1、SMD-5962-92242 REV A 9999996 0089YOO 78T DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 43216-5000 IN REPLY REFER TO DSCC-VAC (Mr. Miesse/(614) 692-0543 (DSN 850) SUBJECT: Notice of Revision (NOR) 5962-R202-96 for Standard Microcircuit Drawing (SMD) 5962
2、-92242 Military/Industry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minium, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to
3、the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current certificate of com
4、pliance on file at DSCC with a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-0543 (DSN 850). 1 En
5、cl MONICA L. POELKING Chief, Custom Microelectronics Team Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICE OF REVISION (NOR) THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. 1. DATE (WMMDD) 96-09-06 Form Approved OM6 N
6、o. 0704-0188 2. PROCURING ACTIVITY NO. I. ORIGINATOR I. TYPED NAME (First, Middle Initial, 1 Last) 3. DODAAC b. ADDRESS (Sfreef, Cify, State, Zip Code) 5. CAGE CODE Defense Supply Center, Columbus 67268 3990 East Broad Street Columbus, OH 43216-5000 7. CAGE CODE 67268 6. NOR NO. 5962mR202-96 8. DOCU
7、MENT NO. 5962-92242 I I 3. TITLE OF DOCUMENT MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL BUS TRANSCEIVER WITH NONINVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON INITIAL A 10. REVISION LETTER a. CURRENT b. NEW 11. ECP NO. NIA Sheet 1: Revisions lt
8、r colum; add lgAil. Revisions description colum; add IlChanges in accordance with NOR 5962-R202-9611. Revisions date colum; add 1i96-09-06ti. Revision level block; add I1A1I. Rev status of sheets; for sheets 1 and 8, add IlAli. Table 1, low level ground bounce noise, VOL, change maximun Limit from 1
9、1140011 to i116001i. Table 1, low level ground bounce noise, VOL“, change maximun limit from 11-130011 to 11-160011. Table I, high level Vcc bounce noise, VoHp, change maximun limit from ii6001t to 1170011. Revision level block; add ilA1l. Sheet 8: X (1) Existing document supplemented by the NOR may
10、 be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of master document shall make above revision and furnish revised document b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DSCC-VAC ID Form 1695, APR 92 Previous editi
11、ons are obsolefe. c. TYPED NAME (First, Middle Initial, Last) Monica L. Poelking d. TITLE Chief, Custom Microelectronics 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAG e. SIGNATURE f. DATE SIGNED (YYMMDD) Monica L. Poelking 96-09-06 b. REVISION COMPLETED (Signature) c. DATE SIGNED (YYMMDD) Bernard J.
12、 Miesce 96-09-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-REV I I I SHEET ,+tt SHEET REV STATUS OF SHEETS PMIC NIA STANDARD MICROCIRCUIT DRAWING THIS DRAUING IS AVAILABLE FOR USE BY ALL DEPARIWENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMS
13、C N/A IESC FORM 193 JUL 94 DISTRIBUTION STATEMENT A. PREPARED BY Thanh V. Nguyen CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking DRAUING APPROVAL DATE 94-10-14 REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL BUS TRANSCEIVER WITH T
14、TL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON NONINVERTING THREE-STATE OUTPUTS, SIZE I CAGE CODE I A 67268 5962-92242 SHEET 1 OF 18 5962-EO1 0-95 Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted w
15、ithout license from IHS-,-,-1.1 Scopc. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two prcduct assurance classes consisting of military high reliabi lity (device classes Q and PO and space application (device class VI, and a choice of case outline
16、s and lead finishes are available and are reflected in the Part or identifying Number (PIN). 1.2.1 of HIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with coripliant non-JAN devices“. available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. Device
17、 class M microcircuits represent non-JAN class B aicrocircuits in accordance with When I 1.2 W. The PIN shail be as shown in the following example: 5r i 92242 T Ji, I 1 Federal RHA Devi ce Devi ce Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designato
18、r (see 1.2.4) (see 1.2.5) / (see 1.2.3) I Drawing number 12.1 RHA designator. Device class H RHA marked devices shall meet the MIL-1-38535 appendix A specified RHA levels and shall be marked with the appropriate RUA designator. HIL-1-38535 specified RHA levels and shall be mrked with the appropriate
19、 RHA designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash (-) indicates a I 1.2.2 Device type(s). The device type(s.1 shall identify the circuit function as follows: Device type Generic number Circuit function 1.2.5 Lead finish. The lead finish shall be as spec
20、ified in MIL-STD-883 (see 3.1 herein) for class M or MIL-1-38535 for classes P and V. designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable ui thout preference. Finish letter “X“ shall not be marked on the microcircuit or its packaging.
