1、MILITARY SPECIFICATION TEST PROGRAM SET (TPS) - OPERATIONAL TEST PROGRAM SETS (OTPS) FOR F/A-18 UNITS UNDER TEST (UUT), - GENERAL SPECIFICATION FOR This specification is approved for use by Naval Air Systems Command, Department of the Navy, and is available for use by all Departments and Agencies of
2、 the Department of Defense. 1. SCOPE 1.1 Scope. This specification defines the general require-. ments for performance, design, development, fabrication, integration, test, and documentation, of operational test program sets (OTPS) and test program sets (TPS) used with the F/A-18 automatic test equi
3、pment (ATE), and preparation for delivery of OTPSs. 1.2 Intended use. -The TPS as part of the OTPS will be utilized by Navy personnel of skill level E-4 or above at intermediate and depot level maintenance activities, to perform maintenance on selected units under test (UUTs). Beneficial comments (r
4、ecommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commanding Officer, Naval Air Engineering Center, Engineering Specifications and Standards Department (ESSD) Code 93, Lakehurst, NJ 08733, by using the self-addressed S
5、tandardization Document Improve- ment Proposal (DD Form 1426) appearing at the end of this document or by letter. 1 FSC 6625 -1- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-T-85549 (AS) 1.3 Referenced paragraph citation. Where paragraphs of t
6、his specification or any of its referenced documents are cited,-the citation shali be understood to include all sub- paragraphs unless otherwise noted. 2. APPLICABLE DOCUMENTS 2.1 Referenced Documents. The documents listed in Section 2, hereunder, form a part of this specification to the ex- tent in
7、voked by specific reference in other paragraphs of this specification. If a specification is referenced within this document without indicating any specific paragraphs as being applicable, then the specification is applicable in its entirety. Where a specific issue of the document is specified below
8、, no other issue shall be used without the prior written approval of the Navy. When documents are referenced in other sections, a short form citing only the basic number of the document is used; revision letters, amendment indicators, notices, supplements and dates are omitted 2.2 Issues of document
9、s. The following documents of the issue in effect on date of invitation for bids or request for proposal, form a part of this specification to the extent specified herein. SPECIFICATIONS MILITARY MIL-A-8421 - Air Transportability Requirements, General Specification for MIL-N-18307 - Nomenclature and
10、 Identification for (NAVY) Electronic, Aeronautical and Aeronautical Support Equipment Including Ground Support Equipment M IL-P- 1 1 Ci - Preservation - Packaging, Methods of MIL-T-28800 - Test Equipment for use with Electronic and Electrical Equipment, General Specification for MIL-e-23377 - Prime
11、r Coating, Epoxy- Polyamide, Chemical and Solvent Resistant for Weapons System .MIL-M-38784 - Manuals, Technical, General Requirements -2- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-T-85549 66 77999CIb CIL45471 L MIL-C-55302 MIL-C-81773 MIL-
12、T-81914 DOD-D-1000 STANDARDS FEDERAL * FED-STD-595 MI LI TARY MIL-STD-108 MIL-STD-129 MI L-STD-454 MI L-STD-461 MIL-STD-882 MIL-STD-1472 MIL-STD-2076 MIL-STD-2077 MIL-STD-2084 (AS) MIL-T-85549 (AS) - Connectors, Printed Circuit Sub- - Coating, Polyurethane, Aliphatic Weather - Tubing, Plastic, Flexi
13、ble, Convoluted, Conduit, General Specification for - Drawings, Engineering and Associated Lists assembly and Accessories Resistant - Colors - Definitions of and Basic- Requirements for Enclosures for Electric and Electronic Equipment - Marking for Shipment and Storage - Standard General Requirement
14、s for Electronic Equipment - Electromagnetic Interference Charac- teristics, Requirements for Equipment - System Safety Program for Systems and Associated Subsystems and Equipment, Requirements for - Human Engineering Design Criteria for. Military Systems, Equipment for Facilities - Unit Under Test
15、Compatibility with Automatic Test Equipment, General Requirements for Requirements for Electronic Systems and Equipment, General Requirements for - Test Program Sets, General - Maintainability-of Avionic and -3- Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro
16、m IHS-,-,-MIL-T-85549 (AS) HANDBOOK . MILITARY MIL-HDBK-217 - Reliability Stress and Failure Rate Data for Electronic Equipment PUBLICATIONS MI LI TARY OPNAVINST 4790 2B - The Naval Aviation Maintenance Program (NAMP) - Volumes I, II, III, and IV NAEC-MISC-92-0555 - Program Design Handbook (1 August
17、 1979) for Automatic Test Equipment NAEC-MISC-92-0554 - Avionics Design Guide for ATE (1 August 1979) Compatibility NAEC-MISC-92-0564 - General Acceptance Test Procedure (26 March 1982) (GATP) for Test Program Sets (TPS) and Operational Test Program Sets (OTPS) for F/A-18 Units Under Test PRD No. 39
