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    EN 61987-1-2007 en Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1 Measuring equipment with analogue and digital .pdf

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    EN 61987-1-2007 en Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1 Measuring equipment with analogue and digital .pdf

    1、BRITISH STANDARDBS EN 61987-1:2007Incorporating corrigendum no. 1Industrial-process measurement and control Data structures and elements in process equipment catalogues Part 1: Measuring equipment with analogue and digital output The European Standard EN 61987-1:2007 has the status of a British Stan

    2、dardICS 25.040.40; 35.240.50g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 61987-1:2007This British Standard was published under the authorit

    3、y of the Standards Policy and Strategy Committee on 31 March 2007 BSI 2007ISBN 978 0 580 54370 8National forewordThis British Standard was published by BSI. It is the UK implementation of EN 61987-1:2007. It is identical with IEC 61987-1:2007.The UK participation in its preparation was entrusted by

    4、Technical Committee GEL/65, Measurement and control, to Subcommittee GEL/65/2, Elements of systems.A list of organizations represented on GEL/65/2 can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsibl

    5、e for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments issued since publicationAmd. No. Date Comments17320 Corrigendum No. 131 August 2007 Associates the UK adoption pages with the correct international and European textEUROPEAN STAN

    6、DARD EN 61987-1 NORME EUROPENNE EUROPISCHE NORM February 2007 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2007 CENELEC - All

    7、 rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61987-1:2007 E ICS 25.040.40;35.240.50 English version Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1: Measuring equipment with

    8、 analogue and digital output (IEC 61987-1:2006) Mesure et commande dans les processus industriels - Structures et lments de donnes dans les catalogues dquipement de processus - Partie 1: Equipement de mesure sortie analogique et numrique (CEI 61987-1:2006) Industrielle Leittechnik - Datenstrukturen

    9、und -elemente in Katalogen der Prozessleittechnik - Teil 1: Messeinrichtungen mit analogen und digitalen Ausgngen (IEC 61987-1:2006) This European Standard was approved by CENELEC on 2007-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditi

    10、ons for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in thre

    11、e official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnica

    12、l committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and t

    13、he United Kingdom. Foreword The text of document 65B/599/FDIS, future edition 1 of IEC 61987-1, prepared by SC 65B, Devices dimensions (L B H) as three separate elements, length, breadth and height with unit of measure; or a derating curve as an appropriate series of data element pairs. EN 61987-1:2

    14、007 3 This standard conforms to ISO 15926-1 and ISO 15926-2 with respect to the data model and associated reference data library (ISO 15926-4), for example, as used for the limited classification structure. At the same time, it is also aligned to the Standard for the Exchange of Product Model Data (

    15、STEP). The data model and definitions of ISO 10303-21 uses the ISO 15926-4 TS reference data library as “library”. The current standard can reproduce the data fields according to this standard, including, for example, product structure data, dimensional data, electrical connection data and product p

    16、roperties such as measuring range or power supply. EN 61987-1:2007 4 INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL DATA STRUCTURES AND ELEMENTS IN PROCESS EQUIPMENT CATALOGUES Part 1: Measuring equipment with analogue and digital output 1 Scope This part of IEC 61987 defines a generic structure in whic

    17、h product features of industrial- process measurement and control equipment with analogue or digital output should be arranged, in order to facilitate the understanding of product descriptions when they are transferred from one party to another. It applies to the production of catalogues of process

    18、measuring equipment supplied by the manufacturer of the product and helps the user to formulate his requirements. This standard also serves as a reference document for all future standards which are concerned with process measuring equipment catalogues. In addition, it is intended as a guide for the

    19、 production of further standards on process equipment documentation for similar systems, for example, for other measuring equipment and actuators. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition

    20、cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60529:2001, Degrees of protection provided by enclosures (IP Code) IEC 60559:1989, Binary floating-point arithmetic for microprocessor systems IEC 60654-1:1993, Industrial-pro

    21、cess measurement and control equipment Operating conditions Part 1: Climatic conditions IEC 60770-1:1999, Transmitters for use in industrial-process control systems Part 1: Methods for performance evaluation IEC 61000-4 (all parts), Electromagnetic compatibility (EMC) Part 4: Testing and measurement

    22、 techniques IEC 61069 (all parts), Industrial-process measurement and control Evaluation of system properties for the purpose of system assessment IEC 61298 (all parts), Process measurement and control devices General methods and procedures for evaluating performance ISO 3511-1:1977, Process measure

    23、ment control functions and instrumentation Symbolic representation Part 1: Basic requirements 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. EN 61987-1:2007 5 3.1 ambient conditions environmental conditions characteristics of the environment whi

    24、ch may affect performance of the device or system NOTE Examples of ambient conditions are pressure, temperature, humidity, vibration, radiation. IEV 151-16-03 3.2 ambient temperature temperature measured at a representative point within the local environment, including adjacent heat generating equip

    25、ment, in which the measurement and control equipment will normally operate, be stored or transported (see 3.1) 3.3 ambient temperature limits extreme values of ambient temperature to which a device may be subjected without permanent impairment of operating characteristics (see 3.18 and 3.19) NOTE Th

    26、e performance characteristics may be exceeded in the range between the limits of normal operation and the operating temperature limits. 3.4 ambient temperature range range of ambient temperatures within which a device is designed to operate within specified accuracy limits (see 3.29 and 3.31) 3.5 an

    27、alogue signal signal whose information parameter may assume any value within a given continuous range IEV 351-12-18 3.6 binary signal digital signal whose information parameter may assume one out of two discrete values IEV 351-12-20 3.7 climate class climatic conditions, i.e. ambient temperature, pr

