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    GMKOREA EDS-T-5009-2008 TRANSIENT ANALYSIS TEST (EMC-41).pdf

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    GMKOREA EDS-T-5009-2008 TRANSIENT ANALYSIS TEST (EMC-41).pdf

    1、GM DAEWOO Auto & Technology EDS Engineering, GM DAEWOO Auto & Technology Standards TRANSIENT ANALYSIS TEST (EMC-41) Do Not Use on New Programs. Being Replaced by GMW3091 EDS-T-5009 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 (Superceded) EDS-T-5009TRANSIENT ANALYSIS TEST (EMC-41)

    2、 PAGE: 1/6 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 GM DAEWOO Auto & Technology Note: This standard may be applied only for current project (incl. Variant Program). It is Superceded for all future projects and replaced by GMW3091. 1. PURPOSE Transient analysis test is to pick

    3、up and analyze transient that is produced by electrical loads of the vehicle. This test is conducted at a time of evaluation or failure of electric components or for inspection and diagnosis of peculiar electric problems. 2. TEST EQUIPMENT 2.1. Transient digitizer 2.2. Current probe 2.3. Current pro

    4、be amplifier 2.4. 100 X voltage probe 2.5. Voltage probe 2.6. Controller 3. PROCEDURES 3.1. The type of the test (evaluation, inspection, repair of trouble, certification) is specified by the tester and determines or affects the test point matrix. (See Attachment 1) 3.2. The test point matrix repres

    5、ents the accessory, test point pin number, voltage current waveform, test equipment, etc. 3.3. Transient is produced by operating electric components of the vehicle. 3.4. Current/voltage transient is monitored at the specified test points in the system, subsystem and components (always at connector)

    6、. If transient meets the pre-determined standards, it is the largest among the groups stored by the controller during test and may be raised up to 70. 3.5. Upon completion of transient analysis, hard copies are created by the controller that represent necessary items of each transient waveform. 3.6.

    7、 Tabular summary stored in each floppy disk is created by the controller. Transient is obtained from the test vehicle while the vehicle is in the following operating modes: EDS-T-5009TRANSIENT ANALYSIS TEST (EMC-41) PAGE: 2/6 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 GM DAEWOO

    8、Auto & Technology 3.6.1. Ignition ON, engine OFF 3.6.2. Engine ON, vehicle parked 3.6.3. Vehicle driven at road speed on the dynamometer 3.6.4. Vehicle operated in the OFF crank idle - OFF mode 3.6.5. Vehicle operated in the OFF crank - OFF mode 3.7. Attachments 2 and 3 show the waveform obtained du

    9、ring the transient analysis test. 3.8. Attachment 4 shows the summary of a transient analysis test. EDS-T-5009TRANSIENT ANALYSIS TEST (EMC-41) PAGE: 3/6 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 GM DAEWOO Auto & Technology Attachment 1. TEST FORM TRANSIENT ANALYSIS (EMC 41) EMC

    10、 DEPT. CONDUCTED SUSCEPTIBILITY MILFORD PROVING GROUND TEST VEHICLE ELECTRONICS SYSTEM I.D. TEST NUMBER DATE TEST STARTED NOTES PERTAINING TO TEST ACCESSORY HORN HEADLIGHTS OF-ON HEADLIGHTS LO-HI TURN SIGNAL HAZARDS W/S WIPER W/S WASHER POWER WINDOW POWER SEAT POWER DOR LOCKS POWER SIDE MIROR POWER

    11、ANTENA A/C CLUTCH BLOWER(VENT) LO-HI EDS-T-5009TRANSIENT ANALYSIS TEST (EMC-41) PAGE: 4/6 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 GM DAEWOO Auto & Technology Attachment 2. EXAMPLE OF TEST 1 EDS-T-5009TRANSIENT ANALYSIS TEST (EMC-41) PAGE: 5/6 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 GM DAEWOO Auto & Technology Attachment 3. EXAMPLE OF TEST 2 EDS-T-5009TRANSIENT ANALYSIS TEST (EMC-41) PAGE: 6/6 ISSUED DATE: 1993. 08. 10 REVISED DATE: 2008. 11. 04 VERSION: 3 GM DAEWOO Auto & Technology Attachment 4. EXAMPLE OF TEST RESULT SUMMARY


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