1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ICS 25.040.40 ISBN 0-626-14605-4 SANS 61326:2003 Edition 1 IEC 61326:2002 Edition 1 SOUTH AFRICAN NATIONAL STANDARD Electrical equipment for measurement,
4、 control and laboratory use EMC requirements This national standard is the identical implementation of IEC 61326:2002 and is adopted with the permission of the International Electrotechnical Commission. Published by Standards South Africa 1 dr lategan road groenkloof private bag x191 pretoria 0001 t
5、el: 012 428 7911 fax: 012 344 1568 international code + 27 12 www.stansa.co.za Standards South Africa 2003 SANS 61326:2003 Edition 1 IEC 61326:2002 Edition 1 Table of changes Change No. Date Scope National foreword This South African standard was approved by STANSA TC 73, Electromagnetic compatibili
6、ty, in accordance with procedures of Standards South Africa, in compliance with annex 3 of the WTO/TBT agreement. NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61326Premire ditionFirst edition2002-02Matriels lectriques de mesure, de commandeet de laboratoire Prescriptions relatives la CEMElectrical
7、equipment for measurement,control and laboratory use EMC requirementsPour prix, voir catalogue en vigueurFor price, see current catalogue IEC 2002 Droits de reproduction rservs Copyright - all rights reservedAucune partie de cette publication ne peut tre reproduite niutilise sous quelque forme que c
8、e soit et par aucun procd,lectronique ou mcanique, y compris la photocopie et lesmicrofilms, sans laccord crit de lditeur.No part of this publication may be reproduced or utilized in anyform or by any means, electronic or mechanical, includingphotocopying and microfilm, without permission in writing
9、 fromthe publisher.International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.chCODE PRIXPRICE CODE WCommission Electrotechnique InternationaleInternational Electrotech
10、nical Commission 61326 IEC:2002 3 CONTENTSFOREWORD 7INTRODUCTION .111 Scope .132 Normative references152.1 General standards .152.2 Immunity standards152.3 Emission standards173 Definitions.174 General.215 EMC test plan .235.1 General .235.2 Configuration of EUT during testing235.2.1 General235.2.2
11、Composition of EUT .255.2.3 Assembly of EUT .255.2.4 I/O ports.255.2.5 Auxiliary equipment255.2.6 Cabling and earthing (grounding)255.3 Operation conditions of EUT during testing.255.3.1 Operation modes255.3.2 Environmental conditions .255.3.3 EUT software during test255.4 Specification of performan
12、ce criteria 255.5 Test description .276 Immunity requirements276.1 Conditions during the tests.276.2 Immunity test requirements 276.3 System and application aspects .296.4 Random aspects 296.5 Performance criteria 297 Emission requirements337.1 Conditions during measurements .337.2 Emission limits.3
13、38 Test results and test report .35Annex A (normative) Immunity test requirements for equipment intended for usein industrial locations.37Annex B (normative) Immunity test requirements for equipment used incontrolled EM environments.39Annex C (normative) Immunity test requirements for portable test
14、andmeasurement equipment .4161326 IEC:2002 5 Annex D (normative) Test configurations, operational conditions and performance criteriafor sensitive test and measurement equipment for EMC unprotected applications.43Annex E (normative) Test configurations, operational conditions and performancecriteria
15、 for portable test, measuring and monitoring equipment used in low-voltagedistribution systems.49Annex F (normative) Test configurations, operational conditions and performancecriteria for transducers with integrated or remote signal conditioning 57Figure 1 Examples of ports .19Figure E.1 Test set-u
16、p for portable test, measuring and monitoring equipment basedon IEC 61000-4-3 53Figure E.2 Example of connection details for voltage measurements.55Figure E.3 Example of connection details for current measurements .55Figure F.1 Example of a transducer with integrated signal conditioning .59Figure F.
17、2 Example of a transducer with remote signal conditioning 59Figure F.3 Example of the configuration of a force transducer with remote measured-value processing .67Figure F.4 Additional maximum measuring error (fz) versus the maximum measuringerror (fy) for continuous disturbances.71Figure F.5 Additi
18、onal maximum measuring error (fz) versus the maximum measuringerror (fy) for transient disturbances 73Figure F.6 Example of the configuration of a pressure transducer .75Figure F.7 Additional maximum measuring error (fz) versus the maximum measuringerror (fy) 79Table 1 Minimum immunity test requirem
19、ents29Table 2 Example of evaluation of immunity test results .33Table 3 Emission limits for class A equipment.35Table 4 Emission limits for class B equipment.35Table A.1 Immunity test requirements for equipment intended for use in industriallocations .37Table B.1 Immunity test requirements for equip
20、ment used in controlled EMenvironments.39Table C.1 Immunity test requirements for portable test and measurement equipment 41Table F.1 Performance criteria for the different functions 63Table F.2 Circuitry actions for generating an output signal for simulation of amechanical load on the transducer 69
21、Table F.3 Performance criteria for the different functions 69Table F.4 Additional maximum measuring error (fz)for a given maximum measuringerror (fy) for continuous disturbances.71Table F.5 Additional maximum measuring error (fz) for a given maximum measuringerror (fy) for transient disturbances 71T
22、able F.6 Performance criteria for the different functions 77Table F.7 Additional maximum measuring error (fz) for a given maximum measuringerror (fy) 7761326 IEC:2002 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION_ELECTRICAL EQUIPMENT FOR MEASUREMENT,CONTROL AND LABORATORY USE EMC REQUIREMENTSFOREWORD1
23、) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electri
24、cal and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governm
25、ental and non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the International Organization forStandardization (ISO) in accordance with conditions determined by agreement between the two organizations.2) The formal decisions or
26、 agreements of the IEC on technical matters express, as nearly as possible, aninternational consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3) The documents produced have the form of recommendations for internatio
