1、MIL-P-82534 13 W 7997906 OLI32212 T W MIL-P-g2534(OS) 18 April i968 Superseding NOTs XS 5114 Rev, H MILITARY SPECIFICATION 29 September 1967 FOR PROGRAMMER, RANGE AND AIRFRAME SEPARATION MARK 3 MOD 1 This specification has been approved by the Naval Ordnance Systems Command, Department of the Navy 1
2、. SCOPE 1.1 This specification establishes the requirements cf one type of Pro- grammer, Range and Airframe Separation Mark 3 Mod l. (See 6. l for intended use and description.) 2. APPLICABLE DOCUMENTS 2.1 The following documents, of the issue in effect on the date of invita- tion for bids, form a p
3、art of this specification to the extent specified herein, ex- cept as noted, SPECIFICATIONS MILITARY MIL-E-5272 Environmental Testing, Aeronautical and Associated Equipment, General Specifica- tion for ST ANDAZWS FEDERAL FED-STD-102 Preservation, Packaging, and Packing Levels FSC -1340 Provided by I
4、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MILITARY MIL-STD-129 MIL-STD- 167 Marking for Shipment and Storage Mechanical Vibrations of Shipboard Equip- ment DRAWINGS BUREAU OF NAVAL WEAPONS LD 497947 Container, Ignition and Separation Assembly, Mark 176 Mod
5、1 and all documents listed thereon LD 541505 Tester, Acceptance, Range and Airframe Separation Programmer and all documents listed thereon LD 541536 Programmer, Range and Airframe Separation Mark 3 Mod 1 and all docu- ments listed thereon LD 541554 Preserved (Packaging Condition) (Programmer, Range
6、and Airframe Separation) and all documents listed thereon LD 541555 Shipping (Packing Condition) (For one Programmer, Range and Airframe Separation) and all documents listed thereon PUBLICATIONS BUREAU OF NAVAL WEAPONS OD 12995 Operation and Maintenance Instructions for Range and Airframe Separation
7、 Pro- grammer Acceptance Tester (Copies of specifications, standards, drawings, and publications required by suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer.) 2 Provided by IHSNot for ResaleNo reprod
8、uction or networking permitted without license from IHS-,-,-MIL-P-82534 13 m 7779706 0432214 3 m z MIL-P-82534 (OS) 3. REQUIREMENTS 3.1 General reauirements. Unless otherwise specified in the contract or order, all materials and treatments of materiais and parts used in the manu- facture of the prog
9、rammer shall be in accordance with the requirements specified herein and with the applicable documents listed in BuWeps LD 541536. or order, preproduction samples of the programmer shall be manufactured using the methods and procedures proposed for production. The sample shall be tested as specified
10、 in Section 4 herein and is for the purpose of determining that, prior to starting production, the contractors production methods are capable of yielding items that comply with the technical requirements of the contract. meet the following performance and product Characteristics. shall have the resi
11、stances indicated. 3.2 Preproduction am des. Unless otherwise specified in the contract 3.3 Performance and rwoduct charaderistics. The programmer shall 3.3.1 Circuit resistance. The programmer circuits, listed in Table I, Table I. Programmer Circuit Resistance Requirements Circuits Connector Connec
12、tor 1Al J1 Header S and *S and S and S and S and S and *S and L (S negative) N (S negative) M (S positive) F (S negative) B (S negative) d (S negative) f (S negative) 1AlJ3 1 and 2 1AlJ6 1 and 2 I I BB and AA BB and BC BB BA BC 1AlJ5 3 1AlJ5 4 I 1AlJ5 5 Test Equip. in 4.4.1 Specified b b b b b b b R
13、esistance in Ohms 100 * 10 910 f 100 25 to 200 3700 f 800 3700 f 800 500 min 50 to 5000 o. 020 to o, 100 0.020 to 0.100 2.20 to 2.75 2.20 to 2.75 0.05 rnax 0.05 max 0.05 max * Programmer cover side down * The resistance between S and f (S negative) shall be 25 to 5000 ohme after performing the accel
14、eration tests in 4.5.1.7. 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-P-82534 33 W 9997306 0432235 5 1 Table I, Programmer Circuit Resistance Requirements Test Equip. Circuits Connector Connector Specified 1Al J1 1AlJ2 Header in 4.4.1 BB H
15、b BA J b Bc L b b A b h C b e D b banda b E E b J F b AC and AB b K N b AA and AB b SdH b P K b C P b Sandg b HandC b s to housing b VandW b fdG b V B b 4 (Continued) Resistance in Ohms 0.05 max 0.05 max 0.05 max 0.075 max 0.075 rnax 0.075 rnax 0.04 max 0.075 rnax 0.075 rnax O. 725 f O. 125 0.075 rn
16、ax O. 725 f O. 125 O. 15 max 0.075 max 0.075 max 0.15 rnax 0.04 rnax 0.15 max 0.04 rnax 0.04 rnax 0.075 max 3.3.2 Indation resistance. At a potential of 500 plus or minus 50 volts DC, the programmer shall have an insulation resietance of not less than 20 megohms between: a. Each of the eight indepen
17、dent circuits of connector 1AlJ2 b. The eight independent circuits of connector 1AlJ2 and the programmer housing c. The eight independent circuits of connector 1AlJ2 and the shell of connector 1AlJ2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL
