1、 EIA STANDARD TS-1005 ENVIRONMENTAL TEST METHODOLOGY FOR DETERMINING THE SUSCEPTIBILITY OF CONTACTS TO FRETTING CORROSION EIA-364-1005 July 2011 EIA Standards Electronic Components AssociationEIA-364-1005 ANSI/EIA-364-1005-2011 Approved: July 11, 2011 NOTICE EIA Engineering Standards and Publication
2、s are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. E
3、xistence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those othe
4、r than ECA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECA does not assume any liability to any patent owner, nor d
5、oes it assume any obligation whatever to parties adopting the Standard or Publication. This EIA standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the E
6、IA standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine t
7、he applicability of regulatory limitations before its use. Published by ELECTRONIC COMPONENTS ASSOCIATION 2011 Engineering Department 2500 Wilson Boulevard, Suite 310 Arlington, VA 22201-3834 PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECA and may not be reproduced without per
8、mission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) i CONTENTS Clause Page 1
9、Introduction 1 1.1 Scope 1 1.2 Object . 1 1.3 Definition . 1 2 Test specimen . 1 2.1 Description . 1 2.2 Preparation . 2 2.3 Cleaning . 2 3 Test procedure 2 3.1 General . 2 3.2 Test sequence 2 3.3 Specimen size . 4 4 Test procedure 4 4.1 Visual examination . 4 4.2 Resonance scans, Sequence 1A . 4 4.
10、3 Low level contact resistance (LLCR) 5 4.4 Vibration, Sequence 1B 5 4.5 Thermal cycling, Sequence 2 . 6 5 Data analysis 7 5.1 General . 7 5.2 Change of low level contact resistance 7 5.3 Visual examination . 7 5.4 Surface analysis procedures 8 5.5 Discontinuity monitoring 9 6 Details to be specifie
11、d . 9 7 Test documentation . 10 ii CONTENTS (continued) Figure Page 1 Test sequences 3 A.1 SEM/EDS analysis of fretting corrosion on tin plated pin . A-4 Annex A Fretting corrosion (informative) . A-1 B Applicable document (normative) . B-1 C Bibliographies, fretting (informative) C-1 EIA-364-1005 P
12、age 1 TEST SEQUENCE No. 1005 ENVIRONMENTAL TEST METHODOLOGY FOR DETERMINING THE SUSCEPTIBILITY OF CONTACTS TO FRETTING CORROSION (From EIA Standards Proposal No. 5203, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards. 1 Introduction 1.1 Scope This standard describ
13、es recommended test sequences to determine the susceptibility of contacts to fretting corrosion that is a major and significant failure mechanism that can be caused by vibration and thermal cycling. 1.2 Object 1.2.1 Fretting corrosion is caused by micromotion between two surfaces in contact which ma
14、y result in a significant change in resistance. It is created when non-noble materials or dissimilar metals (gold vs. tin) are in contact. It can also occur with gold/gold systems when gold has been worn through exposing the non-noble underplate or substrate. 1.2.2 For further information on this ph
15、enomenon, a partial bibliography of technical papers is shown in annex C. 2 Test specimen 2.1 Description Unless otherwise specified in the referencing document, test specimens shall be composed of terminated plug and receptacle connectors, or sockets, with applicable accessories. Connectors or sock
16、ets that mate with other types of mating devices (e.g., Printed Circuit Board (PCB) cards, Pin Grid Arrays (PGA), etc.) shall be tested with “dummy devices“ including heat sinks as applicable and other similar accessories. EIA-364-1005 Page 2 2.1.1 Variable measurements Unless otherwise specified, a
17、 minimum of 50 mated contact pairs per connector or 25% of the contact population whichever is more shall be measured for LLCR (low level circuit resistance). For connectors with less than 50 contacts, the number of measurements shall be agreed upon between test sponsor and test laboratory. Position
18、s being monitored shall be distributed throughout the contact arrangement. 2.2 Preparation 2.2.1 Unless otherwise specified in the referencing document, contacts shall be tested terminated to their applicable conductors (crimp or solder cup) or to test boards (solder or compliant technology). Contac
19、ts shall be assembled to their applicable connector housings with all accessories normally associated with the connector styles involved. 2.2.2 Provision shall be provided on conductors and/or applicable test boards to establish connection points or areas for applicable low level circuit resistance
20、measurements. 2.3 Cleaning Connectors shall be tested in their as received condition. Cleaning may be performed after termination to test boards post soldering or compliant pin insertion only, test specimens that have contact lubricants applied shall not be cleaned. 3 Test procedure 3.1 General Unle
21、ss otherwise specified in the referencing document, all tests shall be performed in accordance with the procedures indicated in clause 4. Special conditions, durations, requirements and/or techniques that may be required shall be specified by the qualifying agency and documented in the test report.