18、000013-001 - Hybrid Test System (HTS), ATLAS (May 1981) Users Guide PRD No. TBD - Avionic Test Set (ATS), ATLAS Users Guide (Copies of specifications, standards, drawings and publications required by contractors in connection with specific procurement functions should be obtained from the procuring
19、activity or as directed by the contracting off icer, ) 2.3 Other publications. The following documents of the issue in effect on date of invitation for bids or request for proposal form a part of this specification to the extent specified herein. AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI) ANSI-STD
20、-Y32.2 - Graphic Symbols for Electrical and Electronic Diagrams -4- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-f MIL-T-5547 bb m 7777706 03Y5473 5 m MIL-T-85549 (AS) ANSI-STD-Y32.16A - Reference Designations for Electrical and Electronics Parts
21、and Equipeen t (Applications for copies should be addressed to the American Standards Institute, 1430 Broadway, New York, NY. 10018.) INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE) IEEE-STD-416-1981 - IEEE Standard ATLAS Test Language IEEE-STD-416A-1976 - ATLAS Syntax IEEE-STD-771-1980 - G
22、uide to the Use of ATLAS (Application for copies should be addressed to the IEEE Standards Office, 345 East 47th Street, New York, NY. 10017.) (Technical society and technical association specifications and standards are generally available for reference from libraries. They are also distributed amo
23、ng technical groups and using Federal agencies.) - 3. REQUIREMENTS 3.1 Item definition. The operational test program set (OTPS) is the result of merging one or more test program sets (TPSs) into a group which share a common interface device (ID) for the purpose of testing a selected reasonable group
24、ing of weapon replaceable assemblies (WRAs) or shop replaceable assemblies (SRAS). In addition to the UUT TPSs comprising the OTPS, a self-test for the common ID shall-also be included. The requirements of the ID self-test shall be as specified in 3.2.4.2.1. The TPS consists.of the following element
25、s: a. Test Program (TP) b. Interface Device (ID) c. Test Program Instruction (TPI) d. Supplementary Data 3.1.1. Test program (TP) definition. The test pro- gram (TP) is a set of coded instructions residing on a -5- - Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
26、e from IHS-,-,-MIL-T-85549 (AS) test program medium (TPM) that controls the testing of the UUT, The objective of the TP shall be to auto- matically ascertain the operational readiness con- dition of the UUT, detect the presence of faults in the UUT, and isolate a fault to the required level specifie
27、d herein, This is accomplished by ordered test routines which process stimulus and response data to and from the UUT, and evaluate the results. All test programs of an OTPS shall be merged onto a common TPM. 3.1.2 Interface device (ID) definition. The inter- face device (ID) provides the necessary e
28、lectrical, mechanical, hydraulic, pneumatic, radiated, and opti- cal interfaces between the ATE and the UUT, An ID can consist of simply a panel ID which mates directly with the UUT/ATE interface of the ATE, but can also include a cable set and test fixture as required by individual TPS requirements
29、, All of the ID requirements of the individual TPSs of an OTPS shall be merged into a common ID. 3.1.2,l Panel ID. The panel ID shall contain the necessary wiring and circuitry to interface the UUT to the ATE and to resolve any incompatibilities which exist between the ATE and the UUT in order to im
30、ple- ment the test requirements. The panel ID shall provide electrical interface connectors to electric- ally interface the UUT operational connector(s) and test connector(s) via an external cable assembly. UUTs, which are plug-in circuit card assemblies, shall plug directly into circuit card recept
31、acles mounted on the panel ID and shall be physically supported by the panel ID, 3*1.2,2 Cable set, The cable set, when required, shall provide the means to route power, stimulus, measurement and test point signals between the UUT/ID/ATE to effect testing of the UUT and self test of the panel ID, wh
32、en applicable, 3,1,2.3 Test fixture. When required by a particular UUT, and in addition to the panel ID, a test fixture shall be provided as part of the TPS to provide an electrical and mechanical interface with the UUT. In such cases, the cable set interfaces the panel ID to the test fixture, 3.1.3
33、, Test program instructions (TPI) definition. The test program instruction (TPI) shall provide !FPS related informatin needed for testing, (e.g. hook-up, probe point locations, or other programmed operator inter- vention which cannot be conveniently provided or dis- -6- Provided by IHSNot for Resale
