1、 IEC 60749-20Edition 2.0 2008-12INTERNATIONAL STANDARD NORME INTERNATIONALESemiconductor devices Mechanical and climatic test methods Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat Dispositifs semiconducteurs Mthodes dessais mcaniques et climat
2、iques Partie 20: Rsistance des CMS botier plastique leffet combin de lhumidit et de la chaleur de brasage IEC60749-20:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or
3、 utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining add
4、itional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et p
5、ar aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilis
6、ez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.chWeb: www.iec.chAbout the IEC The International Electrotechnical Commission (IEC) is the leading global organization that
7、prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might hav
8、e been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/on
9、line_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 0
10、00 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance
11、, please visit the Customer Service Centre FAQ or contact us: Email: csciec.chTel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a tr
12、ait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications
13、de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: w
14、ww.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniqu
15、es et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous
16、 dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.chTl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60749-20Edition 2.0 2008-12INTERNATIONAL STANDARD NORME INTERNATIONALESemiconductor devices M
17、echanical and climatic test methods Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat Dispositifs semiconducteurs Mthodes dessais mcaniques et climatiques Partie 20: Rsistance des CMS botier plastique leffet combin de lhumidit et de la chaleur de
18、brasage INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE UICS 31.080.01 PRICE CODECODE PRIXISBN 2-8318-1019-8 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60749-20 IEC:2008 CO
19、NTENTS FOREWORD.4 1 Scope.6 2 Normative references6 3 General description.6 4 Test apparatus and materials6 4.1 Humidity chamber6 4.2 Reflow soldering apparatus6 4.3 Holder .7 4.4 Wave-soldering apparatus .7 4.5 Solvent for vapour-phase reflow soldering7 4.6 Flux.7 4.7 Solder .7 5 Procedure.7 5.1 In
20、itial measurements .7 5.1.1 Visual inspection7 5.1.2 Electrical measurement8 5.1.3 Internal inspection by acoustic tomography 8 5.2 Drying8 5.3 Moisture soak8 5.3.1 General .8 5.3.2 Conditions for non-dry-packed SMDs .8 5.3.3 Moisture soak for dry-packed SMDs.8 5.4 Soldering heat .10 5.4.1 General .
21、10 5.4.2 Method of heating by infrared convection or convection reflow soldering11 5.4.3 Method of heating by vapour-phase reflow soldering.12 5.4.4 Method of heating by wave-soldering12 5.5 Recovery.13 5.6 Final measurements 14 5.6.1 Visual inspection14 5.6.2 Electrical measurement14 5.6.3 Internal
22、 inspection by acoustic tomography 14 6 Information to be given in the relevant specification.14 Annex A (informative) Details and descriptions of test method on resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat16 Figure 1 Method of measuring the temperatu
23、re profile of a specimen7 Figure 2 Heating by wave-soldering 13 Figure A.1 Process of moisture diffusion at 85 C, 85 % RH17 Figure A.2 Definition of resin thickness and the first interface .17 Figure A.3 Moisture soak time to saturation at 85 C as a function of resin thickness 18 Figure A.4 Temperat
24、ure dependence of saturated moisture content of resin18 Figure A.5 Dependence of moisture content of resin at the first interface on resin thickness under various soak conditions19 60749-20 IEC:2008 3 Figure A.6 Dependence of moisture content of resin at the first interface on resin thickness relate
25、d to method A of moisture soak.20 Figure A.7 Dependence of the moisture content of resin at the first interface on resin thickness related to method B of moisture soak.21 Figure A.8 Dependence of moisture content of resin at the first interface on resin thickness related to condition B2 of method B
26、of moisture soak .21 Figure A.9 Temperature profile of infrared convection and convection reflow soldering for Sn-Pb eutectic assembly23 Figure A.10 Temperature profile of infrared convection and convection reflow soldering for lead-free assembly23 Figure A.11 Classification profile 25 Figure A.12 T
27、emperature profile of vapour-phase soldering (condition II-A).25 Figure A.13 Immersion method into solder bath 26 Figure A.14 Relation between the infrared convection reflow soldering and wave-soldering.26 Figure A.15 Temperature in the body of the SMD during wave-soldering .27 Table 1 Moisture soak
28、 conditions for non-dry-packed SMDs .8 Table 2 Moisture soak conditions for dry-packed SMDs (method A) 9 Table 3 Moisture soak conditions for dry-packed SMDs (method B) 10 Table 4 SnPb eutectic process Classification reflow temperatures .11 Table 5 Pb-free process Classification reflow temperatures
29、.12 Table 6 Heating condition for vapour-phase soldering.12 Table 7 Immersion conditions for wave-soldering13 Table A.1 Comparison of actual storage conditions and equivalent moisture soak conditions before soldering heat18 Table A.2 Classification profiles24 4 60749-20 IEC:2008 INTERNATIONAL ELECTR
30、OTECHNICAL COMMISSION _ SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization co
31、mprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International St
32、andards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this pr
33、eparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two orga
34、nizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form
35、 of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretat
36、ion by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or reg
37、ional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this pu
38、blication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirec
39、t, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the c
40、orrect application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60749-20 has been prepar
41、ed by IEC technical committee 47: Semiconductor devices. This second edition cancels and replaces the first edition published in 2002 and constitutes a technical revision. The main changes are as follows: to reconcile certain classifications of IEC 60749-20 and those of IPC/JEDEC J-STD-020C; referen
42、ce IEC 60749-35 instead of Annex A of IEC 60749-20, Edition 1; update for lead-free solder; correct certain errors in the original Edition 1. 60749-20 IEC:2008 5 The text of this standard is based on the following documents: FDIS Report on voting 47/1989/FDIS 47/2003/RVD Full information on the voti
43、ng for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 60749 series, under the general title Semiconductor devices Mechanical and c
44、limatic test methods, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, th
45、e publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 60749-20 IEC:2008 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat 1 Scope This part of IEC 6074
46、9 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated refe
47、rences, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-20:2008, Environmental testing Part 2-20: Tests Test T: Test methods for solderability and resistance to soldering heat of devices with leads
48、IEC 60749-3, Semiconductor devices Mechanical and climatic test methods Part 3: External visual inspection IEC 60749-35, Semiconductor devices Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components 3 General description Package cracking and e
49、lectrical failure in plastic encapsulated SMDs can result when soldering heat raises the vapour pressure of moisture which has been absorbed into SMDs during storage. These problems are assessed. In this test method, SMDs are evaluated for heat resistance after being soaked in an environment which simulates moisture bein
