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    DLA SMD-5962-97615 REV D-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS HEX SCHMITT TRIGGER INVERTER MONOLITHIC SILICON.pdf

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    DLA SMD-5962-97615 REV D-2010 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS HEX SCHMITT TRIGGER INVERTER MONOLITHIC SILICON.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make corrections to figure 5. Update the boilerplate. - JAK 00-08-16 Monica L. Poelking B Delete VIH, VIL, and t/V in section 1.4. Change VT+and VT-limits in table I. Change VINtest conditions for VOH, VOL, and truth table tests in table I. Also,

    2、 correct test conditions for CPDtest in table I. Correct waveform in figure 5. Editorial changes throughout. - TVN 03-02-04 Thomas M. Hess C Add footnote to ICCin table I. Correct group A, subgroups for AC tests in table I. Make changes to subgroups for groups C and E in table II. Add table III, del

    3、ta limits. Editorial changes throughout. TVN 03-07-01 Thomas M. Hess D Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - jak 10-09-08 Thomas M. Hess REV SHEET REV SHEET REV D D D SHEET 15 16 17 REV STATUS OF SHEETS REV D D D D D D D D D D D D D D SHEET 1 2 3 4 5 6 7 8 9 10 1

    4、1 12 13 14 PMIC N/A PREPARED BY Charles F. Saffle, Jr. DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Charles F. Saffle, Jr. APPROV

    5、ED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, HEX SCHMITT TRIGGER INVERTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 97-08-11 REVISION LEVEL D SIZE A CAGE CODE 67268 5962-97615 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E427-10 Provided by IHSNot for ResaleNo reproduction or networ

    6、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97615 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (dev

    7、ice classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as show

    8、n in the following example: 5962 - 97615 01 Q C A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices

    9、meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). T

    10、he device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVC14A Hex Schmitt trigger inverter 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requi

    11、rements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. Q or V Certification and qualification to MIL-PRF-38535. 1.2.4 Case outline(s). The case outline(s) are as designated in

    12、MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

    13、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97615 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1

    14、.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +6.5 V dc DC input voltage range (VIN) -0.5 V dc to +6.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ 5/ DC input clamp current (IIK) (VIN 0.0 V) . -50 mA DC output clamp current (IOK) (VOUT 0.0 V

    15、 or VOUT VCC) . 50 mA Continuous output current (IOUT) (VOUT= 0.0 to VCC) 50 mA Continuous current through VCCor GND . 100 mA Maximum power dissipation at TA= +55C (in still air) . 0.5 W 6/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resist

    16、ance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 2/ 3/ 7/ Supply voltage range (VCC): Operating . +2.0 V dc to +3.6 V dc Data retention only . +1.5 V dc Input voltage range (VIN) 0.0 V to +5.5 V dc Output voltage range (VOUT) . 0.0

    17、V to VCCMaximum high level output current (IOH): VCC= 2.7 V -12 mA VCC= 3.0 V -24 mA Maximum low level output current (IOL): VCC= 2.7 V +12 mA VCC= 3.0 V +24 mA Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the devic

    18、e. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ Th

    19、e input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/ The value of VCCis provided in the recommended operating conditions section 1.4 above. 6/ The maximum package power dissipation is calculated using a junction tempera

    20、ture of 150C and a board trace length of 750 mils. 7/ Unused control inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 432

    21、18-3990 SIZE A 5962-97615 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the i

    22、ssues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Stan

    23、dard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Docume

    24、nt Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws

    25、 and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan

    26、. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physic

    27、al dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal co

    28、nnections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and wa

    29、veforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical perfor

    30、mance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgro

    31、up are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97615 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be m

    32、arked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RH

    33、A product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for devic

    34、e classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed man

    35、ufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted

    36、 to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

    37、 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For devi

    38、ce class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA La

    39、nd and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M

    40、 devices covered by this drawing shall be in microcircuit group number 36 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97615

    41、 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Positive-going input threshold voltage

    42、 VT+2.7 V 1, 2, 3 0.8 2.0 V 3.0 V 0.9 2.0 3.6 V 1.1 2.0 Negative-going input threshold voltage VT-2.7 V 1, 2, 3 0.4 1.4 V 3.0 V 0.6 1.5 3.6 V 0.8 1.7 Hysteresis (VT+- VT-) VT2.7 V 1, 2, 3 0.3 1.1 V 3.0 V 0.3 1.2 3.6 V 0.3 1.2 High level output voltage 3006 VOHFor all inputs affecting output under te

    43、st, VIH= 2.0 V or VIL= 0.4 V For all other inputs, VIN= VCCor GND IOH= -100 A 2.7 V and 3.6 V 1, 2, 3 VCC-0.2 V IOH= -12 mA 2.7 V 1, 2, 3 2.2 3.0 V 2.4 IOH= -24 mA 3.0 V 1, 2, 3 2.2 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIH= 2.0 V or VIL= 0.4 V For All other in

    44、puts, VIN= VCCor GND IOL= 100 A 2.7 V and 3.6 V 1, 2, 3 0.2 V IOL= 12 mA 2.7 V 1, 2, 3 0.4 IOL= 24 mA 3.0 V 1, 2, 3 0.55 Input current high 3010 IIHFor input under test, VIN= 5.5 V For all other inputs, VIN= VCCor GND 3.6 V 1, 2, 3 +5.0 A Input current low 3009 IILFor input under test, VIN= 0.0 V Fo

    45、r all other inputs, VIN= VCCor GND 3.6 V 1, 2, 3 -5.0 A Quiescent supply current 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0.0 A 3.6 V 1, 2, 3 10.0 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

    46、UIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-97615 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise spe

    47、cified VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current delta, TTL input levels 3005 ICC4/ For input under test, VIN= VCC- 0.6 V Other inputs at VCCor GND 2.7 V and 3.6 V 1, 2, 3 500.0 A Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 3.3 V 4 8.0 pF Power dissipation

    48、 capacitance per inverter CPDf = 10 MHz See 4.4.1c 3.3 V 4 9.0 pF Low level ground bounce noise VOLP5/ VIH= 2.7 V, VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 3.0 V 4 1400 mV VOLV5/ 3.0 V 4 - 1100 mV High level VCCbounce noise VOHP5/ 3.0 V 4 1400 mV VOHV5/ 3.0 V 4 - 1100 mV Functional test 3014 6/ VIN= 2.0 V or 0.4 V Verify output VOUTSee 4.4.1b 1.5 V 7, 8 L H 2.0 V 2.7 V 3.6 V Propagation delay time, A to Y 3003 tPLH, tPHL7/ CL= 50 pF minimum See figure 5 3.0 V and 3.6 V 9, 10, 11 1.0 6.4 ns


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