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    JEDEC JESD224A-2017 Universal Flash Storage (UFS) Test.pdf

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    JEDEC JESD224A-2017 Universal Flash Storage (UFS) Test.pdf

    1、JEDEC STANDARD Universal Flash Storage (UFS) Test Version 1.1 JESD224A (Revision of JESD224, March 2013) JULY 2017 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors lev

    2、el and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the

    3、purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve pa

    4、tents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC standards and publications represents a sound appr

    5、oach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No claims to be in conformance wi

    6、th this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Documents for alter

    7、native contact information. Published by JEDEC Solid State Technology Association 2013 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees

    8、not to charge for or resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Association 3103

    9、 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC STANDARD Universal Flash Storage (UFS) Test Version 1.1 JESD224A (Revision of JESD224, March 2013) JULY 2017 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JE

    10、DEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating

    11、misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domes

    12、tically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to par

    13、ties adopting the JEDEC standards or publications. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whe

    14、reby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC stand

    15、ard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Documents for alternative contact information. Published by JEDEC Solid State Technology Association 2017 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document

    16、may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees not to charge for or resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is cop

    17、yrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC Standard No. 224A -i- Un

    18、iversal Flash Storage (UFS) Test Contents page 1 Scope 1 2 Normative Reference . 1 3 Terms, Definitions, Acronyms, and Symbols 1 4 Introduction 3 4.1 Test specification Guiding Principles 3 5 Test Case Specifications Format 4 6 Assumption 5 7 UFS SCSI Command Test 6 7.1 INQUIRY Command 6 7.2 REQUEST

    19、 SENSE Command . 11 7.3 MODE SENSE Command . 15 7.4 MODE SELECT (10) Command 34 7.5 UNMAP Command 55 7.6 START STOP UNIT Command 62 7.7 READ CAPACITY (10) Command . 70 7.8 FORMAT UNIT Command . 71 7.9 TEST UNIT READY Command 75 7.10 WRITE (6) Command 77 7.11 WRITE (10) Command 80 7.12 Read (6) Comma

    20、nd . 86 7.13 Read (10) Command . 89 7.14 Verify (10) Command . 95 7.15 Send Diagnostic Command . 99 7.16 REPORT LUNS Command 102 7.17 SYNCHRONIZE CACHE (10) Command 111 7.18 Pre Fetch (10) Command 116 8 UFS Protocol Test 120 8.1 Context Management 120 8.2 UFS Task Management . 124 8.3 UFS BOOT 128 8

    21、.4 UFS Descriptor 133 8.5 UFS Flag . 149 8.6 UFS Attribute . 174 8.7 UFS Power Mode 218 8.8 UFS RPMB 224 8.9 UFS UPIU 247 8.10 UFS UPIU Flags 249 8.11 UFS Unit Attention Condition . 252 Tables TABLE 1 Configuration Descriptor Header and Device Descriptor Configurable parameters . 124 TABLE 2 Unit De

    22、scriptor Configurable parameters . 124 JEDEC Standard No. 224A -ii- JEDEC Standard No. 224A Page 1 Universal Flash Storage (UFS) Test (From JEDEC Board Ballot JCB-13-18, formulated under the cognizance of the JC-64.5 Subcommittee on UFS Measurement.) 1 Scope The primary objective of this test standa

    23、rd is to specify the test cases for UFS device protocol conformance testing. This test standard provides test cases for checking the functions defined in the following target standard: JESD220, Universal Flash Storage (UFS) Standard version 1.1A MIPI M-PHY and MIPI UniPro test cases are not in the s

    24、cope of this document. 2 Normative Reference UFS JESD220C, Universal Flash Storage (UFS) version 2.1 UFS Card JESD220-2, Universal Flash Storage (UFS) Card Extension version 1.0 UFSHCI JESD223C, Universal Flash Storage (UFS) Host Controller Interface version 2.1 SAM SCSI Architecture Model-5(SAM-5)

    25、Revision05, 19 May 2010 SPC T10 Specification: SCSI Primary Commands 4(SPC- 4) Revision 27, 11 October 2010 SBC T10 Specification: SCSI Block Commands 3(SBC -3) Revision 24, 05 August 2010 3 Terms, Definitions, Acronyms, and Symbols may: Indicates flexibility of choice with no implied recommendation