18、-P-2534 13 W 777770b 0432236 7 W i MIL-P-g2534(OS) 3.3.3 Nonfnction indication. 3.3.3.1 Arminn circuit. The resistance between contacts S and D of connector 1AlJ1 shall be not less than 80 ohms, prior to being subjected to the acceleration test of 4.5.1.7. After the acceleration test the resistance
19、shall be not more than 80 ohms. 3.3.3.2 Interlock circuit. The resistance between contacts S and A of conneotor 1AlJ1 shall be not less than 80 ohms. 3.3.3.3 Misfire indicator circuit. The insulation resistance between contacts Y and U of connector 1Al J1 shall be not less than 5 megohms, when the a
20、pplied potential is 500 plus or minus 50 volts DC, 3.3.4 Che ration. The programmer, when energized with 12.75 plus or minus 0.25 volts DC applied across contacts f (positive) and H (negative) of con- nector 1AlJ1, shall provide the following voltages, measured with respect to contact S of connector
21、 1AlJ1. 3.3.4.1 Regulated voltage. The programmer shall provide a regulated voltage of 10.000 plus or minus O. O10 volts DC, measured at pin M (positive). 3.3.4.2 Resaturation voltage. The programmer shall provide a voltage of 0,210 plus or minus 0.010 volt DC, measured atpin L (positive). 3.3.4.3 T
22、wentv-eiaht volt outwt. The programmer shall provide 28 plus or minus 3 volts DC, measured at pin d (positive). 3.3.4.4 Channel one outuut. The programmer shall provide a readback voltage of 4 volts DC, across a resistance of 27 ohms, measured at pin D si- tive) when a proper sequence of presaturati
23、on voltage, set-in voltage, and re- saturation voltage is applied at pin F. (The sequence and values of these voltages are described in detail in 4.6.1.4.4. ) Readback time shall be as specified in Table II. 3.3.4.5 Channel two oubut. The programmer shall provide a readback voltage of 4 volts DC acr
24、oss a resistance of 27 ohms measured at pin A when a proper sequence of presaturation voltage, set-in voltage, and resaturation volt- age is applied at pin B. (The sequence and values of these voltages are described in detail in 4.6.1.4.5.) Readback time shall be as specified in Table II. 3.3.4.6 Pe
25、rformance at smcific temperatures. The programmer shall provide charnel one and channel two outputs in accordance with requirements of 3 b 3.4.4, 3.3.4.5 and Table II after bei% stabilized for 4 hours minimum at the indicated temperatures. 5 Provided by IHSNot for ResaleNo reproduction or networking
26、 permitted without license from IHS-,-,-MIL-P-2534 13 m 7979706 0432217 7 MIL-P-82534 (OS) Table II. Performance at Specific Temperatures Set-in voltage (negative volta DC) Channel one: 25.000 f 0,025 50.000 f 0.050 100.000 f o. 100 Channel two: 20,000 f 0.020 40.000 i O, 040 80.000 f 0.080 Required
27、 readback time (seconds) 1.000 2.000 4.000 10.000 20.000 40.0100 Tolerance of readings as a maximum RMS value of error of readback time (seconds) at f plus 5 35 minus O degrees F O. 04 O. 04 O. 04 O. 50 O. 50 O. 50 lowing temi Room ambient o. 02 0.02 o. 02 O. 50 O. 50 O. 50 ratures plus o minus 5 de
28、grees F O. 04 O, O4 O. o4 O. 50 a- O. 50 O. 50 3.3 I 4.7 Outut energv, The programmer shall provide output signals from the channel one and channel two functions as electrical pulses of not less than 2 million ergs when dissipated within 3 milliseconds through a resistance of 2.0 ohms. 3.3.4.8 Chann
29、el one outwt guarantee. The programmer shall provide a channel one output even though the signal from the accelerometer may cease before channel one has functioned. 3.3.5 Enclosure. The programmer shall be airtight with a leakage rate of not more than 10 to the minus fifth power cubic centimeter per
30、 second of helium at one atmosphere pressure differential. 3.4 Environmental reauirements. Unless otherwise specified, the pro- grammer shall be capable of conforming to the performance and product charac- teristics of this specification ailer being exposed to the environments and all conditione spe
31、cified herein. 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-P-Z534 13 = 777770b 04322L O MIL-P-82534 (OS) 3.4.1 Temwrature, storage condition. The programmer shall withstand 3.4.2 Humiditv. The programmer shall withstand relative humidity up
32、 to 3 , 4.3 Shock. standbv condition. The programmer shall withstand shocks temperatures from minus 65 to plue 160 degreee Fahrenheit (F). 95 percent as specified in MIL-E-5272, Procedure 1. of 4% (g = unit of gravitational acceleration) peak magnitude. The shock shall have a pulse shape approximati
33、ng a one-half sine wave having a duration of 5 milliseconds. 3.4.4 Vibration. standbv condition. The programmer shall withstand vibration as specified for Type I equipment in MIL-STD-167 up to 25 cps (cycles per second). 3.4.5 Vibration. oueratinn condition. The programmer shall withetaad vibration
