1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to reflect current requirements. 05-01-25 Raymond Monnin B Updated drawing paragraphs. -sld 11-03-07 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY
2、 Gary Zahn DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, LINEAR, VOLTAGE REGULATOR, POSITIVE, ADJUSTABLE, LOW DROPOUT
3、, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-07-14 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-98648 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E121-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
4、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lea
5、d finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 98648 01 H T A Federal RHA Device Device Case Lead s
6、tock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the
7、appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 1/ Circuit function 01 SDP1084 5.0 A, positive voltage regulator, adjustable, low dropout 1.2.3 Device class designator. Th
8、is device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as foll
9、ows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced tes
10、ting version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B,
11、C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the excep
12、tion(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ The SDP1084 is similar to the AS1084 or LT1084 or OM184 or OM1840 list
13、ed on Standard Microcircuit Drawing 5962-89521.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case o
14、utline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style N See figure 1 3 Z-tab with nonisolated tab, (TO-259), with glass seal T See figure 1 3 Flange mount with nonisolated tab, (TO-258), with glass seal U See fi
15、gure 1 3 Flange mount with isolated tab, (TO-258), with glass seal Z See figure 1 3 Z-tab with isolated tab, (TO-259), with glass seal 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input to output voltage differential 35 V dc Output curre
16、nt (IOUT) 5.0 A Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +150C Power dissipation (PD) . Internally limited Thermal resistance junction-to-case (JC): Case N and T . 2.3C/W Case U and Z . 3.0C/W Thermal resistance junction-to-ambi
17、ent (JA) 30C/W 1.4 Recommended operating conditions. Input to output voltage differential 25 V dc Output current (IOUT) 10 mA minimum Full load current (IFL) 3.0 A Ambient operating temperature range(TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks.
18、The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, Gener
19、al Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircui
20、t Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the devi
21、ce. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVE
22、L B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption
23、 has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufac
24、turers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the m
25、odification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The cas
26、e outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in ta
27、ble I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) sh
28、all be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein
29、 shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall
30、be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime- VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The c
31、ertificate of compliance (original copy) submitted to DLA Land and Maritime- VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with
32、 each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE
33、 I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Reference voltage VREF(VIN- VOUT) = 3.0 V, IOUT= 10 mA 1 01 1.238 1.262 V 1.5 V (VIN- VOUT) 25 V, 10 mA IOUT 3.0 A 1,2,3 1.220 1.270 Line regul
34、ation 1/ INOUTVV1.5 V (VIN- VOUT) 15 V, IOUT= 10 mA 1 01 0.2 % 1.5 V (VIN- VOUT) 35 V, IOUT= 10 mA 2,3 0.5 Load regulation 1/ OUTOUTIV(VIN- VOUT) = 3.0 V, 10 mA IOUT 3.0 A 1 01 0.3 % 2,3 0.4 Dropout voltage VDOIOUT= 3.0 A, VREF= 1.0% 1,2,3 01 1.5 V Thermal regulation 30 ms pulse, TA= +25C 1 01 0.15
35、%/W Ripple rejection OUTINVVf = 120 Hz, CADJ= 25 F, COUT= 25 F (tantalum), IOUT= 3.0 A, (VIN- VOUT) = 3.0 V 4,5,6 01 60 dB Adjust pin current IADJ1.5 V (VIN- VOUT) 25 V, 10 mA IOUT 3.0 A 1,2,3 01 120 A Adjust pin current change IADJ1.5 V (VIN- VOUT) 25 V, 10 mA IOUT 3.0 A 1,2,3 01 5.0 A Minimum load
36、 current IMIN(VIN- VOUT) = 25 V 1,2,3 01 10 mA Current limit ILIM(VIN- VOUT) = 5.0 V 1,2,3 01 5.5 A (VIN- VOUT) = 25 V 0.3 Temperature stability 2/ VOUT-55C TJ +125C 1,2,3 01 1.5 % Long term stability 2/ VOUTt =1000 hrs, TA= +125C 2 01 1.0 % 1/ Line and load regulation are measured at a constant jun
37、ction temperature using a low duty cycle pulse technique. Although power dissipation is internally limited, regulation is guaranteed up to the maximum power dissipation of 45 W. Power dissipation is determined by the input/output differential voltage and the output current. Guaranteed maximum power
38、dissipation will not be available over the full input/output voltage range. 2/ If not tested, shall be guaranteed to the limits specified in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98648 DLA
39、LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Case outlines T and U. Inches mm .005 0.13 .010 0.25 .020 0.51 Symbol Millimeters Inches Min Max Min Max A 6.10 6.86 .240 .270 A1 0.89 1.14 .035 .045 A2 3.56 BSC .140 BSC b 1.40 1.65 .055 .065 D 20.70 21.21 .8
40、15 .835 D1 13.46 13.97 .530 .550 D3 0.00 2.34 .000 .092 e 5.08 BSC .200 BSC E 17.40 17.65 .685 .695 L 12.70 19.05 .500 .750 O 17.70 17.96 .697 .707 P 3.94 4.19 .155 .165 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, this item was originally designed usin
41、g inch-pound units of measurement. In the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
42、SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outlines N and Z. Symbol Millimeters InchesMin Max Min MaxA 30.10 30.35 1.185 1.195A1 17.40 17.65 .685 .695A2 6.22 6.48 .245 .255A3/L3 3.18 BSC .125 BSCb 1.40 1.65 .055 .065D 6.10 6.
43、86 .240 .270D1 3.56 BSC .140 BSCD2 0.89 1.14 .035 .045e 5.08 BSC .200 BSCL 13.46 13.97 .530 .550L1 12.70 19.05 .500 .750L2 6.22 6.48 .245 .255P 3.05 3.30 .120 .130NOTE: The U.S. government preferred system of measurement is the metric SI system. However, this item was originally designed using inch-
44、pound units of measurement. In the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA
45、WING SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines N and T (nonisolated tab) U and Z (isolated tab) Terminal number Terminal symbol Terminal symbol 1 2 3 Tab Adjust No connection Input Output Adjust Outpu
46、t Input No connection FIGURE 2. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98648 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE
47、II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1, 2, 3
48、End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Manageme