    26、 or requirement. shall: Indicates a mandatory requirement. Designers shall implement such mandatory requirements to ensure interchangeability and to claim conformance with the specification. should: Indicates a strong recommendation but not a mandatory requirement. Designers should give strong consi

    27、deration to such recommendations, but there is still a choice in implementation. 3.1 Acronyms ATTRVALUE Attribute Value GROUPNUM Group Number LBA Logical Block Address LUN Logical Unit NumberMIPI Mobile Industry Processor Interface PCODE Page Code RPMB Replay Protected Memory Block SPCODE Sub Page C

    28、ode TSF Transaction Specific Fields UFS Universal Flash StorageUPIU UFS Protocol Information Unit UniPro Unified Protocol ASYNC Out of order execution support JEDEC Standard No. 224A Page 2 3.2 Naming Conventions Some terms are capitalized to distinguish their definition from their common English me

    29、aning. Words not capitalized retain their common English meaning. 3.3 Numbers and Number Bases Hexadecimal numbers are written with a lower case “h“ suffix, e.g., FFFFh and 80h. Binary numbers are written with a lower case “b“ suffix (e.g., 10b). Binary numbers larger than four digits are written wi

    30、th a space dividing each group of four digits, as in 1000 0101 0010b. All other numbers are decimal. 3.4 Symbols Dash (-) not applicable (n/a) JEDEC Standard No. 224A Page 3 4 Introduction Universal Flash Storage (UFS) is a simple, high performance, mass storage device with a serial Interface. It is

    31、 primarily for use in mobile systems, between host processing and mass storage memory devices. The following is the summary of the UFS functional features, Similar functional features as eMMC Boot Operation Mode Device enumeration LLBAA = 0, DBD = 1, PAGE CODE = Ah, SUBPAGE CODE = 00h, ALLOCATION LE

    32、NGTH = 0h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. No data shall be returned. JEDEC Standard No. 224A Page 16 7.3.2 Test Case Id: UFS_ModeSense_02 Ref. specs Section UFS: Section 11.3.4 Test Purpose To

    33、 verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 00b Test Procedure Precondition:None. Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 00b, LLBAA = 0, DBD = 1, PAGE CODE = 0Ah, SUB

    34、PAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Control mode page content is device specific. JEDEC Standard No. 224A Page 17 7.3.3 Test Case Id: UFS_ModeSense_03 Ref.

    35、 specs Section UFS: Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 01b Test Procedure Precondition:None Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) P

    36、C = 01b, LLBAA = 0, DBD = 1, PAGE CODE = 0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. The value of the following fields shall be verified: TST=000b, SWP=1b

    37、and 0000h JEDEC Standard No. 224A Page 18 7.3.4 Test Case Id: UFS_ModeSense_04 Ref. specs Section UFS: Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 10b Test Procedure Precondition:None Main: 1. Issue MODE SENSE (10) command.

    38、 2. Verify expected output. Clean up: None. Input parameter values MODE SENSE (10) PC = 10b, LLBAA = 0, DBD = 1,PAGE CODE = 0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success

    39、GOOD - - 2. Control mode page content is device specific. JEDEC Standard No. 224A Page 19 7.3.5 Test Case Id: UFS_ModeSense_05 This test case may be applied only if PS bit of the Control mode page is equal to one. Ref. specs Section UFS: Section 11.3.4 Test Purpose To verify the status of MODE SENSE

    40、 (10) command with PAGE CODE = 0Ah (Control mode) and PC = 11b Test Procedure Precondition:None Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 11b, LLBAA = 0, DBD = 1, PAGE CODE = 0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGT

    41、H = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Control mode page content is device specific. JEDEC Standard No. 224A Page 20 7.3.6 Test Case Id: UFS_ModeSense_06 Ref. specs Section UFS: Section 11.3.

    42、4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 01h (Read-Write Error recovery mode) and PC = 00b Test Procedure Precondition:None. Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 00b, LLBAA = 0, DBD = 1,PAGE CODE = 01h, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Read-Write Error recovery mode page content is device specific.


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