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    JEDEC JESD224-2013 Universal Flash Storage (UFS) Test.pdf

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    JEDEC JESD224-2013 Universal Flash Storage (UFS) Test.pdf

    1、JEDEC STANDARD Universal Flash Storage (UFS) Test JESD224 MARCH 2013 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by t

    2、he JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with mini

    3、mum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By

    4、 such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC standards and publications represents a sound approach to product specification and application,

    5、 principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No claims to be in conformance with this standard may be made unless all requir

    6、ements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Documents for alternative contact information. Published by JEDEC

    7、 Solid State Technology Association 2013 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees not to charge for or resell the resulting mate

    8、rial. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington,

    9、VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. JEDEC Standard No. 224 -i- Universal Flash Storage (UFS) Test Contents page 1 Scope 1 2 Normative Reference . 1 3 Terms and Definitions 1 4 Introduction 3 4.1 Test specification Guiding Principles 3 5 Test Case

    10、Specifications Format . 4 6 Assumption 5 7 UFS SCSI Command Test . 6 7.1 INQUIRY Command 6 7.2 REQUEST SENSE Command . 11 7.3 MODE SENSE Command . 15 7.4 MODE SELECT (10) Command 34 7.5 UNMAP Command 50 7.6 START STOP UNIT Command 57 7.7 READ CAPACITY (10) Command . 65 7.8 FORMAT UNIT Command . 66 7

    11、.9 TEST UNIT READY Command 70 7.10 WRITE (6) Command 72 7.11 WRITE (10) Command 75 7.12 Read (6) Command . 81 7.13 Read (10) Command . 84 7.14 Verify (10) Command . 90 7.15 Send Diagnostic Command . 94 7.16 REPORT LUNS Command 97 7.17 SYNCHRONIZE CACHE (10) Command 106 7.18 Pre Fetch (10) Command 11

    12、1 8 UFS Protocol Test 115 8.1 Context Management 115 8.2 UFS Task Management . 120 8.3 UFS BOOT 124 8.4 UFS Descriptor 129 8.5 UFS Flag . 145 8.6 UFS Attribute . 170 8.7 UFS Power Mode 216 8.8 UFS RPMB 222 8.9 UFS UPIU 247 8.10 UFS UPIU Flags 249 8.11 UFS Unit Attention Condition . 252 Tables TABLE

    13、1 Configuration Descriptor Header and Device Descriptor Configurable parameters . 124 TABLE 2 Unit Descriptor Configurable parameters . 124 JEDEC Standard No. 224 -ii- JEDEC Standard No. 224 Page 1 Universal Flash Storage (UFS) Test (From JEDEC Board Ballot JCB-13-18, formulated under the cognizance

    14、 of the JC-64.5 Subcommittee on UFS Measurement.) 1 Scope The primary objective of this test standard is to specify the test cases for UFS device protocol conformance testing. This test standard provides test cases for checking the functions defined in the following target standard: JESD220, Univers

    15、al Flash Storage (UFS) Standard version 1.1A MIPI M-PHY and MIPI UniPro test cases are not in the scope of this document. 2 Normative Reference UFS JESD220, Universal Flash Storage (UFS) version 1.1A UFSHCI JESD223, Universal Flash Storage (UFS) Host Controller Interface version 1.1 SAM SCSI Archite

    16、cture Model-5(SAM-5) Revision05, 19 May 2010 SPC T10 Specification: SCSI Primary Commands 4(SPC- 4) Revision 27, 11 October 2010 SBC T10 Specification: SCSI Block Commands 3(SBC -3) Revision 24, 05 August 2010 3 Terms, Definitions, Acronyms, and Symbols may: Indicates flexibility of choice with no i

    17、mplied recommendation or requirement. shall: Indicates a mandatory requirement. Designers shall implement such mandatory requirements to ensure interchangeability and to claim conformance with the specification. should: Indicates a strong recommendation but not a mandatory requirement. Designers sho

    18、uld give strong consideration to such recommendations, but there is still a choice in implementation. 3.1 Acronyms ATTRVALUE Attribute Value GROUPNUM Group Number LBA Logical Block Address LUN Logical Unit NumberMIPI Mobile Industry Processor Interface PCODE Page Code RPMB Replay Protected Memory Bl

    19、ock SPCODE Sub Page Code TSF Transaction Specific Fields UFS Universal Flash StorageUPIU UFS Protocol Information Unit UniPro Unified Protocol ASYNC Out of order execution support JEDEC Standard No. 224 Page 2 3.2 Naming Conventions Some terms are capitalized to distinguish their definition from the

    20、ir common English meaning. Words not capitalized retain their common English meaning. 3.3 Numbers and Number Bases Hexadecimal numbers are written with a lower case “h“ suffix, e.g., FFFFh and 80h. Binary numbers are written with a lower case “b“ suffix (e.g., 10b). Binary numbers larger than four d

    21、igits are written with a space dividing each group of four digits, as in 1000 0101 0010b. All other numbers are decimal. 3.4 Symbols Dash (-) not applicable (n/a) JEDEC Standard No. 224 Page 3 4 Introduction Universal Flash Storage (UFS) is a simple, high performance, mass storage device with a seri

    22、al Interface. It is primarily for use in mobile systems, between host processing and mass storage memory devices. The following is the summary of the UFS functional features, Similar functional features as eMMC Boot Operation Mode Device enumeration LLBAA = 0, DBD = 1, PAGE CODE = Ah, SUBPAGE CODE =

    23、 00h, ALLOCATION LENGTH = 0h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. No data shall be returned. JEDEC Standard No. 224 Page 16 7.3.2 Test Case Id: UFS_ModeSense_02 Ref. specs Section UFS : Section 11.

