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    DLA SMD-5962-94671 REV B-2013 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 18-BIT UNIVERSAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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    DLA SMD-5962-94671 REV B-2013 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 18-BIT UNIVERSAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

    1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. jak 07-07-03 Thomas M. Hess B Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 13-07-25 Thomas M. Hess REV SHEET REV B B B B SHEET 15 16 1

    2、7 18 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh V. Nguyen DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS A

    3、ND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 18-BIT UNIVERSAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-08-18 REVISION LEVEL

    4、 B SIZE A CAGE CODE 67268 5962-94671 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E498-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94671 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHE

    5、ET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Numb

    6、er (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94671 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline

    7、 (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device

    8、type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT16601 18-bit universal bus transceiver with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance

    9、 level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F56 56 Dual fla

    10、t pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94671 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REV

    11、ISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (I/O ports) (VIN) . -0.5 V dc to +5.5 V dc 4/ DC input voltage range (except I/O ports) (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage rang

    12、e (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output) . +96 mA DC input clamp current (IIK) (VIN 0.0 V) . -18 mA DC output clamp current (IOK) (VOUT 0.0 V) . -50 mA VCCcurrent (IVCC) . 579 mA Ground current (IGND) 1188 mA Storage temperature range (TSTG) . -65C to +150C Lead temp

    13、erature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD) 673 mW 5/ 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . +0.0

    14、 V dc to VCC Output voltage range (VOUT) +0.0 V dc to VCCMaximum low level input voltage (VIL). 0.8 V Minimum high level input voltage (VIH) 2.0 V Maximum high level output current (IOH) . -24 mA Maximum low level output current (IOL) . +48 mA Maximum input rise or fall rate (t/V) 10 ns/V Case opera

    15、ting temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for

    16、the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input clamp current rating is observed. 5/ Power dissipation values are derived using the formu

    17、la PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total number of outputs. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59

    18、62-94671 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Un

    19、less otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits

    20、. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Stand

    21、ardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersede

    22、s applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Manage

    23、ment (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Ca

    24、se outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figur

    25、e 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and

    26、postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requi

    27、rements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94671 DLA LAND AND MARITIME COLUMBUS, OHIO

    28、43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

    29、 has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V

    30、shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance

    31、 submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as requir

    32、ed for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94671 DLA LAND AND MARITIME COLUMBUS,

    33、 OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output volt

    34、age 3006 VOHFor all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA 4.5 V 1, 2, 3 2.5 V 5.0 V 1, 2, 3 3.0 V IOH= -24 mA 4.5 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= VIH= 2.0 V or VIL= 0.8 V IOL= +48 mA 4.5 V 1, 2, 3

    35、 0.55 V Negative input clamp voltage 3022 VIC-For input under test IIN= -18 mA 4.5 V 1, 2, 3 -1.2 V Input current high 3010 IIH4/ For input under test, VIN= VCCControl inputs 5.5 V 1, 2, 3 1.0 A A or B ports 100.0 Input current low 3009 IIL4/ For input under test, VIN= GND Control inputs 5.5 V 1, 2,

    36、 3 -1.0 A A or B ports -100.0 Three-state output leakage current high 3021 IOZH5/ For control inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V VOUT= 2.7 V 5.5 V 1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL5/ For control inputs affecting output under test, VIN= VIH=

    37、 2.0 V or VIL= 0.8 V VOUT= 0.5 V 5.5 V 1, 2, 3 -10.0 A Off-state leakage current IOFFFor input or output under test, VINor VOUT= 4.5 V All other pins at 0.0 V 0.0 V 1 100 A High-state leakage current ICEXFor output under test VOUT= 5.5 V Outputs at high logic state 5.5 V 1, 2, 3 50 A Output current

    38、3011 IO6/ VOUT= 2.5 V 5.5 V 1, 2, 3 -50 -180 mA Quiescent supply current delta, TTL input level 3005 ICC7/ For input under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND 5.5 V 1, 2, 3 1.5 mA Quiescent supply current, output high 3005 ICCHFor all inputs, VIN= VCCor GND IOUT= 0 A A or B ports 5