21、 The “X“ SIZE 5962-92242 STANDARD A MICROCIRCUIT DRAWING I DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET I DAYTON, OHIO 45444 2 o1 54FCT623T )ESC FORM 193A JUL 94 a? 54FCT623AT 03 54FCT623CT Octal bus transceiver with noninverting three-state outputs, TTL compatible inputs and limited outpu
22、t voltage swing Octal bus transceiver with noninverting three-state outputs, TTL compatible inputs and limited output voltage swing Octal bus transceiver with noninverting three-state outputs, TTL compatible inputs and limited output voltage swing 1.2.3 Device class designator. The device class desi
23、gnator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation M I Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL
24、-1-38535 1.2.4 Case outline(s). The case outline(s) shall be as designated in HLL-STD-1835, and as follows: Package style Outline letter Descriptive desiqnator Termi na 1s R S 2 GDIPI-TE0 or CDIP2-T20 20 Dual-in-line GDFP2-F20 or CDFP3-F20 CQCCI-NZO 20 Square chip carrier 20 Flat pack Provided by IH
25、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-72242 9999996 0064377 TO2 1.3 Absolute maxiniun ratinas. II 21 31 SIZE STANDARD A MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL Supply voltage range (V c - - - - -
26、- - - - - - - - - - - - - DC input voltage range iv ) - - - - - - - - - - - - - - - - - DC output voltage range tdN - - - - - - - - - - - - - - - - DC input clay, current (I y(V , = -0.5 V ) - - - - - - - - - DC output clamp current (4,) (dmT -0.5 V and +7.0 V) - - - - DC output source current (I 1
27、(per output) - - - - - - - - - DC output sink current (IoLy(per output) - - - - - - - - - - Storage temperature range (T ) - - - - - - - - - - - - - - - Case temperature under bias ?TiIAs) - - - - - - - - - - - - - Lead temperature (soldering, 1 seconds) - - - - - - - - - - - Thermal resistance, jun
28、ction-to-case (eJc) - - - - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - - - - - Maximum power dissipation (PD) - - - - - - - - - - - - - - - - DC Vc Current (Icc) Grwn$ current (IGND) - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 5962-92242 SHEET 3 1.4
29、 Recommended operating conditions. 21 21 Supply voltage range (Vc 1 - - - - - - - - - - - - - - - - - - input voltage range 3007 Negative input clamp voltage 3022 Three-state output leakage current high 3021 Three-state output leakage current low 3020 Input current high 301 O Dynamic power supply cu
30、rrent I ;YB/ VoL1 4/ v0L2 OL4 vIc- ;?g/ IIH TABLE I. Electrical performance characteristics. For input under test, VIN = Vcc For all other Control inputs IOL = 300 pA STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 IoL = 48 mA For input under test, JIN = -18 mA SIZ
31、E A 5962-92242 REVISION LEVEL SHEET 6 OEAB or = 2.0 V or 0.8 V inputs VIN = Vcc or GND For all other vIN = vCC or GND inputs For input under Control test, VIN = GND For all other i nput s I vIN = vcc or GND inputs For all inputs, VIN = Vcc or GND VOUT = GND Outputs open See footnotes at end of table
32、. DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92242 9999996 OOb44OL 263 )evite type All AL1 All ALL ALL AL1 All ALL ALL Vcc 0.0 V 5.5 v 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND GND Test and MIL-STD-883 test mthod I/ Quiesc
33、ent supply current, outputs di sabled 3005 - nax 1.0 5.0 2.0 - 1.5 1.5 1.5 4.0 5 .o 6.5 14.5 10.0 12.0 VA mA mA mA mA mA pF pF TABLE I. Electrical Dcrforinance characteristics - Continued. Test conditions z/ -55C I TC 5 +12SC +4.5 v 5 vc.c 5 +5.5 v unless otheruise specified Croup A Limits 3/ tx- su
34、bgroups For input or output under test VIN or VWT = 4.5 V All other pins at 0.0 V Off-state leakage currnt Quiescent supply current delta, TTL input Level MO5 For input under test For all other inputs VIN = Vcc or GND OEAB = Vcc, OEBA = GND For all other inputs VIN = Vcc or GND VIN = 3.4 v - Quiesce
35、nt supply current, outputs high 3005 Icen Quiescent supply current, outputs low Mo5 ICCL Iccz z/ OEAB = GNO, = Vcc For all other inputs vIN = vCc or GND Total supply current For switching inputs Out put ssn OEAB = OEBA = GND One bit toggling f. = IO MHZ 56% duty cycle For nonswitching vIN = vCc or G