22、Any severity level that may be indicated in this document shall be considered as default levels. 3.2 Test sequence 3.2.1 This standard shall not be substituted for any standard defining qualification of connectors or sockets. It does not address the full range of product performance which is require
23、d for qualification. The intent of this standard is to determine the susceptibility of connectors or sockets to the failure mechanism of fretting corrosion only. 3.2.2 Unless otherwise specified in the referencing document, the recommended test sequence shall be as shown in the test plan flow diagra
24、m figure 1. EIA-364-1005 Page 3 Figure 1 Test sequences 3.2.3 Test sequences, unless otherwise specified 3.2.3.1 Sequence 1A shall be performed when test severity levels and conditions are unknown. The data generated in this sequence will determine the areas of resonance. The collected data can then
25、 be used to develop the vibration profiles to be used for Sequence 1B. This sequence need not be performed when the severity level and conditions are specified in the referencing document. 3.2.3.2 Sequence 1B shall be performed when the vibration conditions are specified in the referencing documents
26、 and/or as generated by the results of Sequence 1A when performed. 3.2.3.3 Sequence 2 shall be performed in accordance with the test plan flow diagram and the test conditions indicated unless otherwise specified in the referencing document. Sequence 1A Sequence 1B Sequence 2 Vibration random Low lev
27、el contact resistance Visual final Thermal cycling Visual Visual final Specimen preparation Resonance scans X - axis Y - axis Z - axis Low level contact resistance X - axis Y - axis Z - axis Visual Low level contact resistance Low level contact resistance weekly EIA-364-1005 Page 4 3.2.3.4: It is re
28、commended that Sequence 1A be performed if required. Sequences 1B and 2 are mandatory sequences except in the instance that vibration or thermal cycling has been determined not to be applicable. In this case, the sequence may be omitted at the discretion of the test sponsor. An explanation of said d
29、ecision shall be documented in the test report. 3.3 Specimen size Unless otherwise specified in the referencing document the following sample size shall apply: Sequence 1A: 4 mated pairs Sequence 1B: 4 mated pairs for LLCR measurements and 2 mated pairs for discontinuity monitoring Sequence 2: 5 mat
30、ed pairs for LLCR measurements 4 Test procedure 4.1 Visual examination 4.1.1 Unless otherwise specified in the referencing document, initial visual examination of the contact areas (pins, blades, PCB pads, etc.; are observed) shall be examined under a minimum of 10X magnification. If any particulate
31、 matter, plating salts, organic films, metal filings/flakes, etc. the test sponsor shall be notified. Testing shall not proceed until instructions are issued to the test lab by the test sponsor. 4.1.2 Final visual examination of the contact areas shall be performed under a minimum of 10X magnificati
32、on. Any abnormal discoloration, blemishes, black spots or debris fields (typical of fretting corrosion) shall be noted and the test sponsor notified. Additional surface analysis may be required if additional definition of the defects are required, see clause 5 for additional information. 4.1.3 When
33、applicable, socket contacts which are recessed in its housing, may not be accessible for direct examination. Notation of this shall be recorded in the test report. Socket contacts shall be carefully removed from its housing and examined accordingly. This may be performed by the test laboratory or th
34、e test sponsor at the discretion of the test sponsor. 4.1.4 Unless otherwise specified in the referencing document, if all requirements as specified have been met, final visual examination may be omitted, see clause 5. 4.2 Resonance scans, Sequence 1A 4.2.1 The test specimens shall be secured within
35、 the test fixtures as agreed upon between the test sponsor and the test laboratory, see 4.4.1. EIA-364-1005 Page 5 4.2.2 Test conditions: Frequency: 10 Hz to 2000 Hz Amplitude: 1 G sine sweep in each of the three axes (X, Y and Z axis) as defined in EIA-364-28. Duration: 20 minutes per axis 4.2.3 Ac
