欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    IEEE 1505 1-2015 en The Common Test Interface Pin Map Configuration for High-Density Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505《利用IEEE St.pdf

    • 资源ID:1248248       资源大小:10.56MB        全文页数:175页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    IEEE 1505 1-2015 en The Common Test Interface Pin Map Configuration for High-Density Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505《利用IEEE St.pdf

    1、 IEC 63003 Edition 1.0 2015-12 INTERNATIONAL STANDARD Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505 IEC 63003:2015-12(en)IEEE Std1505.1-2008IEEE Std 1505.1 colourinsideTHIS PUBLICATION IS COPYRIGHT PRO

    2、TECTED Copyright 2008 IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also partic

    3、ipate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers representin

    4、g varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test

    5、, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). I

    6、EC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has

    7、 representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate interest in re

    8、viewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in that sense.

    9、 While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Comm

    10、ittees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly indicated in

    11、the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certification bodies.

    12、6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societie

    13、s and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use

    14、 of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possi

    15、bility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for id

    16、entifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agre

    17、ements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. IEC 63003:2015 IEEE Std 1505.1-2008Published by IEC under license from

    18、 IEEE. 2008 IEEE. All rights reserved. International Standard IEC 63003/ IEEE Std 1505.1-2008 has been processed through IEC technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS R

    19、eport on voting IEEE Std 1505.1-2008 91/1274/FDIS 91/1298/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publicatio

    20、n will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IEC 63003:2015 IEEE Std 1505.1-2008IE

    21、EE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505Sponsor IEEE Instrumentation and Measurement Society and IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 2

    22、6 September 2008 IEEE-SA Standards Board Approved as a Full-Use Standard on 14 June 2013 IEEE-SA Standards Board IEC 63003:2015 IEEE Std 1505.1-2008Abstract: This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed

    23、on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) tra

    24、nsitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS). Keywords: ATE, ATS, fixture, ICD, IEEE 1505.1TM, interface, ITA, mass termination, receiver, scalable, TPS, UUT IEC 6

    25、3003:2015 IEEE Std 1505.1-2008I(,ntroduction This introduction is not part of IEEE Std 1505.1-2008, IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505. This standard stems from the history of ATE imple

    26、mentations having unique input/output (I/O) pin out definitions. This uniqueness has prevented the interoperability of test program sets (TPSs) among different ATEs within the same organizations. Even if the same RFI was used by the target ATE, the signals I/O could not be guaranteed to be at the sa

    27、me pin location. This is due to there being no suitable standard pin out definition for general purpose electronic testing applications. IEEE Std 1505-2006ahas addressed part of the interoperability problem by defining the common mechanical interface for the ATE. This project takes the TPS interoper

    28、ability problem one step further toward completion by standardizing the electrical signal I/O pin map for general purpose electronic testing applications. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common

    29、scalable: (a) framework; (b) pin map configuration; (c) specific connector modules; (d) respective contacts; (e) recommended switching implementation; and (f) legacy ATE transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperabilit

    30、y between past and future ATS. The suggested mechanical and electrical requirements necessary to implement a specific IEEE 1505 RFI product in support of a common test interface (CTI) across all U.S. Department of Defense (DoD) defense agencies, related aerospace industry, and a variety of non-U.S.

    31、government agencies such as the U.K. Ministry of Defense (MoD) is provided. The DoD is a major buyer and user of ATE; however, existing acquisition guidance desires the use of commercial standards and/or best practices for these systems. Suitable standards currently do not exist in the commercial ma

    32、rketplace; therefore, this standard will provide such specification. Notice to users Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements

    33、. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrig

    34、hts This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making

    35、 this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. aInformation on references can be found in Clause 2. IEC 63003:2015 IEEE Std 1505.1-2008Updating of IEEE documents Users of IEEE Standards document

    36、s should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together

    37、with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the

    38、IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http

    39、:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no positio

    40、n is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.or

    41、g/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to appl

    42、icants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Pate

    43、nts Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any pa

    44、tent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. IEC 63003:2015 IEEE Std 1505.1-20081Information on references can be found in Clause 2. IEC 63003:2015 IEEE Std 1505.1-20081Standar

    45、d for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from othe

    46、r devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subj

    47、ect to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or

    48、viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope The scope of this standard is the definition of a pin map utilizing the IEEE 1505 1receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment

    49、(ATE) testing applications. 1.2 Purpose Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs) on multiple ATE systems utilizing the IEEE 1505 RFI. 1.3 Statement of the problem 1.3.1 U.S. Government guidance From 1980 to 1992, the U.S. Department of Defense (DoD) investment in field, depot, and factory automatic test systems (ATS) exceeded $35 billion with an addi


    注意事项

    本文(IEEE 1505 1-2015 en The Common Test Interface Pin Map Configuration for High-Density Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505《利用IEEE St.pdf)为本站会员(wealthynice100)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开