36、N D For switching inputs VIN = 3.4 v or GND input, VIN = vcc or GND Outputsopen OEAB = OEBA = GND Eight bits toggling f- = 2.5 MHr For nonswitching sbx duty cycle For sui tching inwts v = vcc INor GND _ For switching inputs VIN = 3.4 v or GND input, VIN = VcC or GND Input capacitance 301 2 Tc = +2SD
37、C see 4.4.lb I/O capacitance 301 2 C - 1 i:* See footnotes at end of table. I 5962-92242 STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I REVISION LEVEL SHEET 17 I I m DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted witho
38、ut license from IHS-,-,-SUD-5962-92242 9b 0064402 LTT M Test and test method I/ MIL-STD-883 Lou level ground bounce noise High level Vcc bounce noise Functional test 301 4 Propagation delay time, An to En 3003 Propagation delay time, Bn to An 3003 Propagation delay time, output enable, OEBA to An 30
39、03 Propagation delay time, output disable, OEBA to An Mo3 Propagation delay time, output enable, OEAB to Bn 3003 Propagation delay time, output disable, OEAB to En 3003 See footnotes on next sheet. SIZE STANDARD A 5962-92242 MICROCIRCUIT DRAWING DAYTON, OHIO 45444 DEFENSE ELECTRONICS SUPPLY CENTER R
40、EVISION LEVEL SHEET 8 _i DESC FORM 193A TABLE I. Electrical performance characteristics - Continued. Symbol Test conditions 21 Devi ce -5SC 5 TC 5 t12S0C +4.5 v d vcc i +5.5 v unless otherwise specified V TfH= +2SoC = 3.0 V, VIL = 0.0 V se figure 4 All AL1 WIH-= 2.0 V, V = 0.8 W Al 1 Verify output b
41、k See 4.4.1 CL = 50 pF minimum RL = 5Wn See figure 5 I 0 E- o1 I O2 I 03 I o3 03 . JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92242 9 9939996 b4403 036 TABLE I. Electrical performance characteristics - Continued. I/ For tests not
42、 listed in the referenced MIL-STD-883 (e.g. AI,), utilize the general test procedure of 883 under the conditions listed herein. Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I herein. except for all I When performing t
43、hese tests, the current meter shall be pfaced in the circuit such that all current flows through the meter. For negative and positive voltage and current vatues, the sign designates the potential difference in reference to GND and the direction of current flow, respectively; and the absolute value o
44、f the aagnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. limits specified in table I at 4.5 V 5 Vcc 5 5.5 V. and the preferred method and limits are guaranteed. = Vcc - 2.1 V (alternate method). Classes GI and V shall use the preferred method. When
45、the test is performed - Il/ ICCT is calculated as follows: JCCT = Icc + DHNTAIcc + IccD(fCp/2 + fiNi) where I Di= Duty cycle for TTL inputs at 3.4 V NT = Number of TTL inputs at 3.4 V AIcc = Quiescent supply current delta, TTL inputs at 3.4 V ICCD-= Dynamic power supply current caused by an input tr
46、ansition pair (HLH or LHL) fCP - Clock frequency for registered devices (fCp = O for nonregistered devices) fi = Input frequency Ni = Number of inputs at fi = Quiescent supply current (any IccL or ICCH) - 121 This test is required only for group A testing; see 4.4.1 herein. STANDARD 5962-92242 MICRO
47、CIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 13/ This test is for qualification only. output and are used to measure the magnitude of in$uced noise caused
48、by other siultaneously switching outputs. The test is performed on a low noise bench test fixture. with SoOn of load resistance and a mini- of 50 pF of lorid capacitance (see figure 4). resistors shall be used. It is suggested, that whenever possible, this distance be kept to less than 0.25 inches.
49、shall be placed in parallel from VcC to ground. the device manufacturer. a 1 GHz minimum bandwidth oscilloscope with a 5GQ input iiipedance. Ground and V bounce tests are performed cm a non-switching (quiescent) For the device under test, all outputs shall be loaded Only chip capacitors and The output load components shall be located as close as possible to the dev