    39、.5 V 1, 2, 3 3.0 mA Quiescent supply current, output low 3005 ICCL5.5 V 1, 2, 3 36 mA Quiescent supply current, output disabled 3005 ICCZ5.5 V 1, 2, 3 3.0 mA Input capacitance 3012 CINTC= +25C Control inputs See 4.4.1c 5.0 V 4 10.5 pF I/O capacitance 3012 CI/OTC= +25C A or B ports See 4.4.1c 5.0 V 4

    40、 15.0 pF See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94671 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical

    41、 performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Low level ground bounce noise VOLP8/ VIH= 3.0 V, VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d 5.

    42、0 V 4 880 mV VOLV8/ 5.0 V 4 -1250 mV High level VCCbounce noise VOHP8/ 5.0 V 4 1375 mV VOHV8/ 5.0 V 4 -550 mV Functional tests 3014 9/ VIL= 0.8 V, VIH= 2.0 V Verify output VOSee 4.4.1c 4.5 V 7, 8 L H 5.5 V 7, 8 L H Propagation delay time, An to Bn or Bn to An 3003 tPLH110/ CL= 50 pF minimum RL= 500

    43、See figure 5 5.0 V 9 1.5 4.1 ns 4.5 V and 5.5 V 10, 11 1.0 4.6 tPHL110/ 5.0 V 9 1.5 4.7 ns 4.5 V and 5.5 V 10, 11 1.0 5.1 Propagation delay time, CLKAB to Bn or CLKBA to An 3003 tPLH210/ 5.0 V 9 1.5 4.5 ns 4.5 V and 5.5 V 10, 11 1.0 5.2 tPHL210/ 5.0 V 9 1.5 4.4 ns 4.5 V and 5.5 V 10, 11 1.0 5.0 Prop

    44、agation delay time, LEAB to Bn or LEBA to An 3003 tPLH310/ 5.0 V 9 2.0 4.7 ns 4.5 V and 5.5 V 10, 11 1.0 5.6 tPHL310/ 5.0 V 9 2.0 5.0 ns 4.5 V and 5.5 V 10, 11 1.0 5.5 Propagation delay time, output enable, OEBA to An or OEAB to Bn 3003 tPZH10/ 5.0 V 9 2.0 5.0 ns 4.5 V and 5.5 V 10, 11 1.0 5.7 tPZL1

    45、0/ 5.0 V 9 2.0 5.6 ns 4.5 V and 5.5 V 10, 11 1.0 6.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94671 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET

    46、 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Propagation delay time, output disable, OEAB to Bn

    47、or OEBA to An 3003 tPHZ10/ CL= 50 pF minimum RL= 500 See figure 5 5.0 V 9 2.0 5.8 ns 4.5 V and 5.5 V 10, 11 1.0 6.8 tPLZ10/ 5.0 V 9 1.5 5.3 ns 4.5 V and 5.5 V 10, 11 1.0 6.3 Maximum CLKAB or CLKBA frequency fMAX5.0 V 9 150 MHz 4.5 V and 5.5 V 10, 11 150 Setup time, An before CLKAB or Bn before CLKBA

    48、 ts111/ 5.0 V 9 ns 4.5 V and 5.5 V 10, 11 4.6 Setup time, An before LEAB or Bn before LEBA, CLKAB or CLKBA high ts211/ 5.0 V 9 ns 4.5 V and 5.5 V 10, 11 2.5 Setup time, An before LEAB or Bn before LEBA, CLKAB or CLKBA low ts311/ 5.0 V 9 ns 4.5 V and 5.5 V 10, 11 1.3 Setup time, CLKENAB before CLKAB or CLKENBA before CLKBA ts411/ 5.0 V 9 ns 4.5 V and 5.5 V 10, 11 2.9 Hold time, An after CLKAB or Bn after CLKBA th111/ 5.0 V 9 ns 4.5 V and 5.5 V 10, 11 0.4 Hold time, An after LEAB or Bn after LEBA th211/ 5.0 V 9 ns 4.5


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