34、No reproduction or networking permitted without license from IHS-,-,-MIL-T-85599 66 = 9799906 OLL15475 9 M MIL-T-85549 (AS) played by the ATE under program control). The TPI shall be prepared in accordance with the format of Appendix A of MIL-STD-2077. All TPIs of an OTPS shall be merged into a comm
35、on operational test program instruc- tion (OTPI). 3.1.4. Supplementary data definition. The supplementary data consists of information, text, schematics, logic diagrams, and UUT source data necessary to fully develop, document, deliver, operate, repair and modify all elements of a TPS as well as ana
36、lyze the TPS and UUT in the event of a problem or anomaly during the testing process. Sup- plementary data shall conform to the requirements of 3.3.4 herein. The supplementary data within an OTPS shall consist of the supplementary data packages of the individual TPSs within the OTPS. 3.2 Characteris
37、tics 3.2.1. Performance characteristics. Each TPS of an OTPS shall meet all requirements when operated in con unction with the associated ATE and UUTs. The ciated ATE and UUTs in any mode of operation (including OFF mode). The performance and capabi- lities of the associated ATE and UUTs shall in no
38、 way be degraded or damaged by operation of the equipment covered herein. All references to ATE shall be understood to mean both the test equipment hardware and applicable systems software. OTP i! shall not be damaged by operation of the asso- 3.2.1.1 Performance tests (PT). Performance tests (PT) s
39、hall contain all tests required to determine that a UUT is ready for issue (RFI). This shall be accomplished by discrete tests designed to automa- tically detect and annunciate the presence of any malfunction within the UUT that degrades system per- formance beyond its operational performance requir
40、e- ments and shall be performed without the use of ancilliary test equipment. Satisfactory completion of the performance tests shall assure that the UUT will perform its designed function when inserted into its next higher assembly. All internal power supplies and clocks shall be verified immediatel
41、y following power application, if feasible. The performance tests shall be designed to detect those faults with a higher probability of occurrence early in the program to minimize program run time. The performance tests shall also test the built-in-test (BIT) circuitry of the UUT and cause the TP to
42、 do a proper fault isolation in the event a fault is detected. Where practicable, BIT information shall be used early in the performance tests to aid in reducing program run times. BIT shall formance tests. I not, however, be a substitute for any functional per- a I -7- Provided by IHSNot for Resale
43、No reproduction or networking permitted without license from IHS-,-,-MIL-T-85549 (AS) 3.2.1.1.1 UUT performance testing interface. Access to signals shall be through external operational and test connectors. Removal of UUT covers, use of extender boards, probing, or any combination of the above, sha
44、ll not be permitted during performance testing, 3.2.1.2 Fault detection. The TPS shall detect faults which degrade UUT performance to the extent that the designated functions of the UUT cannot be performed. Proper operation of BIT circuits shall be considered part of the UUT designated function, The
45、 UUT desig- nated function(s) shall be derived from government furnished UUT source data. 3.2.1.3 Diagnostic fault isolation (DFI) tests. The diagnostic fault isolation (DFI) tests shall identify fault(s) detected by the performance test(s) and isolate to the next lower level of assembly. Fault isol
46、ation accuracy and limitations to ambiguity group sizes shall be in accordance with the specifications herein, It shall, however, be a design goal for all DFI routines to isolate to the next lower replaceable unit by automatic testing, The DFI shall consist of fault isolation routines designed to is
47、olate to those faults with a higher probability of occurrence early in the diagnostic sequence to minimize program fault isolation run time, All testing results shall be dis- played via the ATE cathode rag tube (CRT) and printer. When a repairable assembly is specified to be replac- ed, any addition
48、al information derived from these tests which may be beneficial in its repair, shall also be printed on the ATE printer. For example, when an ambiguity is resolved based on the failed condition of a component(s) in the specified replaceable unit, then that component(s) shall be called out as well. 3
49、.2.1.3.1 UUT fault isolation testing interface. Access to signals shall be through external opera- tional or test connectors. It shall be a design goal that removal of UUT covers, use of extender boards, probing, or any combination of the above shall not be necessary in order to meet the requirements of 3.2.1.3.2 during DFI, 3.2.1.3.2 Ambiguity groups. The order of priorities in determining ambiguity group sizes shall be as follows : a. It shal