27、nal use and are published in the formof standards, technical specifications, technical reports or guides and they are accepted by the NationalCommittees in that sense.4) In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently
28、 to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5) The IEC provides no marking procedure to indicate its approval and cannot be rendered respon
29、sible for anyequipment declared to be in conformity with one of its standards.6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.Inte
30、rnational Standard IEC 61326 has been prepared by subcommittee 65A: System aspects,of IEC technical committee 65: Industrial-process measurement and control.This standard cancels and replaces the first edition of IEC 61326-1 published in 1997, itsamendment 1 (1998) and its amendment 2 (2000), and co
31、nstitutes a technical revision.The text of this standard is based on the following documents:FDIS Report on voting65A/345/FDIS 65A/348/RVDFull information on the voting for the approval of this standard can be found in the report onvoting indicated in the above table.This publication has been drafte
32、d in accordance with the ISO/IEC Directives, Part 3.The general indications given in IEC Guide 107 have been followed.61326 IEC:2002 9 Annexes A, B, C, D, E and F form an integral part of this standard.The committee has decided that the contents of this publication will remain unchangeduntil 2003. A
33、t this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended.The contents of the corrigendum of July 2002 have been included in this copy.61326 IEC:2002 11 INTRODUCTIONInstruments and equipment within the scope of this standard may often be geographicallywid
34、espread and may have to operate under a wide range of environmental conditions.The limitation of undesired electromagnetic emissions ensures that no other equipment,installed nearby, is unduly influenced by the equipment under consideration. The limits aremore or less specified by, and therefore tak
35、en from, IEC and International Special Committeeon Radio Interference (CISPR) publications.However, the equipment has to function without undue degradation in a typical electromagneticenvironment. The limit values for immunity specified in this standard have been chosen underthis assumption. Special
36、 risks, involving for example nearby or direct lightning strikes, circuit-breaking, or exceptionally high electromagnetic radiation in close proximity, are not covered.Complex electric and/or electronic systems require EMC planning in all phases of their designand installation, taking into considera
37、tion the electromagnetic environment, any specialrequirements, and the severity of failures.61326 IEC:2002 13 ELECTRICAL EQUIPMENT FOR MEASUREMENT,CONTROL AND LABORATORY USE EMC REQUIREMENTS1 ScopeThis International Standard specifies minimum requirements for immunity and emissions regardingelectrom
38、agnetic compatibility (EMC) for electrical equipment, operating from a supply of lessthan 1 000 V a.c. or 1 500 V d.c. or from the circuit being measured, intended for professional,industrial-process and educational use, including equipment and computing devices for measurement and test; control; la
39、boratory use; accessories intended for use with the above (such as sample handling equipment),intended to be used in industrial and non-industrial locations.Computing devices and assemblies and similar equipment within the scope of informationtechnology equipment (ITE) and complying with applicable
40、ITE EMC standards can be usedwithout additional testing.Where a relevant dedicated EMC standard exists, it shall take precedence over all aspects ofthis product-family standard.The following equipment is covered in this standard.a) Electrical measurement and test equipmentThis is equipment which by
41、electrical means measures, indicates or records one or moreelectrical or non-electrical quantities, also non-measuring equipment such as signalgenerators, measurement standards, power supplies and transducers.b) Electrical control equipmentThis is equipment which controls one or more output quantiti
42、es to specific values, with eachvalue determined by manual settings, by local or remote programming, or by one or moreinput variables. This includes industrial process measurement and control (IPMC)equipment, which consists of devices such as: process controllers and regulators; programmable control
43、lers (PC); power supply units of equipment and systems (centralized or dedicated); analogue/digital indicators and recorders; process instrumentation; transducers, positioners, intelligent actuators, etc.c) Electrical laboratory equipmentThis is equipment which measures, indicates, monitors or analy
44、ses substances, or is usedto prepare materials.61326 IEC:2002 15 This standard is applicable to equipment for use in industrial locations; equipment for use in laboratories or test and measurement areas with a controlledelectromagnetic environment; test and measurement equipment which is portable an
45、d powered by battery or from thecircuit being measured.This equipment may also be used in areas other than laboratories.2 Normative referencesThe following referenced documents are indispensable for the application of this document. Fordated references, only the edition cited applies. For undated re
46、ferences, the latest edition ofthe referenced document (including any amendments) applies.2.1 General standardsIEC 60050-151:2001, International Electrotechnical Vocabulary (IEV) Part 151: Electrical andmagnetic devicesIEC 60050(161):1990, International Electrotechnical Vocabulary (IEV) Chapter 161:
47、 Electro-magnetic compatibilityIEC 60359, Expression of the performance of electrical and electronic measuring equipmentIEC 61010 (all parts), Safety requirements for electrical equipment for measurement, control,and laboratory useIEC 61557 (all parts), Electrical safety in low voltage distribution
48、systems up to 1 000 V a.c.and 1 500 V d.c. Equipment for testing, measuring or monitoring of protective measuresIEEE 488.1:1987, IEEE standard digital interface for programmable instrumentationIEEE 1284:1994, IEEE standard signalling method for a bidirectional parallel peripheralinterface for person
49、al computersTIA/EIA-232-F:1997, Interface between data terminal equipment and data circuit-terminatingequipment employing serial binary data interchange2.2 Immunity standardsIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) Part 4-2: Testing and measure-ment techniques Electrostatic discharge immunity test Basic EMC PublicationIEC 61000-4-3:1995, Electromagnetic compatibility (EMC) Part 4-3: T
