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    ECA EIA-364-09C-1999 TP-09C Durability Test Procedure for Electrical Connectors and Sockets《TP-09C 电连接器和接触的耐久力测试程序》.pdf

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    ECA EIA-364-09C-1999 TP-09C Durability Test Procedure for Electrical Connectors and Sockets《TP-09C 电连接器和接触的耐久力测试程序》.pdf

    1、 EIA STANDARD TP-09C Durability Test Procedure for Electrical Connectors and Sockets EIA-364-09C (Revision of EIA-364-09B) June 1999 ELECTRONIC COMPONENTS, ASSEMBLIES securing of test fixture shall not affect self-alignment. Aftermounting, fully mate and unmate for the number of cycles specified in

    2、the referencing document.4.2 Cycle rateUnless otherwise specified in the referencing document, the cycle rate per hour shall be: Automatic equipment: 500 50 Manual mating/unmating: 300 maximum Automatic, Circular Connectors: 250 to 300EIA-364-09CPage 34.3 Electrical loadNo electrical load shall be a

    3、pplied to the specimens during the test, unless otherwise specified.4.4 Inspection or testAt the intervals specified in the referencing document, inspections or tests may be performed.CAUTION Disturbing the specimens for intermediate inspection or measurementscould affect subsequent results.4.5 Meas

    4、urements4.5.1 Mating and unmating forces, contact resistance, shell resistance, insulation resistance,dielectric withstanding voltage, contact retention, and sealing tests are examples of measurementsthat may be made prior to, during or after testing and that would show the effects of durability.4.5

    5、.2 The connectors or contacts shall be examined to determine the effects of durability cyclingthat would include the following:4.5.2.1 Wear on coupling device.4.5.2.2 Loose or worn rivets; where applicable.4.5.2.3 Uneven wear, galling, removal of plating on contacts and shells.4.5.2.4 Free metal chi

    6、ps on face of inserts.4.5.2.5 Displaced, bent or broken contacts.4.5.2.6 Inability to properly mate and unmate.4.5.2.7 Pierced resilient inserts and broken or chipped hard dielectrics.4.5.2.8 Mechanical operational characteristics, including effectiveness of keys and polarizingsystems.EIA-364-09CPag

    7、e 45 Details to be specifiedThe following details shall be specified in the referencing document:5.1 Number of cycles5.2 Lubrication, if other than as specified5.3 Observations or measurements to be made before, during and after cycling5.4 Cycling rate, if other than as specified in 4.25.5 Manual or

    8、 automatic cycling5.6 Periodic inspection, if required5.7 Number of specimens to be tested5.8 Whether or not coupling devices are to be removed5.9 Failure criteria6 Test documentationDocumentation shall contain the details specified in clause 5, with any exceptions, and thefollowing:6.1 Title of tes

    9、t6.2 Specimen description6.3 Test equipment used, and date of last and next calibration6.4 Test procedure, including test method, cycling rate and number of cycles6.5 Values and observations; visual examination6.6 Operator name and date of testEIA-364-09CPage 5Size C 0.003 (0.0001)2 1.778 (0.07003 2

    10、.616 (0.1030)4 3.429 (0.1350)Style A 0.25 (0.010)06 27.18 (1.070)10 41.88 (1.649)12 51.08 (2.011)15 62.87 (2.475)18 74.73 (2.942)22 90.55 (3.565)28 114.35 (4.502)30 122.22 (4.812)36 120.57 (4.747)43 171.98 (6.771)NOTES1 Dimensions in parentheses are in inches.2 Unless otherwise specified, tolerance

    11、is 0.13 mm for two place metricdimensions and (0.005 in) for three place inch dimensions.3 Only the working surfaces designated 4 shall be finished.4 0.05 mm (0.002 in) TIR warpage permitted for full length of dimension A.5 Inch equivalents are based upon 25.4 mm = 1.00 in.Figure 1 - Test bladeEIA-3

    12、64-09CPage A- 1Annex AA NormativeA.1 Acceptable criteriaAcceptable criteria shall be established in terms of one, or any combination, of the following:A.1.1 Total mating and unmating force.A.1.2 Individual contact separation and engaging force.A.1.3 Maximum allowable change in contact resistance.NOT

    13、E Not applicable to gage cycled specimens.A.1.4 Degrees and criticality of wear or component damage resulting from this and succeedingenvironmental exposure tests.EIA Document Improvement ProposalIf in the review or use of this document, a potential change is made evident for safety, health or techn

    14、icalreasons, please fill in the appropriate information below and mail or FAX to:Electronic Components Industry AssociationEngineering Department Publications Office4212 Rock Hill Road, Suite 170Herndon, VA 20170-4212Phone: (571) 323-0294Document No. Document Title:Submitters Name: Telephone No.:FAX

    15、 No.:e-mail:Address:Urgency of Change:Immediate: At next revision:Problem Area:a. Clause Number and/or Drawing:b. Recommended Changes:c. Reason/Rationale for Recommendation:Additional Remarks:Signature: Date:FOR EIA USE ONLYResponsible Committee:Chairman:Date comments forwarded to Committee Chairman:


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