rogers Jesse Rorabaugh Thomas Rozek Steven Sano Bartien Sayogo Dennis Schlender Robert Seitz Devki Sharma William Sheh Gil Shultz Douglas Smith James Smith Jerry Sm

    29、ith Gary Stoedter Brian Story Allan St. Peter William Taylor David Tepen John Toth Jonathan Tucker John Vergis Keith Wallace S. Frank Waterer Yingli Wen Donald Wengerter Kenneth White James Wilson Alexander Wong Larry Yonce Larry Young Jian Yu Luis Zambrano Matthew Zeedyk When the IEEE-SA Standards

    30、Board approved this standard on 5 December 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe

    31、 Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Boa

    32、rd liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Program Manager, Document Development Soo H. Kim IEEE Client Services Manager, Professional Services viii Copyright 2012 IEEE. All rights reserved. Introduction This introduction is

    33、 not part of IEEE Std 81-2012, IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System. IEEE Std 81TM-1983 B36awas prepared by the Power System Instrumentation and Measurement Committee of the IEEE Power and Energy Society. The guide was inten

    34、ded to cover the majority of field measurements that did not require special, high-precision equipment and did not address unusual difficulties that can occur in large grounding systems, abnormally high stray alternating currents (ac) or direct currents (dc), and so on. In 1991, IEEE Std 81 was reaf

    35、firmed and IEEE Std 81.2-1991 B37 was released to cover the measurement of very low impedances (less than 1 ohm) along with specialized instrumentation, measurement techniques, and safety considerations. After nearly two decades of inactivity, the Substation Committee of the IEEE Power and Energy So

    36、ciety determined that IEEE Std 81-1983 and IEEE Std 81.2-1991 contained subject matter that is very relevant for applications in electric utility facilities, but the standards needed to be updated. A working group was formed to combine both standards into a singular document that included updated instrumentation, techniques, and information. This document represents the efforts of that working group. aThe numbers in brackets correspond to those of the bibliography in Annex F.


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