    24、3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 00b Test Procedure Precondition:None. Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 00b, LLBAA = 0, DBD = 1, P

    25、AGE CODE = 0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Control mode page content is device specific. JEDEC Standard No. 224 Page 17 7.3.3 Test Case Id: UFS

    26、_ModeSense_03 Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 01b Test Procedure Precondition:None Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter value

    27、s MODE SENSE (10) PC = 01b, LLBAA = 0, DBD = 1, PAGE CODE = 0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. The value of the following fields shall be verified

    28、: TST=111b, SWP=1b and BUSY TIMEOUT PERIOD = FFFFh JEDEC Standard No. 224 Page 18 7.3.4 Test Case Id: UFS_ModeSense_04 Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 10b Test Procedure Precondition:Non

    29、e Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None. Input parameter values MODE SENSE (10) PC = 10b, LLBAA = 0, DBD = 1,PAGE CODE = 0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense

    30、Key Additional Sense Code Target Success GOOD - - 2. Control mode page content is device specific. JEDEC Standard No. 224 Page 19 7.3.5 Test Case Id: UFS_ModeSense_05 This test case may be applied only if PS bit of the Control mode page is equal to one. Ref. specs Section UFS : Section 11.3.4 Test P

    31、urpose To verify the status of MODE SENSE (10) command with PAGE CODE = 0Ah (Control mode) and PC = 11b Test Procedure Precondition:None Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 11b, LLBAA = 0, DBD = 1, PAGE CODE =

    32、0Ah, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Control mode page content is device specific. JEDEC Standard No. 224 Page 20 7.3.6 Test Case Id: UFS_ModeSense_

    33、06 Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 01h (Read-Write Error recovery mode) and PC = 00b Test Procedure Precondition:None. Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input paramet

    34、er values MODE SENSE (10) PC = 00b, LLBAA = 0, DBD = 1,PAGE CODE = 01h, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Read-Write Error recovery mode page content

    35、is device specific. JEDEC Standard No. 224 Page 21 7.3.7 Test Case Id: UFS_ModeSense_07 Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 01h (Read-Write Error recovery mode) and PC = 01b Test Procedure Precondition:None Main: 1. Is

    36、sue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 01b, LLBAA = 0, DBD = 1, PAGE CODE = 01h, SUBPAGE CODE = 00h, ALLOCATION LENGTH, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sen

    37、se Code Target Success GOOD - - 2. Only the value of the following fields shall be verified: READ RETRY COUNT= FFh, WRITE RETRY COUNT = FFh, RECOVERY TIME LIMIT = FFFFh JEDEC Standard No. 224 Page 22 7.3.8 Test Case Id: UFS_ModeSense_08 Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify

    38、the status of MODE SENSE (10) command with PAGE CODE = 01h (Read-Write Error recovery mode) and PC = 10b Test Procedure Precondition:None Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 10b, LLBAA = 0, DBD = 1,PAGE CODE =

    39、01h, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Read-Write Error recovery mode page content is device specific. JEDEC Standard No. 224 Page 23 7.3.9 Test Case

    40、Id: UFS_ModeSense_09 This test case may be applied only if PS bit of the Read-Write Error recovery mode page is equal to one. Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command with PAGE CODE = 01h (Read-Write Error recovery mode) and PC = 11b Test P

    41、rocedure Precondition:None Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 11b, LLBAA = 0, DBD = 1, PAGE CODE = 01h, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 14h Expected Output 1. The command response shall be: Response St

    42、atus Sense Key Additional Sense Code Target Success GOOD - - 2. Read-Write Error recovery mode page content is device specific. JEDEC Standard No. 224 Page 24 7.3.10 Test Case Id: UFS_ModeSense_10 Ref. specs Section UFS : Section 11.3.4 Test Purpose To verify the status of MODE SENSE (10) command wi

    43、th PAGE CODE = 08h (caching mode) and PC = 00b Test Procedure Precondition:None. Main: 1. Issue MODE SENSE (10) command. 2. Verify expected output. Clean up: None Input parameter values MODE SENSE (10) PC = 00b, LLBAA = 0, DBD = 1,PAGE CODE = 08h, SUBPAGE CODE = 00h, ALLOCATION LENGTH = 1Ch, CONTROL = 00h Expected Output 1. The command response shall be: Response Status Sense Key Additional Sense Code Target Success GOOD - - 2. Caching mode page content is device specific


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