36、celerometers shall be attached to the connectors to monitor the response characteristic. The number of accelerometers and their placement on the test specimens shall be agreed upon by the test sponsor and test laboratory. Photographs and response plots shall be included in the test report. 4.3 Low-l
37、evel contact resistance (LLCR) 4.3.1 Test conditions: Procedure: EIA-364-23 Test current: 100 milliamps maximum Open circuit voltage: 20 millivolts 4.3.2 Pre- and post- handling of the test specimens shall be performed in a manner so the contact areas are not disturbed. 4.3.3 Variable measurement sh
38、all be organized to show the change in LLCR at each measurement period. Position identifications shall indicate the actual location being measured using the identification system being used on the test samples. In the event that there is no identification system, the test laboratory or test sponsor
39、shall establish a system for use during the measurement interval. 4.4 Vibration, Sequence 1B 4.4.1 Fixturing Test specimens shall be fixtured simulating the applicable application involved. Test samples shall not be restrained except as required by their application. It is recommended that said fixt
40、uring be agreed upon between test sponsor and the testing agency prior to testing. “Four samples shall be wired to measure LLCR. Two additional specimens shall be wired to monitor for 1.0 microsecond interruptions in accordance with EIA-364-46. EIA-364-1005 Page 6 4.4.2 Test conditions, unless other
41、wise specified in the referencing document Type of vibration: Random Frequency: 20 Hz to 2000 Hz. Power Spectral Density (PSD): To Be Determined Overall Gs rms: To Be Determined Duration: 8.0 hours per axis, number of axes 4.4.2.1 The PSD and overall G level shall be supplied by the test sponsor and
42、/or as may be established from the vibration scans generated if Sequence 1A is performed. 4.4.3 Requirements: The change in LLCR shall be measured and recorded after each axis of vibration. The contact interruption shall be monitored for 1.0 microsecond interruption, see clause 5, (Data analysis) fo
43、r further information. 4.5 Thermal cycling, Sequence 2 4.5.1 Test conditions, unless otherwise specified in the referencing document the test shall be performed in accordance with EIA-364-110, with the following test conditions: Temperature extremes: 0 C to 100 C Humidity: Uncontrolled Ramp rates: 1
44、0 C / minute maximum Dwell time at temperature extreme: 10 minutes minimum No. of cycles: 1000 4.5.1.1 The dwell periods shall be the steady state condition. It excludes any overshoot that may be required to achieve the specified ramp rates. 4.5.2 Thermal profile: 4.5.2.1 Prior to starting the test,
45、 a pre-test shall be performed to assure that the ramp rates and dwell times falls within the specified parameters. Said profile shall be performed with additional “dummy“ specimens including any metal shells, heat sinks, cable clamps, strain relief, etc. If the specified profile cannot be met, the
46、test sponsor shall be notified. 4.5.2.2 The thermal profile shall be monitored with a thermocouple located on the middle dummy specimen. The specific location of the thermocouple shall be agreed upon between the test lab and the test sponsor. EIA-364-1005 Page 7 4.5.2.3 If the specified profile can
47、not be met, the test profile may be modified upon agreement with the test sponsor. 4.5.3 Requirement 4.5.3.1 Change in LLCR shall be performed initially, after every 168 hours of exposure, and after conclusion of the test duration. 5 Data analysis 5.1 General 5.1.1 Unless otherwise specified in the
48、referencing document, the following are two basic variable evaluation techniques which have been successful in the determination that fretting motion and, hence, fretting corrosion has occurred. Change of LLCR Visual examination 5.1.2 Requirement levels may vary contingent on the application involve
49、d or specific user or organizational proprietary levels. 5.2 Change of low-level contact resistance 5.2.1 If the requirements have not been exceeded at any interval of testing, no further evaluation shall be required. 5.2.2 Once testing has been initiated, the test specimens shall remain in a mated state. Unmating of the tested specimens shall not be performed without the approval of the test sponsor. 5.2.3 When the requirements have been exceeded, all failed position locations shall be noted to determine if failure patterns exis