34、through a frequency range of 20 to 2000 cpa at O. lO-inch double ampli- tude or log, whichever is lesa, channel one and channel two output requirements of 3.3 , 4.4 and 3.3.4.5. The individual readback times shall be within 0.05 and 0.80 second of the required readback times for channel one and chan
35、nel two, respectively. During vibration the programmer shall meet the 3.4.6 Temuerature, operatina condition. The programmer shall meet the performance and product characteristics while at temperatures from 35 to 120 degrees F. 25g for 4 seconds applied in the direction shown in Figure 1, and therea
36、fter shall me reading accuracy of plus or minus 5 percent; applied current limited to a maximum of 10 milliamperes 0.01 to 30.00 ohms; reading accuracy of plus or minus 5 percent; applied curreat limited to a maximum of 10 milliamperes 5 to 20 megohms; accuracy 5 percent with 500 plus or minus 50 vo
37、lts DC potential 11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NIL-P-8253LI 13 m 777770b 0932223 9 MIL-P-82534 (OS) EqUiDment Carmbilitv d. Temperature chamber Maintain temperature at: Plus 35 plus 5 minus O degrees F Plus 120 plus O minus 5 deg
38、rees F e. Oeciiloscope 5-inch diameter tube, triggered, Cali- brated sweep of 1 millisecond per centimeter, rise time less than 1 microsecond; camera attached for recording trace f. Tester, Acceptance, BuWepa LD 541505. Operate in accor- Range and Airframe Separation Programmer dance with OD 12995.
39、g. Mass spectrometer Minimum sensitivity of 10 to the minus helium leak detector sixth power cubic centimeters per second of helium 4.4.2 Preproduction and iieriodic Droduction test eauimnent. The following items of test equipment, in addition to selected items of quality conformance inspection equi
40、pment and pieces of equipment recommended by applicable speci- fications or standards referenced within test procedure paragraphs, are required to perform the preproduction and periodic production tests: Eauiment Cauabilitv a. Temperature chamber Maintain temperature at: c Minus 65 plus 5 minus O de
41、grees F Plus 35 plus 5 minus O degrees F Plus 120 plus O minus 5 degree8 F Plus 160 plus O minus 5 degrees F b. Shock equipment c. Vibration testing machine d. Centrifuge Apply shocks of 40 plus or minus 4g peak magnitude; a one-half sine wave pulse shape of 5 plus 3 minus O milli- seconds time dura
42、tion; maintain direc- tion dorig epecified axes Control frequency from 20 to 2000 cps while subjecting the test item to O. 10- inch double amplitude or log accelera- tion, whichever is less; maintain direc- tion of vibration along specified axes O to 27.56; maintain acceleration at 25 plus 2.5 minus
43、 Og 12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-flIL-P-8253LI 13 7779706 0432224 b W MIL-P-82534 (OS) 4.43 Test mnditions. Uniese otherwise specified, the programmer shall be subjected to the preproduction and periodic production tests and the
44、 quality conformance inspection tests under the following conditions: a. Temperature Room ambient (66 to 95 degrees F) b. Altitude Normal ground atmospheric pressure C. Humidity (Relative) Room ambient up to 95 percent 4.5 Preproduction and periodic production inspections. The preproduction and peri
45、odic production samples shall be subjected to the tests specified in 4.5.1 after satisfactorily passing the quality conformance inspection detailed in 4.6. 4.5.1 Test orocedure. Subject the programmer to the test sequence listed in Table III. Unless otherwise specified in the individual test paragra
46、ph, the quality conformance inspection as specified in Table In shall be performed sub- sequent to environmental tests under test conditione specified in 4.4.3. Failure of the programmer to pass any one of these tests shall constitute a defective unit. 4.5.1.1 Temperature. storaae condition. The pro
47、grammer shall be sub- jected to a temperature of minus 65 plus 5 minua O degrees F for not lesa than 48 hours. The temperature shall be raised to plus 160 plus O minus 5 degrees F in not less than 2 hours and maintained at this temperature for not less than 48 hours. The unit shall then be subjected
48、 to room temperature for not less than 4 hours prior to performing subsequent tests. 4.5.1.2 Humidity. The programmer shall be subjected to Humidity Test, Procedure I as specified in MIL-E-5272. Connector 1AlJ2 shall be sealed againet moisture during this test. 4.5.1.3 Shock. standbv condition. Subj
49、ect the programmer to shocks of 40 plus or minus 4g peak magnitude with a pulse shape approximating a one-half sine wave, and a duration of 5 plus 3 minus O milliseconds, Shocks shall be applied three times in each direction along each of three mutually perpendicular axes shown in Figure 1. Mount the programmer in a manner similar to that shown in Figure 2. 4.5.1.4 Vibration, standbv condition. The programmer, rigi