    28、essure and humidity, to which the measurement equipment can be subjected during operation (including shutdown), transport and storage (over land or sea) IEC 60654-1, Clause 4 3.7.1 class A: air-conditioned location location in which both air temperature and humidity are controlled within specific li

    29、mits 3.7.2 class B: heated and/or cooled enclosed location location where only air temperature is controlled within specific limits 3.7.3 class C: sheltered location location where neither air temperature nor humidity are controlled. The equipment is protected against direct exposure to sunlight, ra

    30、in or other precipitation and full wind pressure EN 61987-1:2007 6 3.7.4 class D: outdoor location location where neither air temperature nor humidity are controlled. The equipment is exposed to outdoor atmospheric condition such as direct sunlight, rain, hail, sleet, snow, icing, wind and blown san

    31、d 3.8 degree of protection extent of protection provided by an enclosure against access to hazardous parts, against ingress of solid foreign objects and/or ingress of water and verified by standardized test methods IEC 60529, 3.3 3.9 dependability extent to which a system can be relied upon to perfo

    32、rm exclusively and correctly a task under given conditions at a given instant of time or over a given time interval, assuming that the required external sources are provided IEC 61069-5, 3.1 3.10 digital signal signal, the information parameter of which may assume one out of a set of discrete values

    33、 IEV 351-12-19 3.11 drift change in the indication of a measuring system, generally slow, continuous, not necessarily in the same direction and not related to a change in the quantity being measured IEV 311-06-13, modified 3.12 electromagnetic compatibility ability of measuring equipment or a measur

    34、ing system to function satisfactorily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to anything in that environment IEV 161-01-07, modified 3.13 environmental influence change in the output of an instrument caused solely by the departure of one of th

    35、e specified environmental conditions from its reference value, all other conditions being held constant (see 3.16 and 3.52) 3.14 hysteresis property of a device or instrument whereby it gives different output values in relation to its input values depending on the directional sequence in which the i

    36、nput values have been applied IEC 61298-2, 3.13 EN 61987-1:2007 7 3.15 influence of ambient temperature change in zero (lower range-value) and/or span caused by a change in ambient temperature from the reference temperature up to the limits of the ambient temperature range quoted in the performance

    37、specifications (see 3.16) 3.16 influence quantity quantity that is not the subject of the measurement and whose change affects the relationship between the indication and the result of the measurement VIM 2.7 NOTE 1 This term is used in the “uncertainty” approach. NOTE 2 Influence quantities can ori

    38、ginate from the measured system, the measuring equipment or the environment. NOTE 3 As the calibration diagram depends on the influence quantities, in order to assign the result of a measurement it is necessary to know whether the relevant influence quantities lie within the specified range. IEV 311

    39、-06-01 3.17 integrity assurance provided by a system that the tasks will be performed correctly unless notice is given of any state of the system, which could lead to the contrary IEC 61069-5, 3.5 3.18 limiting condition extreme condition that a measuring system is required to withstand without dama

    40、ge and without degradation of specified metrological characteristics when it is subsequently operated under its rated operating conditions. NOTE 1 Limiting conditions for storage, transport or operation can differ. NOTE 2 Limiting conditions can include limiting values of the quantity being measured

    41、 and of any influence quantity. VIM 5.6 3.19 limiting values for operation extreme values which an influence quantity can assume during operation without damaging the measuring instrument so that it no longer meets its performance requirements when it is subsequently operated under reference conditi

    42、ons NOTE The limiting values can depend on the duration of their application. IEV 311-07-06 3.20 limiting values for storage extreme values which an influence quantity can assume during storage without damaging the measuring instrument so that it no longer meets its performance requirements when it

    43、is subsequently operated under reference conditions NOTE The limiting values can depend on the duration of their application. IEV 311-07-07 3.21 limiting values for transport extreme values which an influence quantity can assume during transport without damaging the measuring instrument so that it n

    44、o longer meets its performance requirements when it is subsequently operated under reference conditions EN 61987-1:2007 8 NOTE The limiting values can depend on the duration of their application. IEV 311-07-08 3.22 long-term drift drift in output monitored for 30 days at 90 % of span IEC 61298-2, 7.

    45、2 3.23 maintainability ability of an item under given conditions of use, to be retained in, or restored to, a state in which it can perform a required function, when maintenance is performed under given conditions and and using stated procedures and resources IEC 61069-5, 3.3 3.24 maximum measured e

    46、rror largest positive or negative value of error of the upscale or downscale value at each point of measurement IEC 60770-2, 3.7 3.25 measurand particular quantity subject to measurement VIM 2.6 IEV 311-01-03 3.26 measuring range range of values defined by the two extreme values within which a varia

    47、ble can be measured within the specified accuracy NOTE The extreme values are usually termed the upper range-limit and the lower range-limit. IEV 351-12-35 3.27 measurement principle, measuring principle phenomenon serving as the basis of a measurement. NOTE The measurement principle can be a physic

    48、al, chemical, or biological phenomenon. VIM 2.3 3.28 non-repeatability (repeatability error) algebraic difference between the extreme values obtained by a number of consecutive measurements of the output over a short period of time for the same value of the input under the same operating conditions,

    49、 approaching from the same direction, for full range traverses. NOTE It is usually expressed in percentage of span and does not include hysteresis and drift. IEC 61298-2, 3.12, modified 3.29 nominal range of use specified range of values which an influence quantity can assume without causing a variation exceeding specified limits EN 61987-1:2007 9 IEV 311-07-05 3.30 normal operating conditions range of operating conditions within which a device is designed to operate within specifi


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