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    DLA SMD-5962-96821 REV D-2010 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE 2-INPUT POSITIVE AND GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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    DLA SMD-5962-96821 REV D-2010 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE 2-INPUT POSITIVE AND GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R357-97. JAK 97-06-27 Monica L. Poelking B Changes in accordance with NOR 5962-R455-97. CFS 97-09-12 Monica L. Poelking C Correct DC output voltage range (VOUT) in section 1.3. Add footnote 5/ and correct input

    2、 voltage range (VIN) in section 1.4. Correct note 1 in figure 5. Add table III, delta limits. Update boilerplate to the requirements of MIL-PRF-38535. Editorial changes throughout. TVN 03-19-17 Thomas M. Hess D Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 10-05-14 T

    3、homas M. Hess REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR

    4、 USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 96-04-22 REVISION

    5、 LEVEL D SIZE A CAGE CODE 67268 5962-96821 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E305-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96821 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVIS

    6、ION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the P

    7、art or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96821 01 Q C A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class d

    8、esignatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-3

    9、8535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AHCT08 Quadruple 2-input positive AND g

    10、ate, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B

    11、 microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 D

    12、ual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking per

    13、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96821 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range

    14、(VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ DC input clamp current (IIK) (VIN 0.0 V) . -20 mA DC output clamp current (IOK) (VOUT 0.0 V or VOUT VCC) . 20 mA Continuous output current (IOUT) (VOUT= 0.0 to VCC) 25 mA Continuous current through VCCor G

    15、ND . 50 mA Maximum power dissipation at TA= +55C (in still air) . 500 mW Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions.

    16、2/ 3/ 5/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) 0.0 V to +5.5 V dc Output voltage range (VOUT) . 0.0 V to VCCMinimum high level input voltage (VIH) . +2.0 V dc Maximum low level input voltage (VIL) +0.8 V dc Maximum high level output current (IOH) -8 mA Maximum l

    17、ow level output current (IOL) +8 mA Maximum input transition rise or fall rate (t/v) 20 ns/V Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this

    18、 drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-S

    19、TD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at

    20、https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade perform

    21、ance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratings may be exceeded provided tha

    22、t the input and output current ratings are observed. 5/ Unused inputs must be held high or low to ensure proper device operation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96821 DEFENSE SUPPLY CENTER CO

    23、LUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable la

    24、ws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) pl

    25、an. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and phys

    26、ical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal

    27、connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and

    28、waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical perf

    29、ormance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subg

    30、roup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not markin

    31、g the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mar

    32、k. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be r

    33、equired from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The

    34、certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appen

    35、dix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device

    36、class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activit

    37、y retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in micr

    38、ocircuit group number 36 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96821 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234

    39、 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOHFor all inputs affecting output under test V

    40、IN= VIH= 2.0 V or VIL= 0.8 VFor all other inputs, VIN= VCCor GND IOH= -50 A 4.5 V 1, 2, 3 4.4 V IOH= -8 mA 1 3.94 2, 3 3.8 Low level output voltage 3007 VOLFor all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 VFor all other inputs, VIN= VCCor GND IOL= 50 A 4.5 V 1, 2, 3 0.1 V IOL=

    41、8 mA 1 0.36 2, 3 0.44 Input current high 3010 IIHFor input under test VIN= VCCFor all other inputs VIN= VCCor GND 5.5 V 1 +0.1 A 2, 3 +1.0 Input current low 3009 IILFor input under test VIN= GND For all other inputs VIN= VCCor GND 5.5 V 1 -0.1 A 2, 3 -1.0 Quiescent supply current 3005 ICCFor all inp

    42、uts VIN= VCCor GND IOUT= 0.0 A 5.5 V 1 2.0 A 2, 3 20.0 Quiescent supply current delta, TTL input levels 3005 ICC4/ For input under test, VIN= VCC- 2.1 V Other inputs at VCCor GND 5.5 V 1 1.35 mA 2, 3 1.5 Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 5.0 V 4 8.0 pF Power dissipation ca

    43、pacitance CPD5/ CL= 50 pF minimum f = 1 MHz See 4.4.1c 5.0 V 4 20.0 pF Low level ground bounce noise VOLP6/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 5.0 V 4 1500 mV VOLV6/ 5.0 V 4 -1250 mV High level VCCbounce noise VOHP6/ 5.0 V 4 750 mV VOHV6/ 5.0 V 4 -750 mV Functional test 3014 7/

    44、VIH= 2.0 V, VIL= 0.8 V Verify output VOUTSee 4.4.1b 4.5 V 7, 8 L H 5.5 VPropagation delay time, mA or mB to mY 3003 tPLH, tPHL8/ CL= 15 pF minimum 9/ See figure 5 4.5 V and 5.5 V9 6.9 ns 10, 11 1.0 8.0 CL= 50 pF minimum See figure 5 4.5 V and 5.5 V9 7.9 10, 11 1.0 9.0 See footnotes at end of table.

    45、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96821 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics -

    46、Continued. 1/ For tests not listed in the referenced MIL-STD-883 (e.g. ICC), utilize the general test procedure of 883 under the conditions listed herein. 2/ Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I herein. Outp

    47、ut terminals not designated shall be high level logic, low level logic, or open, except for all ICCand ICCtests, where the output terminals shall be open. When performing these tests, the current meter shall be placed in the circuit such that all current flows through the meter. 3/ For negative and

    48、positive voltage and current values, the sign designates the potential difference in reference to GND and the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. 4/ This is the in

    49、crease in supply current for each input that is at the specified TTL voltage level rather than VCCor GND. This test may be performed either one input at a time (preferred method) or with all input pins simultaneously at VIN= VCC- 2.1 V (alternate method). Classes Q and V shall use the preferred method. When


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