1、 IEC 62132-8 Edition 1.0 2012-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity IC stripline method Circuits intgrs Mesure de limmunit lectromagntique Partie 8: Mesure de limmunit rayonne Mthode de la l
2、igne TEM plaques pour circuit intgr IEC 62132-8:2012 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mec
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16、csciec.ch. IEC 62132-8 Edition 1.0 2012-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity IC stripline method Circuits intgrs Mesure de limmunit lectromagntique Partie 8: Mesure de limmunit rayonne Mtho
17、de de la ligne TEM plaques pour circuit intgr INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE T ICS 31.200 PRICE CODE CODE PRIX ISBN 978-2-83220-206-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechn
18、ique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 62132-8 IEC:2012 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 T
19、erms and definitions . 6 4 General 7 5 Test conditions . 7 5.1 General . 7 5.2 Supply voltage. 8 5.3 Frequency range . 8 6 Test equipment . 8 6.1 General . 8 6.2 Cables . 8 6.3 Shielding . 8 6.4 RF disturbance generator 8 6.5 IC stripline . 8 6.6 50 termination 8 6.7 DUT monitor 8 7 Test setup 9 7.1
20、 General . 9 7.2 Test configuration 9 7.3 EMC test board (PCB) . 9 8 Test procedure . 9 8.1 General . 9 8.2 Operational check . 10 8.3 Immunity measurement . 10 8.3.1 General . 10 8.3.2 RF disturbance signal 10 8.3.3 Test frequency steps and ranges . 10 8.3.4 Test levels and dwell time . 10 8.3.5 DU
21、T monitoring . 10 8.3.6 Detail procedure 11 9 Test report 11 10 RF immunity acceptance level 11 Annex A (normative) Field strength determination 12 Annex B (normative) IC stripline descriptions . 15 Annex C (informative) Closed stripline geometrical limitations . 18 Bibliography 22 Figure 1 IC strip
22、line test setup . 9 Figure A.1 Definition of height (h) and width (w) of IC stripline . 12 Figure A.2 EM field distribution 13 Figure B.1 Cross section view of an example of an open IC stripline 15 Figure B.2 Cross section view of an example of a closed IC stripline . 16 62132-8 IEC:2012 3 Figure B.
23、3 Example of IC stripline with housing . 17 Figure C.1 Calculated H-field reduction of closed version referenced to referring open version as a function of portion of active conductor width of closed version to open version . 20 Figure C.2 Location of currents and mirrored currents at grounded plane
24、s used for calculation of fields . 21 Table 1 Frequency step size versus frequency range . 10 Table B.1 Maximum DUT dimensions for 6,7 mm IC stripline (Open version) . 16 Table B.2 Maximum DUT dimensions for 6,7 mm IC stripline (Closed version) . 16 Table C.1 Height of shielding, simulated at h bott
25、om= 6,7mm to achieve practically 50 system . 19 4 62132-8 IEC:2012 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC IMMUNITY Part 8: Measurement of radiated immunity IC stripline method FOREWORD 1) The International Electrotechnical Commission (IEC) is a
26、 worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to ot
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35、IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the su
36、bject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62132-8 has been prepared by subcommittee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices. The text of this standard is based on the foll
37、owing documents: FDIS Report on voting 47A/882/FDIS 47A/886/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This part of IEC 62
38、132 is to be read in conjunction with IEC 62132-1. 62132-8 IEC:2012 5 A list of all the parts in the IEC 62132 series, published under the general title Integrated circuits Measurement of electromagnetic immunity, can be found on the IEC website. Future standards in this series will carry the new ge
39、neral title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the d
40、ata related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correc
41、t understanding of its contents. Users should therefore print this document using a colour printer. 6 62132-8 IEC:2012 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC IMMUNITY Part 8: Measurement of radiated immunity IC stripline method 1 Scope This part of IEC 62132 specifies a method for measur
42、ing the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its ap
43、plication. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050 (all parts), International Electrotechnical Vocabulary (available at http:/www.electropedia.org) IEC 62132-1:2006, Inte
44、grated circuits Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 1: General conditions and definitions IEC 61000-4-20, Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides 3 Terms
45、and definitions For the purpose of this document, the terms and definitions given in IEC 62132-1:2006, Clause 3, IEC 60050-131 and IEC 60050-161, and the following, apply. 3.1 transverse electromagnetic mode TEM waveguide mode in which the components of the electric and magnetic fields in the propag
46、ation direction are much less than the primary field components across any transverse cross-section Note 1 to entry: This note only applies to the French language. 3.2 TEM waveguide open or closed transmission line system, in which a wave is propagating in the transverse electromagnetic mode to prod
47、uce a specified field for testing purposes 3.3 IC stripline TEM waveguide, consisting of an active conductor placed on a defined spacing over an enlarged ground plane, connected to a port structure on each end and an optional shielded enclosure 62132-8 IEC:2012 7 Note 1 to entry: This arrangement gu
48、ides a wave propagation in the transverse electromagnetic mode to produce a specific field for testing purposes between the active conductor and the enlarged ground plane. The ground plane of the standard EMC test board according to IEC 62132-1:2006, Annex B, should be used. An optional shielding en
49、closure may be used for fixing the IC stripline configuration and for shielding purposes. This leads to a closed version of the IC stripline in opposite to the open version without shielding enclosure. For further information see Annex A. 3.4 two-port TEM waveguide TEM waveguide with input/output measurement ports at both ends 3.5 characteristic impedance mag
